Volume 589, Issue 1 | MRS Online Proceedings Library

Search all MRS Online Proceedings Library articles

Volume 589, Issue 1

December 1999

Symposium Q — Advances in Materials Problem Solving with the Electron Microscope

Issue Editors:

C. Allen,
J. Bentley,
U. Dahmen,
I. Petrov

60 articles in this issue

Bonding in Ion-Implanted Carbon Films Characterized by TEM Spectrum Lines and Energy-Filtered Imaging
J. Bentley
K. C. Walter
N. D. Evans
OriginalPaper 18 December 1999 Article: 395
The Effect of Different Oxidizing Atmospheres on the Initial Kinetics of Copper Oxidation as Studied by In Situ UHV-TEM
Mridula D. Bharadwaj
Anu Gupta
Judith C. Yang
OriginalPaper 18 December 1999 Article: 389
Characterization of Intergranular Phases in Doped Zirconia Polycrystals
N. D. Evans
P. H. Imamura
M. L. Mecartney
OriginalPaper 18 December 1999 Article: 383
Interfacial Interaction between CR Thin Films and Oxide Glasses
N. Jiang
J. Silcox
OriginalPaper 18 December 1999 Article: 377
Effects of ‘As Deposited’ and Alloying Temperatures on the Distribution of Cu in 0.5%Cu-Al Films.
P. L. Smith
J. Gazda
OriginalPaper 18 December 1999 Article: 372
Formation of AlN Films on Ti/TiN ARC-Layer Interface with Al-0.5%Cu Interconects Evaluated by XPS and Energy-Filtered-TEM
J. Gazda
J. Zhao
R. A. White
OriginalPaper 18 December 1999 Article: 365
Atomic Structure of Gold and Copper Boundaries
C. J. D. Hetherington
OriginalPaper 18 December 1999 Article: 359
Structural Study of a [100] 45° Twist Plus 7.5° Tilt Grain Boundary in Aluminium by HREM
M. Shamsuzzoha
P. A. Deymier
David J. Smith
OriginalPaper 18 December 1999 Article: 353
Electronic Effects on Grain Boundary Structure in BCC Metals
Geoffrey H. Campbell
Wayne E. King
Stephen M. Foiles
OriginalPaper 18 December 1999 Article: 347
Atomic and Electronic Structure Analysis of Σ=3, 9 and 27 Boundary, and Multiple Junction in β-SiC
K. Tanaka
M. Kohyama
OriginalPaper 18 December 1999 Article: 341
Characterization of the Interface between Lanthanum Hexa-Aluminate and Sapphire by Exit Wave Reconstruction
B. Wessler
A. Steinecker
W. Mader
OriginalPaper 18 December 1999 Article: 335
SEM/EDX Spectrum Imaging and Statistical Analysis of a Metal/Ceramic Braze
Paul G. Kotula
Michael R. Keenan
Ian M. Anderson
OriginalPaper 18 December 1999 Article: 329
Atomic Scale Analysis of Cubic Zirconia Grain Boundaries
E. C. Dickey
X. Fan
S. J. Pennycook
OriginalPaper 18 December 1999 Article: 323
Investigating Atomic Scale Phenomena at Materials Interfaces with Correlated Techniques in STEM/TEM
N. D. Browning
A. W. Nicholls
S. Stemmer
OriginalPaper 18 December 1999 Article: 311
STEM Analysis of the Segregation of Bi to Σ19a Grain Boundaries in Cu
W. Sigle
L.-S. Chang
M. Rühle
OriginalPaper 18 December 1999 Article: 307
Investigation of Copper Segregation to the Σ5(310)/[001] Symmetric Tilt Grain Boundary in Aluminum
Jürgen M. Plitzko
Geoffrey H. Campbell
Stephen M. Foiles
OriginalPaper 18 December 1999 Article: 301
High Spatial Resolution X-Ray Microanalysis of Radiation-Induced Segregation in Proton-Irradiated Stainless Steels
E. A. Kenik
J. T. Busby
G. S. Was
OriginalPaper 18 December 1999 Article: 295
Combined HRTEM and EFTEM Study of Precipitates in Tungsten and Chromium-Containing TiB₂
W. Mader
B. Freitag
C. Schmalzried
OriginalPaper 18 December 1999 Article: 289
Quantitative Mapping of Concentrations and Bonding States by Energy Filtering TEM
J. Mayer
J. M. Plitzko
OriginalPaper 18 December 1999 Article: 279
Structure Refinement of S-Phase Precipitates in Al-Cu-Mg Alloys by Quantitative HRTEM
R. Kilaas
V. Radmilovic
U. Dahmen
OriginalPaper 18 December 1999 Article: 273
On-Particle EDS Analysis of Bimetallic, Carbon-Supported Catalysts
Deborah L. Boxall
Edward A. Kenik
Charles M. Lukehart
OriginalPaper 01 January 2001 Article: 265
High-Resolution Scanning Electron Microscopy and Microanalysis of Supported Metal Catalysts
Jingyue Liu
OriginalPaper 18 December 1999 Article: 259
Analytical High Resolution TEM Study of Au/TiO₂ Catalysts
T. Akita
K. Tanaka
M. Haruta
OriginalPaper 18 December 1999 Article: 253
Ion-Implanted Amorphous Silicon Studied by Variable Coherence TEM
J-Y. Cheng
J. M. Gibson
D. C. Jacobson
OriginalPaper 18 December 1999 Article: 247
Theoretical Explanation of Pt Trimers Observed by Z-Contrast STEM
