Size Measurement of Nanoparticles Using Atomic Force Microscopy
This chapter outlines procedures for sample preparation and the determination of nanoparticle size using atomic force microscopy (AFM). Several procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imaging and height measurement via intermittent contact mode, or tapping mode, AFM are first described. The methods for AFM calibration and operation to make such measurements are then discussed. Finally, the techniques for data analysis and reporting are provided. The nanoparticles cited are National Institute of Standards and Technology (NIST) Au nanoparticle Reference Materials RM 8011 (nominally 10 nm particles), RM 8012 (nominally 30 nm), and RM 8013 (nominally 60 nm).
Key wordsNanoparticles atomic force microscopy
The authors would like to thank Wolfgang Haller, Bin Ming, Jim Kelly, and John Dagata from the National Institute of Standards and Technology, in addition to Jiwen Zheng and Anil Patri from the Nanotechnology Characterization Laboratory, for their assistance with developing and documenting the nanoparticle deposition, measurement, and analysis techniques.
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