Volume 41, Issue 1

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December 1984

Symposium K — Advanced Photon and Particle Techniques for the Characterization of Defects in Solids

Issue Editors:

R.W. Carpenter,
J.B. Roberto,
M.C. Wittels

54 articles in this issue

Instrumental Limitations and Current Prospects for Materials Research with the Latest Generation of High-Resolution Electron Microscopes
David J. Smith
OriginalPaper 25 February 2011 Pages: 3 - 12
Recent Advances in Huang Diffuse Scattering
P. Ehrhart
OriginalPaper 25 February 2011 Pages: 13 - 23
Thermal Annealing of Vacancy and Interstitial Loops in Ion Irradiated Copper*
B. C. Larson
T. S. Noggle
J. F. Barhorst
OriginalPaper 25 February 2011 Pages: 25 - 30
Local Distortions Around Highly Mobile Defects
H. Dosch
J. Peisl
OriginalPaper 25 February 2011 Pages: 31 - 34
Perturbed Angular Correlation Measurements of Vacancy Trapping at Indium Atoms in Quenched Aluminum
M. L. Swanson
T. H. Wichert
O. M. Westcott
OriginalPaper 25 February 2011 Pages: 35 - 38
Unusual Scattering Intensities Due to Nitrogen in Niobium
H. Dosch
J. Peisl
OriginalPaper 25 February 2011 Pages: 39 - 42
The Effect of Temperature on Defect Production in Copper Doped with Beryllium
A. C. Baily
Wayne E. King
M. Meshii
OriginalPaper 25 February 2011 Pages: 43 - 48
Characterization of Atomic Defects and Their Aggregates Using Positron Annihilation Spectroscopy
R. W. Siegel
M. J. Fluss
L. C. Smedskjaer
OriginalPaper 25 February 2011 Pages: 49 - 56
Positron Annihilation Studies of Vacancy Formation in Tungsten, Chromium, and Niobium
L. C. Smedskjaer
G. D. Loper
R. W. Siegel
OriginalPaper 25 February 2011 Pages: 57 - 62
On the Resolvability of Defect Ensembles with Positron Annihilation Studies
M. J. Fluss
R. H. Howell
P. Meyer
OriginalPaper 25 February 2011 Pages: 63 - 69
Applications of Neutron Scattering to Problems in Materials Science
J. R. Weertman
OriginalPaper 25 February 2011 Pages: 73 - 82
Investigation of the Homogeneity and Defect Structure in Semi-Insulating Lec GaAs Single Crystals by Synchrotron Radiation Double Crystal X-Ray Topography.
S. J. Barnett
B. K. Tanner
G. T. Brown
OriginalPaper 25 February 2011 Pages: 83 - 88
Small Angle X-Ray Scattering (Saxs) Study of Coarsening Kinetics in an Aluminum-Lithium Alloy*
Stephen Spooner
OriginalPaper 25 February 2011 Pages: 89 - 94
Study of the Dynamic Behavior of Dislocations During the Melt Growth Process of Tin Crystal by Synchrotron X-Ray Topography
Osamu Nittono
Taro Ogawa
Sigemaro Nagakura
OriginalPaper 25 February 2011 Pages: 95 - 100
Synchrotron Section Topographic Study of the Denuded Zone Formation in Annealed Silicon
T. Tuomi
M. Tilli
O. Anttila
OriginalPaper 25 February 2011 Pages: 101 - 106
Recent Applications of Neutron Small Angle Scattering
G. Kostorz
OriginalPaper 25 February 2011 Pages: 107 - 112
A Raman Scattering Study of the Temperature Dependence of Boroxol Ring Clusters in B₂ O₃-GeO₂ and B₂ O₃-GeO₂-SiO₂ Glasses.
I. N. Chakraborty
R. A. Condrate Sr.
OriginalPaper 25 February 2011 Pages: 113 - 118
Surface Characterization by Reflection Electron Microscopy (REM)
Tung Hsu
J. M. Cowley
OriginalPaper 25 February 2011 Pages: 121 - 127
Direct Imaging of Atomic Rearrangements on Extended Gold Surfaces
David J. Smith
L. D. Marks
OriginalPaper 25 February 2011 Pages: 129 - 136
Surface Steps on α-Alumina Films
K. J. Morrissey
C. B. Carter
OriginalPaper 25 February 2011 Pages: 137 - 142
Adsorption and Ordering of Oxygen on Cu(110)*
G. R. Gruzalski
D. M. Zehner
J. F. Wendelken
OriginalPaper 25 February 2011 Pages: 143 - 148
The Effect of Adsorbeb Oxygen Ions on the Inelastic Scattering of Photo-Electrons at the Metal-Vacuum Interface
W. Pong
D. Brandt
W. Imaino
OriginalPaper 25 February 2011 Pages: 149 - 154
Studies of Planar Defects in Silver Plate-Like Crystals by CBED and Hrtem Techniques
N. Tanaka
J. M. Cowley
OriginalPaper 25 February 2011 Pages: 155 - 160
X-Ray Diffraction Applied to the Study of Defects in Surfaces
I. K. Robinson
K. L. D’amico
OriginalPaper 25 February 2011 Pages: 161 - 170
Characterization of Surface Defect Structure by Low Energy Electron Diffraction*
J. F. Wendelken
G.-C. Wang
T. -M. Lu
OriginalPaper 25 February 2011 Pages: 171 - 177
Analysis of Domain-Size Distributions in Epitaxial Growth Using Leed Angular Profiles
D. Saloner
M. G. Lagally
OriginalPaper 25 February 2011 Pages: 179 - 185
Growth of thin Pb Layers on Cu(001)*
R. J. Culbertson
Y. Kuk
L. C. Feldman
OriginalPaper 25 February 2011 Pages: 187 - 191
Diffraction Studies of the Atomic Structure of Grain Boundaries
K. R. Milkove
P. A. Lamarre
S. L. Sass
OriginalPaper 25 February 2011 Pages: 195 - 206
Grain Boundary Structural Transformations Induced by Solute Segregation
K. Sickafus
S. L. Sass
OriginalPaper 25 February 2011 Pages: 207 - 212
Grain Boundaries in NiO
Karl L. Merkle
J. F. Reddy
C. L. