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Artifacts and Practical Issues in Atomic Force Microscopy

  • Peter EatonEmail author
  • Krystallenia Batziou
Protocol
Part of the Methods in Molecular Biology book series (MIMB, volume 1886)

Abstract

As with any other microscopic technique, in atomic force microscopy (AFM), problems can arise. Some of these happen due to improper use of the microscope by the operator, and some are due to particular characteristics of the sample. Some occur depending on the type of instrument, or from probe damage. Some of them are artifacts inherent in the technique. Knowledge of these issues is important for correct data acquisition and interpretation, and in many cases, training in AFM is inadequate. In this chapter we show examples of common artifacts in AFM and describe, where possible, how to overcome them. Other practical issues important for best practice in AFM operation, such as noise reduction and data processing, are also discussed.

Key words

Artifacts Distortions Errors Technique Imaging Force spectroscopy 

Notes

Acknowledgments

This work was financially supported by UCIBIO/REQUIMTE via grant UID/MULTI/04378/2013—POCI/01/0145/FERDER/007728 from FCT/MEC through national funds and co-financed by FEDER, under the Partnership Agreement PT2020.

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Copyright information

© Springer Science+Business Media, LLC, part of Springer Nature 2019

Authors and Affiliations

  1. 1.Instituto de Medicina Molecular, Faculdade de MedicinaUniversidade de LisboaLisbonPortugal
  2. 2.UCIBIO/REQUIMTE, Departamento de Química e BioquímicaFaculdade de Ciências da Universidade do PortoPortoPortugal

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