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Imaging Methods in Atomic Force Microscopy

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Part of the Methods in Molecular Biology™ book series (MIMB,volume 242)

Abstract

One can easily distinguish between two general modes of operation of the atomic force microscope (AFM) depending on absence or presence in the instrumentation of an additional device that forces the cantilever to oscillate in the proximity of its resonant frequency. The first case is usually called static mode, or DC mode, because it records the static deflection of the cantilever, whereas the second takes a variety of names (some patented) among which we may point out the resonant or AC mode. In this case, the feedback loop will try to keep at a set value not the deflection but the amplitude of the oscillation of the cantilever while scanning the surface. To do this, additional electronics are necessary in the detection circuit, such as a lock-in or a phase-locked loop amplifier, and also in the cantilever holder to induce the oscillatory excitation.

Keywords

  • Atomic Force Microscope
  • Contact Mode
  • Force Curve
  • Static Deflection
  • Intermittent Contact

These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. Israelachvili, J. N. (1992) Intermolecular and Surface Forces, 2nd ed. Academic Press, London.

    Google Scholar 

  2. Weisenhorn A. L., Maivald, P., Butt, H. J., and Hansma, P. K. (1992) Measuring adhesion, attraction, and repulsion between surfaces in liquids with an atomicforce microscope. Phys. Rev. B. 45, 11,226–11,232.

    CrossRef  Google Scholar 

  3. Weisenhorn A.L., Hansma, P. K., Albrecht T. R., and Quate, C. F. (1989) Forces in atomic force microscopy in air and water. Appl. Phys. Lett. 54, 2651–2653.

    CrossRef  Google Scholar 

  4. Butt, H.-J., Siedle, P., Seifert, K., et al. (1993) Scan speed limit in atomic force microscopy. J. Microsc. 169, 75–84.

    Google Scholar 

  5. Putman, C. A., van der Werf, K. O., de Grooth, B. G., van Hulst, N. F., and Greve, J. (1992) New imaging mode in atomic-force microscopy based on the error signal. SPIE Proceedings 1639, 198–204.

    CrossRef  Google Scholar 

  6. Gibson, C. T., Watson, G. S., and Myhra, S. (1997) Lateral force microscopy—a quantitative approach. Wear 213, 72–79.

    CrossRef  CAS  Google Scholar 

  7. Han, W. and Lindsay, S. M. (1998) Precision interfacial molecular force measurements with a MAC mode atomic force microscope. Appl. Phys. Lett. 72, 1656–1658.

    CrossRef  CAS  Google Scholar 

  8. Han, W., Lindsay, S. M., and Jing, T. (1996) A magnetically-driven oscillating probe microscope for operation in liquids. Appl. Phys. Lett. 69, 4111–4113.

    CrossRef  CAS  Google Scholar 

  9. Garcia, R. and San Paulo, A. (2000) Amplitude curves and operating regimes in dynamic atomic force microscopy. Ultramicroscopy 82, 79–83.

    Google Scholar 

  10. Hansma, P. K., Cleveland, J. P., Radmacher, M., et al. (1994) Tapping mode atomic force microscopy in liquids. Appl. Phys. Lett. 64, 1738–1740.

    CrossRef  CAS  Google Scholar 

  11. Lantz, M., Liu, Y. Z., Cui, X. D., Tokumoto, H., and Lindsay, S. M. (1999) Dynamic force microscopy in fluid. Surface Interface Anal. 27, 354–360.

    CrossRef  CAS  Google Scholar 

  12. Tamayo, J., Humphris, A. D., Owen, R. J., and Miles, M. J. (2001) High-Q dynamic force microscopy in liquid and its application to living cells. Biophys. J. 81, 526–537.

    PubMed  CrossRef  CAS  Google Scholar 

  13. Burnham, N. A., Behrend, O. P., Oulevey, F., et al. (1997) How does a tip tap? Nanotechnology 8, 67–75.

    CrossRef  Google Scholar 

  14. Behrend, O. P., Oulevey, F., Gourdon, D., et al. (1998) Intermittent contact: Tapping or hammering? Appl. Phys. A66, S219–S221.

    Google Scholar 

  15. Tamayo, J., Humphris, A. D., Owen, R. J., and Miles, M. J. (2001) High-Q dynamic force microscopy in liquid and its application to living cells. Biophys. J. 81, 526–537.

    PubMed  CrossRef  CAS  Google Scholar 

  16. Magonov, S. N., Elings, V., and Whangbo, M.-H. (1997) Phase imaging and stiffness in tapping mode AFM. Surface Sci. 375, L385–L391.

