Skip to main content
SpringerLink
Log in
Book cover

Transmission Electron Microscopy

Diffraction, Imaging, and Spectrometry

  • Textbook
  • © 2016

Overview

Editors:
  1. C. Barry Carter

    1. University of Connecticut, Storrs, USA

    View editor publications

    You can also search for this editor in PubMed   Google Scholar

  2. David B. Williams

    1. Ohio State University, Columbus, USA

    View editor publications

    You can also search for this editor in PubMed   Google Scholar

  • An essential companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter
  • Equips the reader with a clear and deep understanding of TEM, the essential tool for studying nanomaterials
  • Presents advanced topics with the same look, feel, and approach that students already know from Williams & Carter
  • Features chapters on diffraction, high-resolution imaging, and chemical mapping by the leading experts in the field
  • Provides the fundamentals for students to understand and interpret the results of electron tomography and electron holography, even if they will not employ these techniques themselves
  • Includes supplementary material: sn.pub/extras

This is a preview of subscription content, log in via an institution to check access.

Access this book

Log in via an institution
eBook USD 69.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 89.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 129.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access

Licence this eBook for your library

Institutional subscriptions

Table of contents (17 chapters)

  1. Front Matter

    Pages i-xxxiii
    Download chapter PDF

  2. Electron Sources

    • Pieter Kruit
    Pages 1-15

  3. In Situ and Operando

    • Katherine Jungjohann, C. Barry Carter
    Pages 17-80

  4. Electron Diffraction and Phase Identification

    • M. Grace Burke
    Pages 81-102

  5. Convergent-Beam Electron Diffraction: Symmetry & Large-Aangle Patterns

    • Alwyn Eades
    Pages 103-144

  6. Electron Crystallography, Charge-Density Mapping and Nanodiffraction

    • John Spence
    Pages 145-166

  7. Digital Micrograph

    • Bernhard Schaffer
    Pages 167-196

  8. Electron Waves, Interference & Coherence

    • Michael Lehmann, Hannes Lichte
    Pages 197-214

  9. Electron Holography

    • Michael Lehmann, Hannes Lichte
    Pages 215-232

  10. Focal-Series Reconstruction

    • Andreas Thust
    Pages 233-266

  11. Direct Methods for Images Interpretation

    • Dirk Van Dyck, Sandra Van Aert
    Pages 267-281

  12. Imaging in the STEM

    • Stephen J. Pennycook
    Pages 283-342

  13. Electron Tomography

    • Matthew Weyland, Paul Midgley
    Pages 343-376

  14. EFTEM

    • Paul Thomas, Paul Midgley
    Pages 377-404

  15. Calculating EELS

    • Vicki Keast
    Pages 405-423

  16. Diffraction & X-Ray Excitation

    • Ian Jones
    Pages 425-437

  17. X-Ray and EELS Imaging

    • Paul Kotula
    Pages 439-466

  18. Practical Aspects and Advanced Applications of XEDS

    • Masashi Watanabe
    Pages 467-503

  19. Back Matter

    Pages 505-518
    Download chapter PDF
Back to top

Keywords

About this book

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science

Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

Reviews

“I would highly recommend this ‘companion’ volume for researchers and students of the materials and applied sciences; in fact, anybody using transmission electron microscopy in their research will extract many practical ideas … . Because of the high quality of the photographic images, composite illustrations, and text presentations, I suggest that this book has a place on the shelf of any electron microscopy laboratory. … The editors have put together a wonderful review volume that is well worth the read.” (David C. Bell, Microscopy and Microanalysis, Vol. 24 (03), June, 2018)



“Transmission Electron Microscopy, a Textbook for Materials Science, first published in 1996 with a second edition in 2009, is a comprehensive book on the subject, with a quite original approach. … The book was carefully designed for teaching purposes and its phenomenal success shows that this was time well spent.” (Peter Hawkes, Journal of Materials Science, Vol. 52, 2017)

Editors and Affiliations

  • University of Connecticut, Storrs, USA

    C. Barry Carter

  • Ohio State University, Columbus, USA

    David B. Williams

About the editors

C. Barry Carter is the Editor-in-Chief of the Journal of Materials Science and a CINT Distinguished Affiliate Scientist. He teaches at UConn.

David B. Williams is the Monte Ahuja Endowed Dean’s Chair, Executive Dean of The Professional Colleges and Dean of the College of Engineering at The Ohio State University.





Bibliographic Information

Publish with us

Policies and ethics

Back to top

Search

Navigation