Recognizing and Avoiding Artifacts in AFM Imaging

  • Davide Ricci
  • Pier Carlo Braga
Part of the Methods in Molecular Biology™ book series (MIMB, volume 242)


Images taken with the atomic force microscope (AFM) originate in physical interactions that are totally different from those used for image formation in conventional light and electron microscopy. One of the effects is that a new series of artifacts can appear in images that may not be readily recognized by users accustomed to conventional microscopy. Because we are addressing our-selves to novices in this field, we would like to give an idea of what can happen while taking images with the AFM, how one can recognize the source of the artifact, and then try to avoid it or minimize it. Essentially, one can identify the following sources of artifacts in AFM images: the tip, the scanner, vibrations, the feedback circuit, and image-processing software.


  1. 1.
    Keller, D., and Chih-Chung, C. (1991) Reconstruction of STM and AFM images distorted by finite-size tips. Surface Sci. 253, 353–364.CrossRefGoogle Scholar
  2. 2.
    Hellemans, L., Waeyaert, K., Hennau, F., Stockman, L., Heyvaert, I., and Van Haesendonck, C. (1991) Can atomic force microscopy tips be inspected by atomic force microscopy? J. Vac. Sci. Technol. B. 9, 1309–1312.CrossRefGoogle Scholar
  3. 3.
    Keller, D. and Chou, C. C. (1992) Imaging steep, high structures by scanning force microscopy with electron beam deposited tips. Surface Sci. 268, 333–339.CrossRefGoogle Scholar
  4. 4.
    Keller, D., Deputy, D., Alduino, A., and Luo, K. (1992) Sharp, vertical-walled tips for SFM imaging of steep or soft samples. Ultramicroscopy 42–44, 1481–1489.CrossRefGoogle Scholar
  5. 5.
    Wang, W. L. and Whitehouse, D. J. (1995) Application of neural networks to the reconstitution of scanning probe microscope images distorted by finite-size tips. Nanotechnology 6, 45–51.CrossRefGoogle Scholar
  6. 6.
    Markiewicz, P. and Goh, M. C. (1995). Atomic force microscope tip deconvolution using calibration arrays. Rev. Sci. Instrum. 66, 1–4.CrossRefGoogle Scholar
  7. 7.
    Villarrubia, J. S. (1996) Scanned probe microscope tip characterization without cantilever tip characterizers. J. Vac. Sci. Technol. B. 14, 1518–1521.CrossRefGoogle Scholar
  8. 8.
    Sheng, S., Czajkowsky, D. M., and Shao, Z. (1999) AFM tips: How sharp are they? J. Microsc. 196, 1–5.PubMedCrossRefGoogle Scholar
  9. 9.
    Taatjes, D. J., Quinn, A. S., Lewis, M. R., and Bovill, E. G. (1999) Quality assessment of atomic force microscopy probes by scanning electron microscopy: Correlation of tip structure with rendered images. Microsc. Res. Tech. 44, 312–326.PubMedCrossRefGoogle Scholar
  10. 10.
    Dinte, B. P., Watson, G. S., Dobson, J. F., and Myhra, S. (1996) Artefacts in non-contact mode force microscopy: The role of adsorbed moisture. Ultramicroscopy 63, 115–124.CrossRefGoogle Scholar
  11. 11.
    Yang, J., Mou, J., Yuan, J.-Y., and Shao, Z. (1996) The effect of deformation on the lateral resolution of the atomic force microscopy. J. Microsc. 182, 106–113.PubMedCrossRefGoogle Scholar
  12. 12.
    van Noort, S. J., van der Werf, K. O., de Grooth, B. G., van Hulst, N. F., and Greve, J. (1997) Height anomalies in tapping mode atomic force microscopy in air caused by adhesion. Ultramicroscopy 69, 117–127.CrossRefGoogle Scholar
  13. 13.
    Kühle, A., Sorenson, A. H., Zandbergen, J. B., and Bohr, J. (1998) Contrast artifacts in tapping tip atomic force microscopy. Appl. Phys. A. 66, S329–S332.CrossRefGoogle Scholar
  14. 14.
    Paredes, J. I., Martinez-Alonso, A., and Tascon, J. M. (2000) Adhesion artefacts in atomic force microscopy imaging. J. Microsc. 200, 109–113.PubMedCrossRefGoogle Scholar
  15. 15.
    Barrett, R. C. and Quate, C. F. (1991) Optical scan-correction system applied to atomic force microscopy. Rev. Sci. Instrum. 62, 1393–1399.CrossRefGoogle Scholar

Copyright information

© Humana Press Inc., Totowa, NJ 2004

Authors and Affiliations

  • Davide Ricci
    • 1
  • Pier Carlo Braga
    • 2
  1. 1.Department of Biophysical and Electronic EngineeringUniversity of GenoaGenoaItaly
  2. 2.Department of Pharmacology and Center of Respiratory Pharmacology, School of MedicineUniversity of MilanMilanItaly

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