Volume 615, Issue 1

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December 2000

Symposium G — Polycrystalline Metal & Magnetic Thin Films - 2000

Issue Editors:

B. Clemens,
L. Gignac,
J. MacLaren,
O. Thomas

14 articles in this issue

Structural and Elastic Response of Mo/Ni Multilayers to Ion Irradiation
Jérôme Pacaud
Franck Martin
François Ganot
OriginalPaper 14 March 2011 Article: 871
In Situ Stress and Strain Measurements During the Growth of Cu/Ni (001) Multilayers
T. Bigault
F. Bocquet
B. Gilles
OriginalPaper 14 March 2011 Article: 861
In Situ Curvature and Diffraction Studies of Pd Films on Si(001) During Solid-State Reaction
P. Gergaud
O. Thomas
S. L. Zhang
OriginalPaper 14 March 2011 Article: 831
Raman Spectroscopy: A Unique Tool for the Study of Thin Films
Ingrid De Wolf
OriginalPaper 14 March 2011 Article: 811
Grain Boundary Curvature in Polycrystalline Metallic Thin Films
Alexander H. King
Rakesh Mangat
Kwame Owusu-Boahen
OriginalPaper 14 March 2011 Article: 781
Observation of Long-Range Orientational Ordering in Metal Films Evaporated at Oblique Incidence onto Glass
David L. Everitt
X. D. Zhu
Nicholas L. Abbott
OriginalPaper 14 March 2011 Article: 771
Characterization of Cu-Al alloy/SiO₂ interface microstructure
Pei-I Wang
S. P. Murarka
K. Rajan
OriginalPaper 14 March 2011 Article: 751
Work Function Study of Polycrystalline Metals using a UHV Scanning Kelvin Probe
U. Petermann
I. D. Baikie
K. M. Dirscherl
OriginalPaper 14 March 2011 Article: 661
Electrical And Microscopic Investigation Of E-Gun Evaporated Titanium Thin Films
Karl Hofmann
Martina Luysberg
Heinrich Kurz
OriginalPaper 14 March 2011 Article: 651
In situ electrical resistance measurements of Al-Ge films in the TEM using a modified heating holder
M. A. Verheijen
J. J. T. M. Donkers
C. M. Smit
OriginalPaper 14 March 2011 Article: 611
Changes in Stress and Microstructure in PtMn/CoFe Bilayers during Annealing
S. P. Bozeman
B. J. Daniels
D. J. Larson
OriginalPaper 14 March 2011 Article: 561
Residual Stresses and Magnetoelastic Coupling in Ultrathin Fe Films Deposited on GaAs(001)
P. Gergaud
C. Lallaizon
A. Guivarc’h
OriginalPaper 14 March 2011 Article: 291
X-ray Probes of Magnetic Multilayer Structure
B. K. Tanner
T. P. A. Hase
S. B. Wilkins
OriginalPaper 14 March 2011 Article: 211
Chemical Ordering and Microstructure of FePd Thin Films with perpendicular Magnetic Anisotropy
B. Gilles
F. F. Xu
G. Patrat
OriginalPaper 14 March 2011 Article: 171

Volume 615, Issue 1

Structural and Elastic Response of Mo/Ni Multilayers to Ion Irradiation

In Situ Stress and Strain Measurements During the Growth of Cu/Ni (001) Multilayers

In Situ Curvature and Diffraction Studies of Pd Films on Si(001) During Solid-State Reaction

Raman Spectroscopy: A Unique Tool for the Study of Thin Films

Grain Boundary Curvature in Polycrystalline Metallic Thin Films

Observation of Long-Range Orientational Ordering in Metal Films Evaporated at Oblique Incidence onto Glass

Characterization of Cu-Al alloy/SiO₂ interface microstructure

Work Function Study of Polycrystalline Metals using a UHV Scanning Kelvin Probe

Electrical And Microscopic Investigation Of E-Gun Evaporated Titanium Thin Films

In situ electrical resistance measurements of Al-Ge films in the TEM using a modified heating holder

Changes in Stress and Microstructure in PtMn/CoFe Bilayers during Annealing

Residual Stresses and Magnetoelastic Coupling in Ultrathin Fe Films Deposited on GaAs(001)

X-ray Probes of Magnetic Multilayer Structure

Chemical Ordering and Microstructure of FePd Thin Films with perpendicular Magnetic Anisotropy

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