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Analytical Electron Microscopy for Materials Science

  • Book
  • © 2002

Overview

Authors:
  1. Daisuke Shindo

    1. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Miyagi, Japan

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  2. Tetsuo Oikawa

    1. Application and Research Center, JEOL Ltd., Akishima, Tokyo, Japan

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  • Detailed explanation of the basic principles and the latest improvements in analytical electron microscopy

  • Generous illustrations and experimental data

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Table of contents (5 chapters)

  1. Front Matter

    Pages N1-IX
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  2. Basic Principles of Analytical Electron Microscopy

    • Daisuke Shindo, Tetsuo Oikawa
    Pages 1-11

  3. Constitution and Basic Operation of Analytical Electron Microscopes

    • Daisuke Shindo, Tetsuo Oikawa
    Pages 13-41

  4. Electron Energy-Loss Spectroscopy

    • Daisuke Shindo, Tetsuo Oikawa
    Pages 43-80

  5. Energy Dispersive X-ray Spectroscopy

    • Daisuke Shindo, Tetsuo Oikawa
    Pages 81-102

  6. Peripheral Instruments and Techniques for Analytical Electron Microscopy

    • Daisuke Shindo, Tetsuo Oikawa
    Pages 103-136

  7. Back Matter

    Pages 137-155
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Keywords

About this book

Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.

Authors and Affiliations

  • Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Miyagi, Japan

    Daisuke Shindo

  • Application and Research Center, JEOL Ltd., Akishima, Tokyo, Japan

    Tetsuo Oikawa

Bibliographic Information

  • Book Title: Analytical Electron Microscopy for Materials Science

  • Authors: Daisuke Shindo, Tetsuo Oikawa

  • DOI: https://doi.org/10.1007/978-4-431-66988-3

  • Publisher: Springer Tokyo

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer Japan 2002

  • Softcover ISBN: 978-4-431-70336-5Published: 20 September 2002

  • eBook ISBN: 978-4-431-66988-3Published: 17 April 2013

  • Edition Number: 1

  • Number of Pages: IX, 152

  • Number of Illustrations: 106 b/w illustrations

  • Topics: Condensed Matter Physics

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