Karl Sohlberg
Sokrates T. Pantelides
Stephen J. Pennycook
OriginalPaper 18 December 1999 Article: 241
Epitaxy and Atomic Structure Determination of Au/Tio₂ Interfaces by Combined EBSD and HRTEM
F. Cosandey
P. Stadelmann
OriginalPaper 18 December 1999 Article: 235
Nanocrystal Thickness Information from Z-Stem: 3-D Imaging in One Shot
A. V. Kadavanich
T. Kippeny
S. J. Pennycook
OriginalPaper 18 December 1999 Article: 229
Electron Microscopy of Single Molecules
D. E. Luzzi
B. W. Smith
OriginalPaper 18 December 1999 Article: 223
A New Approach Towards Property Nanomeasurements Using In Situ TEM
Z. L. Wang
P. Poncharal
R. P. Gao
OriginalPaper 18 December 1999 Article: 217
Imaging Heterophase Molecular Materials in the Environmental SEM
B. L. Thiel
A. M. Donald
N. Stelmashenko
OriginalPaper 18 December 1999 Article: 211
Relationship Between Structure and Luminescent Properties of Epitaxial Grown Y₂O₃:Eu Thin Films on LaAlO₃ Substrates
H-J. Gao
G. Duscher
R. K. Singh
OriginalPaper 18 December 1999 Article: 203
Interface Structure and Zn Diffusion in the CdTe/ZnTe/Si System Grown by MBE
S.-C. Y. Tsen
David J. Smith
S. Sivananthan
OriginalPaper 18 December 1999 Article: 197
The Atomic Structure of Mosaïc Grain Boundary Dislocations in GaN Epitaxial Layers
P. Ruterana
V. Potin
R.C. Pond
OriginalPaper 18 December 1999 Article: 191
Incoherent High-Resolution Z-Contrast Imaging of Silicon and Gallium Arsenide Using Haadf-Stem
Y. Kotaka
T. Yamazaki
K. Watanabe
OriginalPaper 18 December 1999 Article: 185
In-situ Annealing Transmission Electron Microscopy Study of Pd/Ge/Pd/GaAs Interfacial Reactions
F. Radulescu
J. M. Mccarthy
E. A. Stach
OriginalPaper 18 December 1999 Article: 179
Atomic-Scale Imaging of Dopant Atom Distributions within Silicon δ-Doped Layers
R. Vanfleet
D. A. Muller
J. Silcox
OriginalPaper 18 December 1999 Article: 173
Energy-Loss Filtered Imaging of Segregation-Induced Interface Broadening in SiGe/Si P-Channel MOSFET Device Structures
D. J. Norris
A. G. Cullis
E. H. C. Parker
OriginalPaper 18 December 1999 Article: 167
Microdiffraction, EDS, and HREM investigation for phase identification with the electron microscope.
P. Ruterana
A. Redjaïmia
OriginalPaper 18 December 1999 Article: 161
Experimental Methods and Data Analysis for Fluctuation Microscopy
P. M. Voyles
M. M. J. Treacy
J. R. Abelson
OriginalPaper 18 December 1999 Article: 155
Microcharacterization of Heterogeneous Specimens Containing Tire Dust
Marina Camatini
Gaia M Corbetta
Changmo Sung
OriginalPaper 18 December 1999 Article: 147
Environmental Scanning Electron Microscopy as Tool to Study Shrinkage Microcracks in Cement-Based Materials
J. Bisschop
J. G. M. Van Mier
OriginalPaper 18 December 1999 Article: 141
In situ Study of Zirconia Stabilization by Anion Exchange (N for O) Using High Temperature, Controlled Atmosphere Electron Diffraction
Renu Sharma
Eberhard Schweda
Dirk Naedele
OriginalPaper 18 December 1999 Article: 135
Electron Channeling X-Ray Microanalysis for Cation Configuration in Irradiated Magnesium Aluminate Spinel
S. Matsumura
T. Soeda
C. Kinoshita
OriginalPaper 18 December 1999 Article: 129
Site Occupancy Determination by Alchemi of Nb and Cr in γ-TiAl and their Effects on the α to γ Massive Phase Transformation
T. M. Miller
L. Wang
I. M. Anderson
OriginalPaper 18 December 1999 Article: 123
In-Situ Observation of Melting and Solidification
H. Saka
S. Arai
S. Tsuktmoto
OriginalPaper 18 December 1999 Article: 117
Specimen Current Imaging of Delamtnation in Ceramic Films on Metal Substrates in the SEM
S. Rangarajan
A. H. King
OriginalPaper 18 December 1999 Article: 111
An Electron Microscope Study of Diffusion Assisted Dislocation Processes in Intermetallic Gamma TiAl
F. Appel
U. Lorenz
M. Oehrtng
OriginalPaper 18 December 1999 Article: 105
Determination of Coherency Strain Fields Around Coherent Particles in Ni-Al Alloys by HREM and CBED
H. A. Calderon
L. Calzado
R. Kilaas
OriginalPaper 18 December 1999 Article: 99
High Sensitivity Convergent Beam Electron Diffraction for the Determination of the Tetragonal Distortion of Epitaxial Films
C. Schuer
M. Leichtt
H. P. Strunk
OriginalPaper 18 December 1999 Article: 93
X-Ray Elemental Mapping of Multi-Component Steels.
Adam J. Papworth
David B. Williams
OriginalPaper 18 December 1999 Article: 87