Volume 62, Issue 1

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December 1985

Symposium Q — Materials Problem Solving with the Transmission Electron Microscope

Issue Editors:

L. W. Hobbs,
K. H. Westmacott,
D. B. Williams

50 articles in this issue

Quality and Reliability Assurance of Semiconductor Devices through Transmission Electron Microscopy
R. F. Pinizzotto
F. Y. Clark
M. L. Jarvis
OriginalPaper 25 February 2011 Pages: 3 - 8
Identification of Growth Induced Planar Defects in Silicon
H. P. Strunk
A. Kessler
E. Bauser
OriginalPaper 25 February 2011 Pages: 9 - 16
Characterization of Precipitates Decorating Stacking Faults in Single Crystal Silicon
K. Ryoo
R. Drosd
W. E. Wood
OriginalPaper 25 February 2011 Pages: 17 - 24
Contributions of Electron Microscopy to the Understanding of Reactions on Compound Semiconductor Surfaces
T. Sands
OriginalPaper 25 February 2011 Pages: 25 - 35
The Core Structure of Dislocations in GaAs
B. C. De Cooman
K.-H. Kuesters
C. B. Carter
OriginalPaper 25 February 2011 Pages: 37 - 44
Origin of Grown-In Dislocations in III–V Compound Semiconductor Epitaxial Layers
S. Nakahara
S. N. G. Chu
OriginalPaper 25 February 2011 Pages: 45 - 48
TEM and SEM Studies of MOCVD-Grown GaP on Si
M. M. Al-Jassim
J. M. Olson
K. M. Jones
OriginalPaper 25 February 2011 Pages: 49 - 56
The Potential of High-Resolution Transmission Electron Microscopy for Imaging Impurities at Dislocations and Grain Boundaries in Silicon
Jamie H. Rose
R. Gronsky
OriginalPaper 25 February 2011 Pages: 57 - 64
Electron Diffraction Study of Multilayer Structures with Partially Coherent Illumination
N. Otsuka
C. Choi
R. L. Gunshor
OriginalPaper 25 February 2011 Pages: 65 - 71
Application of Analytical Electron Microscopy to Ion Implantation and Near Surface Microstructures
P. S. Sklad
OriginalPaper 25 February 2011 Pages: 73 - 81
TEM Studies of Low Energy Argon and Iodine Ion Milling Phenomena in Compound Semiconductors
A. G. Cullis
N. G. Chew
J. L. Hutchison
OriginalPaper 25 February 2011 Pages: 83 - 88
Defect and Microstructural Analyses in Ferromagnetic Materials
L. L. Horton
OriginalPaper 25 February 2011 Pages: 89 - 96
Microstructure of Rapidly Solidified Al-Si Exhibiting Enhanced Superconducting Properties
M. A. Noack
A. J. Drehman
A. R. Pelton
OriginalPaper 25 February 2011 Pages: 97 - 103
TEM/STEM Sample Preparation for the Investigation of Solid State Structures: Applications to Electronic Devices and Computer Components
Richard E. Flutie
OriginalPaper 25 February 2011 Pages: 105 - 112
High Resolution Microanalysis of Interfaces
Anthony J. Garratt-Reed
OriginalPaper 25 February 2011 Pages: 115 - 122
Some Advantages of EDS Analysis in a 400 KV Electron Microscope
S. Suzuki
T. Honda
Y. Bando
OriginalPaper 25 February 2011 Pages: 123 - 128
Electron Energy Loss Fine Structure of Carbides and Nitrides
Mark M. Disko
OriginalPaper 25 February 2011 Pages: 129 - 138
Electron Energy-Loss Spectroscopy in a 400kV Transmission Electron Microscope (TEELS)
T. Oikawa
J. Hosoi
J. L. Lehman
OriginalPaper 25 February 2011 Pages: 139 - 142
Convergent-Beam Diffraction in the Characterization of Crystalline Phases
J. A. Eades
M. J. Kaufman
H. L. Fraser
OriginalPaper 25 February 2011 Pages: 143 - 151
Cold Alchemi: Impurity Atom Site Location and the Temperature Dependance of Dechannelling
J. C. H. Spence
R. J. Graham
D. Shindo
OriginalPaper 25 February 2011 Pages: 153 - 162
Role of the Critical Voltage Effect in Materials Characterization
Robert M. Fisher
OriginalPaper 25 February 2011 Pages: 163 - 168
Diffusion Measurements by Analytical Electron Microscopy
A. D. Romig Jr.
OriginalPaper 25 February 2011 Pages: 169 - 182
The Application of Analytical Electron Microscopy to Improving the Sensitization Resistance of Type 304 Stainless Steels
H. S. Betrabet
W. A. T. Clark
OriginalPaper 25 February 2011 Pages: 183 - 190
Determination of Phase Diagrams by AEM
Raghavan Ayer
OriginalPaper 25 February 2011 Pages: 193 - 199
