Low Dielectric Constant Materials for IC Intermetal Dielectric Applications: A Status Report on the Leading Candidates Neil H. Hendricks OriginalPaper 15 February 2011 Pages: 3 - 14
A Study Of Anisotropy Of Spin Cast And Vapor Deposited Polyimide Films Using Internal Reflection Techniques Vladimir LibermanVincent MalbaAnthony F. Bernhardt OriginalPaper 15 February 2011 Pages: 15 - 20
Parylene AF-4: A Low εR Material Candidate For ULSI Multilevel Interconnect Applications A. S. HarrusM. A. PlanoJ. Kelly OriginalPaper 15 February 2011 Pages: 21 - 33
Interconnect Process Technology Using Perfluorocyclobutane (PFCB) P. H. TownsendE. O. ShafferM. J. Radler OriginalPaper 15 February 2011 Pages: 35 - 40
Fluorocarbon Films from Plasma Polymerization of Hexafluoropropylene and Hydrogen T. W. MountsierD. Kumar OriginalPaper 15 February 2011 Pages: 41 - 46
Toughened, Inorganic-Organic Hybrid Materials for Microelectronic Application J. L. HedrickS. SrinivasanJ. Hummel OriginalPaper 15 February 2011 Pages: 47 - 58
Fluorinated Heteroaromatic Polyethers for Low Dielectric Constant/High Temperature Applications G. MaierJ. M. SchneiderR. Hecht OriginalPaper 15 February 2011 Pages: 59 - 70
Thermal Curing Conditions for Low K-Fluorinated Polyimide Film for Use as the Interlayer Dielectric in ULSI Y. K. LeeS. P. MurarkaB. Auman OriginalPaper 15 February 2011 Pages: 71 - 77
Mechanical and Dielectric Properties of Low Permittivity Dielectric Materials A. AlptekinG. CzeremuszkinM. DiRenzo OriginalPaper 15 February 2011 Pages: 79 - 84
Evaluation of PTFE Nanoemulsion as a Low Dielectric Constant Material ILD S. C. SunY. C. ChiangH. Wu OriginalPaper 15 February 2011 Pages: 85 - 90
Nanoporous Silica for Low k Dielectrics Teresa RamosKevin RoderickDouglas M. Smith OriginalPaper 15 February 2011 Pages: 91 - 98
Deposition and Characterization of Porous Silica Xerogel Films Changming JinScott ListAlok Maskara OriginalPaper 15 February 2011 Pages: 99 - 104
Low K Mesoporous Silica Films Through Template-Based Processing P. J. BruinsmaN. J. HessS. Baskaran OriginalPaper 15 February 2011 Pages: 105 - 110
Chemical Bonding of Fluorine Atoms in Siof Alloys: Microscopic Mechanisms for Reductions in the Dielectric Constant Relative to SiO2 G. LucovskyH. Yang OriginalPaper 15 February 2011 Pages: 111 - 118
The Thermal Stability of Fluorine Doped Silicon Oxide Films Formed by Ecrcvd With SiF4 and O2 Gases Seoghyeong LeeJae-Yoon YooJong-Wan Park OriginalPaper 15 February 2011 Pages: 119 - 125
Characterization of PECVD Deposited Fluorosilicate Glass (FSG) After CMP and Cleaning D. MordoI. GoswamiB. Withers OriginalPaper 15 February 2011 Pages: 127 - 135
PE-CVD of F-Doped SiO2 Thin Films Using Tetraisocyanatesilane and Tetrafluorosilane T. ShirafujiM. SawadaS. Nishino OriginalPaper 15 February 2011 Pages: 137 - 142
Effect of Fluorine Addition to Plasma-Enhanced Chemical Vapor Deposition Silicon Oxide Film S. W. LimM. MiyataH. Komiyama OriginalPaper 15 February 2011 Pages: 143 - 148
Thermal Stability of Fluorinated SiO2 Films: Effects of Hydration and Film-Substrate Interaction J. P. SullivanD. R. DenisonA. G. Baca OriginalPaper 15 February 2011 Pages: 149 - 154
Diamondlike Carbon Materials as Low-k Dielectrics for Multilevel Interconnects in Ulsi A. GrillV. PatelJ. R. Paraszczak OriginalPaper 15 February 2011 Pages: 155 - 164
Fluorinated Amorphous Carbon Thin Films Grown from C4F8 for Multilevel Interconnections of Integrated Circuits Kazuhiko EndoTorn TatsumiTadahiko Horiuchi OriginalPaper 15 February 2011 Pages: 165 - 170
Poly(Arylene Ethers) as Low Dielectric Constant Materials for ULSI Interconnect Applications Raymond N. VrtisKelly A. HeapLloyd M. Robeson OriginalPaper 15 February 2011 Pages: 171 - 176
Comparison of Three Low Dielectric Constant Organic Polymers C. B. CaseC. J. CaseR. Liu OriginalPaper 15 February 2011 Pages: 177 - 182
Optimization of AICu Wiring Delay in Advanced CMOS Technology A. K. StamperV. McGahayL. A. Serianni OriginalPaper 15 February 2011 Pages: 183 - 188
Preliminary Electrical Characterization of Pulsed-Plasma Enhanced Chemical Vapor Deposited Teflon-like Thin Films Catherine B. LabelleScott J. LimbJames A. Burns OriginalPaper 15 February 2011 Pages: 189 - 194
Influence of the Cure Process on the Properties of Hydrogen Silsesquioxane Spin-On-Glass D. TöbbenP. WeigandS. A. Cohen OriginalPaper 15 February 2011 Pages: 195 - 200