Volume 699, Issue 1 | MRS Online Proceedings Library

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Volume 699, Issue 1

December 2001

Symposium R — Electrically Based Microstructural Characterization III

Issue Editors:

M. A. Alim,
R. A. Gerhardt,
G. M. Choi,
A. Washabaugh

47 articles in this issue

Scaling Effects in Al₇₂Mn₂₂Si₆ Quasicrystals Deduced from the Pressure and Temperature Dependence of the Resistance
John K. Vassiliou
Jens W. Otto
E. A. Simons
OriginalPaper 18 December 2001 Article: 317
Computer Simulation on the Relations between the Porosity and the Microwave Properties in Dielectric Ceramics
Jae-Hwan Park
Jae-Gwan Park
Yoonho Kim
OriginalPaper 18 December 2001 Article: 315
Effects of grain size distribution on Cole-Cole plots of polycrystalline spinels
M. P. Gutiérrez-Amador
R. Valenzuela
OriginalPaper 18 December 2001 Article: 313
Microstructural Development and Properties of (1-x) wt% Ba_0.55Sr_0.45TiO_3-x wt% MgO Bulk Ferroelectrics
Costas G. Fountzoulas
OriginalPaper 18 December 2001 Article: 103
Materials Characterization and Device Performance of a CMR-Ferroelectric Heterostructure
S. R. Surthi
S. Kotru
R. K. Pandey
OriginalPaper 18 December 2001 Article: 102
Electrical Conductivity of Ionic and Electronic Mixture
Gyeong Man Choi
Joon Hee Kim
Young Min Park
OriginalPaper 18 December 2001 Article: 96
Percolation properties of cellular composite systems
C. Chiteme
D. S. McLachlan
OriginalPaper 18 December 2001 Article: 95
A Percolation Equation for Modeling Experimental Results for Continuum Percolation Systems
D. S. McLachlan
C. Chiteme
Junjie Wu
OriginalPaper 18 December 2001 Article: 94
The influence of filler properties on the strong PTC effect of resistivity in polymer based conducting composites
Joachim Glatz-Reichenbach
Ralf Strümpler
OriginalPaper 18 December 2001 Article: 93
Microstructure and Damage of the Interlaminar Interface of Carbon Fiber Polymer-Matrix Composites, Monitored by Contact Electrical Resistivity Measurement
Shoukai Wang
Victor H. Guerrero
D. D. L. Chung
OriginalPaper 18 December 2001 Article: 92
Impedance spectroscopy study of ionic diffusion in polycrystalline ZrO₂:Y₂O₃ solid solution
Fábio C. Fonseca
Eliana N. S. Muccillo
R. Muccillo
OriginalPaper 18 December 2001 Article: 88
AC Conductivity Based Microstructural Characterization of Yttria Stabilized Zirconia
G. Sauti
D. S. McLachlan
OriginalPaper 18 December 2001 Article: 86
Electrical Characterization of Inhomogeneous and Heterogeneous Systems with Microstuctural Periodicity
Joachim Maier
OriginalPaper 18 December 2001 Article: 85
The use of XANES and ELNES for the Characterisation of Stabilised Zirconia
David W. McComb
Sergei Ostanin
Ali Alavi
OriginalPaper 18 December 2001 Article: 82
Electrochemical Porosimetry
Hyun-Kon Song
Kun-Hong Lee
OriginalPaper 18 December 2001 Article: 77
Relation Between Heat-Treatment Temperature and Characteristics of Polyparaphenylene(PPP)-Based Carbon Materials for Lithium Ion Secondary Batteries
Kozo Osawa
Tatsuo Nakazawa
Mildred S. Dresselhaus
OriginalPaper 18 December 2001 Article: 75
Influence of Confinement on Molecular Reorientational Dynamics of Liquid Crystals: Broadband Dielectric Spectroscopy Investigations
Fouad M. Aliev
OriginalPaper 18 December 2001 Article: 74
FT-IR spectra of Li(Al_xCo_1-x)O₂ (x=0.1-0.5)
W. Hao
C. Li
W. Xu
OriginalPaper 18 December 2001 Article: 73
The Structure and Electrical Properties of Polyaniline
Runqing Ou
Robert J. Samuels
Rosario A. Gerhardt
OriginalPaper 18 December 2001 Article: 72
Application of a Buffer Layer for the Dielectric Measurement of Thin Polymer Films
C. K. Chiang
Wataru Sakai
OriginalPaper 18 December 2001 Article: 71
Improvement of Characteristics in Highly Reliable thin Film Diode with Anodic Tantalum Pentoxide by Low Temperature Annealing Conditions
Chan-Jae Lee
Sung-Jei Hong
Jeong-In Han
OriginalPaper 18 December 2001 Article: 66
Radio-Frequency Impedance Analysis of Anodic Tantalum Pentoxide Thin Films
S. Dueñas
H. Castãn
P. A. Sullivan
OriginalPaper 18 December 2001 Article: 65
Surface Roughness and Surface-Induced Resistivity of Thin Gold Films On Mica
Raúl C. Munoz
German Kremer