AEM Microanalysis of Phase Equilibria in Ni₃Al Intermetallic Alloys Containing Iron
Bruce L. Bramfitt
Joseph R. Michael
OriginalPaper 25 February 2011 Pages: 201 - 208
Measurement of Equilibrium and Nonequilibrium Segregation by X-Ray Microanalysis
Edward A. Kenik
OriginalPaper 25 February 2011 Pages: 209 - 216
The Use of Symmetry in the TEM Analysts of Precipitate Morphologies
U. Dahmen
K. H. Westhacott
OriginalPaper 25 February 2011 Pages: 217 - 228
High Resolution Moire Imaging of Small Precipitates
W. Kesternich
OriginalPaper 25 February 2011 Pages: 229 - 240
TEM Studies of Precipitate Growth at the Atomic Level
J. M. Howe
R. Gronsky
OriginalPaper 25 February 2011 Pages: 241 - 253
A Quasicrystalline Decagonal Phase in Al-Fe-Ce
L. H. Angers
L. D. Marks
M. E. Fine
OriginalPaper 25 February 2011 Pages: 255 - 262
Quantitative Microanalysis of Fine Precipitates in Microalloyed Steels
Joseph R. Michael
OriginalPaper 25 February 2011 Pages: 263 - 272
Electron Microscopy Observations of Precipitation during Tempering of Vasco X-2M Steel and Its Relation to Impact Toughness
James E. Krzanowski
OriginalPaper 25 February 2011 Pages: 273 - 280
EDX and EELS Analysis of Precipitates in HSLA Steels
Z. Chen
M. H. Loretto
R. Cochrane
OriginalPaper 25 February 2011 Pages: 281 - 287
Crystalline-to-Amorphous Transitions in Ti-Ni Alloys
A. R. Pelton
P. Moine
R. Sinclair
OriginalPaper 25 February 2011 Pages: 291 - 302
An In-Situ Study of Velocity/Driving Force Relations for Interfacial Migration
Woonsup Park
Samuel M. Allen
OriginalPaper 25 February 2011 Pages: 303 - 310
In-Situ High Resolution Transmission Electron Microscopy of Dynamic Events during the Amorphous to Crystalline Phase Transformation in Silicon
M. A. Parker
T. W. Sigmon
R. Sinclair
OriginalPaper 25 February 2011 Pages: 311 - 321
Application of HREM in Studying Amorphisation of Intermetallic Compounds
D. E. Luzzi
H. Mori
M. Meshii
OriginalPaper 25 February 2011 Pages: 323 - 328
Compositional Profiling of Rapidly Solidified Cellular Structures
Terrence M. Mackey
Thomas F. Kelly
OriginalPaper 25 February 2011 Pages: 329 - 336
Electron Microscopy Study of Structural Changes during Isothermal Annealing of a Ni₄Mo-Based Alloy Containing Chromium
K. Vasudevan
E. E. Stansbury
OriginalPaper 25 February 2011 Pages: 337 - 347
Commensuration and Discommensuration in the Ag-Mg Alloys
Y. Fujino
H. Sato
N. Otsuka
OriginalPaper 25 February 2011 Pages: 349 - 355
High Resolution Electron Microscopy of Triply Incommensurate Phase of 2H-TaSe₂
Takashi Onozuka
Nobuo Otsuka
Hiroshi Sato
OriginalPaper 25 February 2011 Pages: 357 - 364
Detection and Imaging of Supported Catalyst Particles
Michael M. J. Treacy
OriginalPaper 25 February 2011 Pages: 367 - 378
Morphological Developments of Nickel Particles in Supported Metal Catalysts
A. G. Dhere
R. J. De Angelis
A. Habenschuss
OriginalPaper 25 February 2011 Pages: 379 - 385
High Resolution Imaging of As-Grown Sapphire Surfaces
Tung Hsu
S. R. Nutt
OriginalPaper 25 February 2011 Pages: 387 - 394
Electron Microscopy of Ion Deposited Thin Films of the Oxides of Titanium
A. B. Harker
D. G. Howitt
P. Kobrin
OriginalPaper 25 February 2011 Pages: 395 - 401
High Spatial Resolution Microanalysis of Catalyst Particles
C. E. Lyman
OriginalPaper 25 February 2011 Pages: 403 - 413
The Local Atomic Arrangement in Amorphous Si_xc_1−x:H by Electron Energy Loss Spectroscopy and Electron Diffraction
J. Tafto
F. J. Kampas
OriginalPaper 25 February 2011 Pages: 415 - 420
Characterization of Reactively Sputtered Titanium Carbide Films by Analytical Electron Microscopy
J. Tafto
G. Rajeswaran
T. Saulys
OriginalPaper 25 February 2011 Pages: 421 - 425
Grain-Boundary, Glassy-Phase Identification and Possible Artifacts
Y. Kouh Simpson
C. B. Carter
J. Bentley
OriginalPaper 25 February 2011 Pages: 427 - 434
Microstructural Changes in Deformed Silicon Nitride and Silicon Carbide
Nancy J. Tighe
OriginalPaper 25 February 2011 Pages: 435 - 446

Volume 62, Issue 1

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