1. The Legacy of Raimond Castaing

   • François Grillon
   • Jean Philibert

   Pages: 99 - 104

2. Improving Matrix Corrections

   • David C. Joy

   Pages: 105 - 113

3. EPMA Present and Future

   • Glyn Love

   Pages: 115 - 124

4. Applications of Electron Microbeam Analysis in the Earth Sciences

   • John F. W. Bowles

   Pages: 125 - 131

5. X-Ray Microanalysis of Thin Surface Films and Coatings

   • Jean-Louis Pouchou

   Pages: 133 - 152

6. Quantitative High Resolution Electron Microscopy

   • D. Van Dyck

   Pages: 153 - 180

7. Structural and Chemical Analysis of Materials with High Spatial Resolution

   • Klaus van Benthem
   • Stephan Krämer
   • Manfred Rühle

   Pages: 181 - 193

8. Nanometer-Scale Chemical Surface Analysis by Scanning (Tunnelling) Atom Probes

   • Paul F. A. Alkemade
   • Nicolai N. Gribov

   Pages: 195 - 206

9. Examples of Quantification in XPS on 5f Materials

   • Thomas Gouder
   • Ladislav Havela

   Pages: 207 - 215

10. Monitoring Fibre Surfaces with XPS in Papermaking Processes

    • Leena-Sisko Johansson

    Pages: 217 - 223

11. Analytical Potential of EDS at low Voltages

    • Edward D. Boyes

    Pages: 225 - 234

12. Soft X-Rays and Low-Voltage SEM in Practice

    • Stefan Kuypers

    Pages: 235 - 247

13. Benefits of X-Ray Spectrum Simulation at low Energies

    • Peter Duncumb
    • Peter J. Statham

    Pages: 249 - 258

14. Design Features of a High Resolution Microcalorimeter EDX System

    • Jens Höhne
    • Matthias Bühler
    • Joseph Nicolosi

    Pages: 259 - 264

15. Energy Dispersive X-Ray Spectrometry by Microcalorimetry for the SEM

    • Dale Newbury
    • David Wollman
    • John Martinis

    Pages: 265 - 274

16. Chemical Interactions by Low-Energy Electron-Induced X-Ray Emission Spectroscopy, LEXES

    • Christiane Bonnelle

    Pages: 275 - 282

17. Editorial: Modern Developments and Applications in Microbeam Analysis. Proceedings of the 7th Workshop of the European Microbeam Analysis Society (EMAS), May 6–10, 2001, Tampere, Finland

    • E. Heikinheimo
    • C. T. Walker
    • A. Armigliato

    Pages: V - VIII