Claudio Arenas
OriginalPaper 18 December 2001 Article: 56
Refractory Thin-Film Metallizations with Controlled Stress and Electrical Resistivity
Ilan Golecki
Margaret Eagan
OriginalPaper 18 December 2001 Article: 55
Magnetic Force Microscopy Signatures of Defects in Current-carrying Lines
Ruchirej Yongsunthon
Ellen D. Williams
Martin Peckerar
OriginalPaper 18 December 2001 Article: 52
Investigation of Pt/Si/CeO₂/Pt MOS Device Structure by Impedance Spectroscopy
Jyrki Lappalainen
Darja Kek
Harry L. Tuller
OriginalPaper 18 December 2001 Article: 51
Microwave Transient Photoconductivity Studies in Porous Semiconductors
Horia-Eugen Porteanu
Elisaveta Konstantinova
T. U. München
OriginalPaper 18 December 2001 Article: 48
Displacement Current Staircase due to Coulomb Blockade
Kouhei Nagano
Atsushi Okuda
Yutaka Majima
OriginalPaper 18 December 2001 Article: 47
Capacitance Spectroscopy of n-i-n and p-i-p GaAs Sandwich Structures with Nanoscale As Clusters in the i-Layers
V. V. Chaldyshev
P. N. Brunkov
B. R. Semyagin
OriginalPaper 18 December 2001 Article: 46
Depth Dependence of Dopant Induced Features on The Si(100)2x1:H Surface and Its Application for Three Dimensional Dopant Profiling
Lequn Liu
Jixin Yu
Joseph W. Lyding
OriginalPaper 18 December 2001 Article: 45
Conductance-transient three-dimensional profiling of disordered induced gap states on metal-insulator-semiconductor structures
H. Castán
S. Dueñas
G. González-Díaz
OriginalPaper 18 December 2001 Article: 44
Determination of Surface Space Charge Density on Semiconductor from Displacement Current-Voltage Curve using a Scanning Vibrating Probe
Yutaka Majima
Tomohiko Masuda
Mitsumasa Iwamoto
OriginalPaper 18 December 2001 Article: 43
Analysis of Ion Implantation Damage in Silicon Wafers by a Contactless Microwave Diagnostic
Richard K. Ahrenkiel
B. Lojek
OriginalPaper 18 December 2001 Article: 42
Improving GaAs Chip yield And Enhancing Reliability of GaAs Devices
Kanti Prasad
OriginalPaper 18 December 2001 Article: 41
Influence of Substrate Annealing Temperature upon Deep Levels in n-Type 4H SiC
Martin E. Kordesch
Florentina Perjeru
R. L. Woodin
OriginalPaper 18 December 2001 Article: 37
Electrically Active Deep Levels in ScN
Florentina Perjeru
Xuewen Bai
Martin E. Kordesch
OriginalPaper 18 December 2001 Article: 36
Charge-Based Deep Level Transient Spectroscopy of Semiconducting and Insulating Materials
V. I. Polyakov
A. I. Rukovishnokov
B. Druz
OriginalPaper 18 December 2001 Article: 34
Phase Transformation Hysteresis in a Plutonium Alloy System: Modeling the Resistivity during the Transformation
Jeffery J. Haslam
Mark A. Wall
Adam J. Schwartz
OriginalPaper 18 December 2001 Article: 27
Detection of Compositional Fluctuations in High Temperature Exposed Waspaloy
Xiaodong Zou
Tariq Makram
Rosario A. Gerhardt
OriginalPaper 18 December 2001 Article: 26
Effect of Grain Boundaries and Indentation Load on the Electrical Properties of Nickel Base Super-alloys
Kimberly Pinkos
Celestina Laboy
Rosario A. Gerhardt
OriginalPaper 18 December 2001 Article: 25
An ab initio Investigation on the Effects of Impurity in Aluminum Grain Boundary
Guang-Hong Lu
Tomoyuki Tamura
Ryoichi Yamamoto
OriginalPaper 18 December 2001 Article: 24
Damage Detectability on Aluminum Alloy Panels Under Composite Patching by Various NDT Techniques
Antonia Moropoulou
Niki Kouloumbi
Paraskevi Pantazopoulou
OriginalPaper 18 December 2001 Article: 23
Impedance Spectroscopy in Ferromagnetic Materials
Raul Valenzuela
OriginalPaper 18 December 2001 Article: 21
Structure and Electronic Properties of Diamond-Like Carbon and its Heat-Treatment Effect
Kazuyuki Takai
Meigo Oga
Sumio Iijima
OriginalPaper 18 December 2001 Article: 17
Incentives for Using LEIM in the Investigation of Corrosion Initiation on Organic Coated Alloys
S. R. Taylor
A. M. Mierisch
OriginalPaper 18 December 2001 Article: 14
Sensitivity and Resolution Limits in Scanning Capacitance Microscopy
Štefan Lányi
Miloslav Hruškovic
OriginalPaper 18 December 2001 Article: 13
Scanning Impedance Microscopy: From Impedance Spectra to Impedance Images
Sergei V. Kalinin
Dawn A. Bonnell
OriginalPaper 18 December 2001 Article: 12