    CrossRef  CAS  Google Scholar 

  17. Bar, G., Delineau, L., Brandsch, R., Bruch, M., and Whangbo, M.-H. (1999) Importance of the indentation depth in tapping-mode atomic force microscopy study of compliant materials. Appl. Phys. Lett. 75, 4198–4200.

    CrossRef  CAS  Google Scholar 

  18. Bar, G. and Brandsch, R. (1998) Effect of viscoelastic properties of polymers on the phase shift in tapping mode atomic force microscopy. Langmuir. 14, 7343–7347.

    CrossRef  CAS  Google Scholar 

  19. Cleveland, J. P., Anczykowski, B., Schmid, A. E., and Elings, V. B. (1998) nergy dissipation in tappingmode atomic force microscopy. Appl. Phys. Lett. 72, 2613–2615.

    CrossRef  CAS  Google Scholar 

  20. Chen, X., Davies, M. C., Roberts, C. J., Tendler, S. J. B., and Williams, P. M. (2000) Optimizing phase imaging via dynamic force curves. Surface Sci 460, 292–300.

    CrossRef  CAS  Google Scholar 

  21. Pang, G. K., Baba-Kishi, K. Z., and Patel, A. (2000) Topographic and phase-contrast imaging in atomic force microscopy. Ultramicroscopy 81(2), 35–40.

    PubMed  CrossRef  CAS  Google Scholar 

  22. Butt, H-J. (1991) Measuring electrostatic, van der Waals, and hydration forces in electrolyte solutions with an atomic force microscope. Biophys. J. 60, 1438–1444.

    PubMed  CrossRef  CAS  Google Scholar 

  23. Vinckier, A. and Semenza, G. (1998) Measuring elasticity of biological materials by atomic force microscopy. FEBS Lett. 430, 12–16.

    PubMed  CrossRef  CAS  Google Scholar 

  24. Hutter Jeffrey L. and John Bechhoefer (1994) Measurement and manipulation of Van der Waals forces in atomic force microscopy. J. Vacuum Sci. Technol. B, 12, 2251–2253.

    CrossRef  Google Scholar 

  25. Cleveland, J. P., Manne, S., Bocek, D., and Hansma, P. K. (1993) A non-destructive method for determining the spring constant of cantilevers for scanning force microscopy. Rev. Sci. Instrum. 64, 403–405.

    CrossRef  CAS  Google Scholar 

  26. D’Costa, N. P. and Hoh, J. H. (1995) Calibration of optical lever sensitivity for atomic force microscopy. Rev. Sci. Instrum. 66, 5096–5097.

    CrossRef  Google Scholar 

  27. Hoh, I., Cleveland, J. P., Prater, C. B., Revel, J.-P., and Hansma, P. K. (1992) Quantized adhesion detected with the atomic force microscope. J. Am. Chem. Soc. 4917–4918.

    Google Scholar 

  28. Mckendry, R. A., Theoclitou, M., Rayment, T., and Abell, C. (1998) Chiral discrimination by chemical force microscopy. Nature 14, 2846–2849.

    CAS  Google Scholar 

  29. Okabe, Y., Furugori, M., Tani, Y., Akiba, U., and Fujihira, M. (2000) Chemical force microscopy of microcontact-printed self-assembled monolayers by pulsed-force-mode atomic force microscopy. Ultramicroscopy 82, 203–212.

    PubMed  CrossRef  CAS  Google Scholar 

  30. Willemsen, O. H., Snel, M. M., van Noort, S. J., et al. (1999) Optimization of adhesion mode atomic force microscopy resolves individual molecules in topography and adhesion. Ultramicroscopy 80, 133–144.

    PubMed  CrossRef  CAS  Google Scholar 

  31. Thundat, T., Oden, P. I., and Warmack, R. J. (1997) Chemical, physical, and biological detection using microcantilevers. Electrochem. Society Proc. 97, 179–187.

    Google Scholar 

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© 2004 Humana Press Inc., Totowa, NJ

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Ricci, D., Braga, P.C. (2004). Imaging Methods in Atomic Force Microscopy. In: Braga, P.C., Ricci, D. (eds) Atomic Force Microscopy. Methods in Molecular Biology™, vol 242. Humana Press. https://doi.org/10.1385/1-59259-647-9:13

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  • DOI: https://doi.org/10.1385/1-59259-647-9:13

  • Publisher Name: Humana Press

  • Print ISBN: 978-1-58829-094-6

  • Online ISBN: 978-1-59259-647-8

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