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Size Measurement of Nanoparticles Using Atomic Force Microscopy

  • Jaroslaw Grobelny
  • Frank W. DelRio
  • Namboodiri Pradeep
  • Doo-In Kim
  • Vincent A. Hackley
  • Robert F. Cook
Protocol
Part of the Methods in Molecular Biology book series (MIMB, volume 697)

Abstract

This chapter outlines procedures for sample preparation and the determination of nanoparticle size using atomic force microscopy (AFM). Several procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imaging and height measurement via intermittent contact mode, or tapping mode, AFM are first described. The methods for AFM calibration and operation to make such measurements are then discussed. Finally, the techniques for data analysis and reporting are provided. The nanoparticles cited are National Institute of Standards and Technology (NIST) Au nanoparticle Reference Materials RM 8011 (nominally 10 nm particles), RM 8012 (nominally 30 nm), and RM 8013 (nominally 60 nm).

Key words

Nanoparticles atomic force microscopy 

Notes

Acknowledgment

The authors would like to thank Wolfgang Haller, Bin Ming, Jim Kelly, and John Dagata from the National Institute of Standards and Technology, in addition to Jiwen Zheng and Anil Patri from the Nanotechnology Characterization Laboratory, for their assistance with developing and documenting the nanoparticle deposition, measurement, and analysis techniques.

References

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Copyright information

© Springer Science+Business Media, LLC 2011

Authors and Affiliations

  • Jaroslaw Grobelny
    • 1
  • Frank W. DelRio
    • 1
  • Namboodiri Pradeep
    • 1
  • Doo-In Kim
    • 1
  • Vincent A. Hackley
    • 1
  • Robert F. Cook
    • 1
  1. 1.Ceramics DivisionNational Institute of Standards and TechnologyGaithersburgUSA

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