Volume 591, Issue 1 | MRS Online Proceedings Library

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Volume 591, Issue 1

December 1999

Symposium S — Nondestructive Methods for Materials Characterization

Issue Editors:

G. Baaklini,
R. Gilmore,
T. Matikas,
N. Meyendorf

46 articles in this issue

Interfacial Diffusion in a MOCVD Grown Barium Titanate Film
A. Datta
Soma Chattopadhyay
C. B. Lee
OriginalPaper 01 March 2000 Pages: 1 - 6
Microscopic Techniques for Characterization of Magnetic Layers
N. Meyendorf
I. Altpeter
H. Grimm
OriginalPaper 01 March 2000 Pages: 7 - 15
Non-Destructive Evaluation of 304 Stainless Steels Using a Scanning Hall-Sensor Microscope: Visualization of Strain-Induced Austenite-Phase Breakdown
A. Oota
K. Miyake
H. Aoki
OriginalPaper 01 March 2000 Pages: 16 - 21
IRS and ESR Characterizations of Nanocomposite Thin Films Derived From Alkanethiolates and Gold Nanoparticles
W. X. Zheng
F. L. Leibowitz
C. J. Zhong
OriginalPaper 01 March 2000 Pages: 22 - 27
Optimization of X-Ray Techniques for Nondestructive Characterization of Single Crystal Turbine Blades
J.M. Winter Jr.
K.G. Lipetzky
R.E. Green Jr.
OriginalPaper 01 March 2000 Pages: 28 - 39
In Situ Observation of Oxidization Process at the Most Upper Surfaces by X-Ray Surface Propagation Waves
Toshihisa Horiuchi
Kenji Ishida
Kazumi Matsushige
OriginalPaper 01 March 2000 Pages: 40 - 43
Three-Dimensional, Nondestructive Imaging of Low Density Materials
J.H. Kinney
D.L. Haupt
J.D. Lemay
OriginalPaper 01 March 2000 Pages: 44 - 49
Image-Guided Failure Assessment of Porous Materials
M. Tantillo
R. Müller
OriginalPaper 01 March 2000 Pages: 50 - 55
X-Ray Microtomography of Fatigue Crack Closure as a Function of Applied Load in Al-Li 2090 T8E41 Samples
R. Morano
S.R. Stock
J.C. Elliott
OriginalPaper 01 March 2000 Pages: 56 - 60
High-Frequency Stroboscopic X-ray Topography Under Surface Acoustic Wave Excitation
E. Zolotoyabko
OriginalPaper 01 March 2000 Pages: 61 - 66
Scanning Acoustic Microscopy and X-ray Diffraction Investigation of Near Crack Tip Stresses
S. Sathish
R. W. Martin
OriginalPaper 01 March 2000 Pages: 67 - 72
Development of Nondestructive Method for Prediction of Crack Instability
J. L. Schroeder
D. Eylon
T. E. Matikas
OriginalPaper 01 March 2000 Pages: 73 - 78
Nondestructive Characterization of Corrosion Protective Coatings on Aluminum Alloy Substrates
J. Hoffmann
S. Sathish
T.E. Matikas
OriginalPaper 01 March 2000 Pages: 79 - 84
Nondestructive Evaluation of Fatigue in Titanium Alloys
H. Rösner
N. Meyendorf
T.E. Matikas
OriginalPaper 01 March 2000 Pages: 85 - 90
Real-Time Monitoring of Acoustic Linear and Nonlinear Behavior of Titanium Alloys During Cyclic Loading
J. Frouin
J. Maurer
T.E. Matikas
OriginalPaper 01 March 2000 Pages: 91 - 96
Impedance Spectroscopy Investigation on the Low-Temperature Degradation of Tetragonal Zirconia: Influence of Measurement Conditions
A. P. Santos
R. Z. Domingues
OriginalPaper 01 March 2000 Pages: 97 - 102
Electrically Based Non-Destructive Microstructural Characterization of All Classes of Materials
Rosario A. Gerhardt
OriginalPaper 01 March 2000 Pages: 103 - 114
Non-Destructive Dielectric Assessment of Water Permeation in Composite Structures
P. Boinard
E. Boinard
R.L. Crane
OriginalPaper 01 March 2000 Pages: 115 - 120
Nondestructive Damage Evaluation of Electro-Mechanical Components Using a Hybrid, Computational and Experimental Approach
C. Furlong
R. J. Pryputniewicz
OriginalPaper 01 March 2000 Pages: 121 - 126
The Role of Structure-to-Property-Relationships in Materials Characterization
W. Morgner
OriginalPaper 01 March 2000 Pages: 127 - 136
Nonlinear Ultrasonic Parameter in Precipitate-Hardened Steels^*
D. C. Hurley
D. Balzar
P. T. Purtscher
OriginalPaper 01 March 2000 Pages: 137 - 142
Infrared Evaluation of Heat Generation During the Cyclic Deformation of a Cellular Al Alloy
A. Rabiei
J. W. Hutchinson
A. G. Evans
OriginalPaper 01 March 2000 Pages: 143 - 151
Giant Magnetoresistance Imaging for NDE of Conductive Materials
E. S. Boltz
S. G. Albanna
J. P. Abeyta
OriginalPaper 01 March 2000 Pages: 152 - 157
Non-Destructive Evaluation of Mechanical Properties of Magnetic Materials
