Quantitative Analysis of Thin Specimens in the TEM Using a ϕ(ρz)-Model Gerben BoonGuillaume Bastin OriginalPaper 25 March 2004 Pages: 125 - 133
Direct Measurement of Electron Beam Scattering in the Low Vacuum SEM Redouane BelkorissatAb ed daim KadounChristian Mathieu OriginalPaper 16 April 2004 Pages: 135 - 139
Characterization of Vacuum Brazed Joints for Superconducting Cavities Irene CalliariEmilio RamousPaolo Favaron OriginalPaper 25 March 2004 Pages: 141 - 146
Transmission Electron Microscopy Study on the Formation of Al18B4O33 Whiskers Ionela CarazeanuVictor CiupinaGabriel Prodan OriginalPaper 25 March 2004 Pages: 147 - 150
High-Resolution Transmission Electron Microscopy Study of LiNixCo1−xO2 Synthesized by Unconventional Methods Victor CiupinaIonela CarazeanuCarmen Guguta OriginalPaper 08 April 2004 Pages: 151 - 155
The Use of Electron Backscatter Diffraction for the Investigation of Nano Crystalline Materials and the Move Towards Orientation Imaging in the TEM David J. DingleyMatthew M. Nowell OriginalPaper 16 April 2004 Pages: 157 - 165
Platinum-Group Element Distribution in Some Ore Deposits: Results of EPMA and Micro-PIXE Analyses Fernando GervillaLouis J. CabriJ. H. Gilles Laflamme OriginalPaper 16 April 2004 Pages: 167 - 173
Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation Petr KlapetekIvan OhlídalKarel Navrátil OriginalPaper 01 April 2004 Pages: 175 - 180
TEM Orientation Mapping Applied to the Study of Shear Band Formation Henryk PaulAdam MorawiecAndrzej Piątkowski OriginalPaper 01 April 2004 Pages: 181 - 186