Volume 631, Issue 1

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December 2000

Symposium AA — Millimeter-/Submillimeter-Wave Technology Materials, Devices and Diagnostics

Issue Editors:

S. K. Sundaram,
P. P. Woskov,
Y. I. Ogita,
J. Tuovinen

13 articles in this issue

BWO-Characterization of Materials and Devices at Frequencies 100-1000 GHz
A. A. Volkov
V. B. Anzin
I. E. Spector
OriginalPaper 01 December 2000 Article: 29
Isovalent Substitution of Sr for Ba in Ba_3.75Nd_9.5Ti₁₈O₅₄ Microwave Dielectric Ceramics - Experimental and Computer Modelling Studies
Paisan Setasuwon
Robert Freer
Colin Leach
OriginalPaper 01 December 2000 Article: 27
Millmeter Wave Aquametry
Viacheslav V. Meriakri
OriginalPaper 01 December 2000 Article: 26
Silicon Wafer Subsurface Characterization with UV/Millimeter-Wave Technique
Yoh-Ichiro Ogita
Yuichiro Gan-nen
OriginalPaper 01 December 2000 Article: 25
Planar Ferrite Materials for Millimeter-Wave Applications
Stephen W. McKnight
Steven A. Oliver
Carmine Vittoria
OriginalPaper 01 December 2000 Article: 24
Integrated GaAs Diode Technology for Millimeter and Submillimeter-wave Components and Systems
Thomas W. Crowe
Jeffrey L. Hesler
David W. Porterfield
OriginalPaper 01 December 2000 Article: 23
Nanofabricated SiO₂-Si-SiO₂ Resonant Tunneling Diodes
J. G. Fleming
E. Chow
S.-Y. Lin
OriginalPaper 01 December 2000 Article: 22
Millimeter Wave Solid State Devices
Steven A. Rosenau
Cheng Liang
Neville C. Luhmann Jr
OriginalPaper 01 December 2000 Article: 21
Subsurface Damage Profile Characterization of Si Wafers with Uv/Millimeter-Wave Technique and Light Scattering Topography
Takeo Katoh
Hideyuki Kondo
Masaki Kurokawa
OriginalPaper 01 December 2000 Article: 19
Subsurface Damage Characterization of Hydrogen Ion Implanted Silicon Wafer with Uv/Millimeter-Wave Technique
Yoh-Ichiro Ogita
Ken-Ichi Kobayashi
Takeo Katoh
OriginalPaper 01 December 2000 Article: 18
Open Resonator Technique for Measurement of Thin Dielectric Film Properties on Optically Dense Substrates
Sergey Dudorov
Dmitri Lioubtchenko
Antti V. Räisänen
OriginalPaper 01 December 2000 Article: 17
Millimeter-Submillimeter Vector Measurements in Free Space, and in Resonant Structures. Application to Dielectrics Characterization.
Philippe Goy
Michel Gross
Massimo Martinelli
OriginalPaper 01 December 2000 Article: 16
Multi-Channel Radiometry in MMW Imaging Systems
V. S. Ablyazov
V. V. Abramov
S. Yu. Turigin
OriginalPaper 01 December 2000 Article: 15

Volume 631, Issue 1

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