Kevin P. Kankolenski
Susan Z. Hua
Harsh Deep Chopra
OriginalPaper 01 March 2000 Pages: 158 - 163
Dual Band Infrared Thermography as a NDT Tool for the Characterization of the Building Materials and Conservation Performance in Historic Structures
A. Moropoulou
N.P. Avdelidis
N.K. Kanellopoulos
OriginalPaper 01 March 2000 Pages: 164 - 169
Characterization of Hydrogen in Concrete by Cold Neutron Prompt Gamma-Ray Activation Analysis and Neutron Incoherent Scattering
Rick L. Paul
H. Heather Chen-Mayer
Menno Blaauw
OriginalPaper 01 March 2000 Pages: 170 - 175
Quantitative Contact Spectroscopy and Imaging by Atomic-Force Acoustic Microscopy
W. Arnold
S. Amelio
U. Rabe
OriginalPaper 01 March 2000 Pages: 176 - 187
Precise Determination of Thin Metal Film Thickness With Laser-Induced Acoustic Grating Technique
A.A. Maznev
M.J. Banet
K.A. Nelson
OriginalPaper 01 March 2000 Pages: 188 - 193
Quantitative Measurement of Local Carrier Concentration of Semiconductor From Displacement Current-Voltage Curve Using a Scanning Vibrating Tip
Yutaka Majima
Yutaka Oyama
Mitsumasa Iwamoto
OriginalPaper 01 March 2000 Pages: 194 - 199
Characterization of nitrided silicon-silicon dioxide interfaces
M. L. Polignano
M. Alessandri
D. Lopes
OriginalPaper 01 March 2000 Pages: 200 - 205
IR Tomography of the Lifetime and Diffusion Length of Charge Carriers in Semiconductor Silicon Ingots
V.D. Akhmetov
N.V. Fateev
OriginalPaper 01 March 2000 Pages: 206 - 211
Monitoring Silicon Quality From Diffusion Furnaces Using In-Line Measurements
Matt Stoker
Kelvin Catmull
Brian Letherer
OriginalPaper 01 March 2000 Pages: 212 - 217
Small Signal AC-Surface Photovoltage Technique for Non-Contact Monitoring of Near Surface Doping and Recombination-Generation in the Depletion Layer
D. Marinskiy
J. Lagowski
D. De Busk
OriginalPaper 01 March 2000 Pages: 218 - 223
Method and Instrumentation for Nondestructive Characterization of Surface Area and Pore Size Distribution of Thin Films in Their Deposited State
E. S. Boltz
Y. H. Spooner
J. P. Abeyta
OriginalPaper 01 March 2000 Pages: 224 - 229
Experimental Simulation of Contamination Arising From Electro Rocket Engine-Jet on Surface of Spacecraft Units
A. Chirov
A. Nadiradze
V. Egorov
OriginalPaper 01 March 2000 Pages: 230 - 235
Thermal Penetration Times as a Nondestructive Measure of Orientation in Polyimide Film
C. Chandler
N.E. Mathis
R.J. Samuels
OriginalPaper 01 March 2000 Pages: 236 - 241
Photoelastic Imaging of Process Induced Defects in 300mm-Silicon Wafers
H.D. Geiler
W. Kürner
O. Storbeck
OriginalPaper 01 March 2000 Pages: 242 - 246
In Situ Spectroscopic Ellipsometry for the Real Time Process Control of Plasma Etching of Silicon Nitride
I. G. Rosen
T. Parent
A. Madhukar
OriginalPaper 01 March 2000 Pages: 247 - 252
Characterization of Ni- and Ni(Pt)-Silicide Formation on Narrow Polycrystalline Si Lines by Raman Spectroscopy
P. S. Lee
D. Mangelinck
L. Chan
OriginalPaper 01 March 2000 Pages: 253 - 259
Raman Characterization of Composition and Strain in Si_1−xGe_x/Si Heterostructures
Ran Liu
B. Tillack
P. Zaumseil
OriginalPaper 01 March 2000 Pages: 260 - 265
Nondestructive Measurement of In-Plane Residual Stress in Silicon Strips
Tieyu Zheng
Steven Danyluk
OriginalPaper 01 March 2000 Pages: 266 - 270
Characterization of Copper Surfaces Used in Electronic Circuit Boards by Reflectance FT-IR
James M. Sloan
Charles G. Pergantis
OriginalPaper 01 March 2000 Pages: 271 - 275
In Situ Spectroscopic Ellipsometry Study of the Oxide Etching and Surface Damaging Processes on Silicon Under Hydrogen Plasma
I.M. Vargas
J.Y. Manso
G. Morell
OriginalPaper 01 March 2000 Pages: 276 - 281
In Situ Monitoring of MOCVD of Aluminum Nitride by Optical Spectroscopies
S.C. Allen
H.H. Richardson
OriginalPaper 01 March 2000 Pages: 282 - 287
Real-Time optical Characterization and Control of Heteroepitaxial Ga_xIn_1−xP Growth by P-Polarized Reflectance
N. Dietz
K. Ito
V. Woods
OriginalPaper 01 March 2000 Pages: 288 - 293
Nondestructive Characterization of GaN Films Grown at Low and High Temperatures
C.H. Yana
H.W. Yao
J.M. Zavada
OriginalPaper 01 March 2000 Pages: 294 - 299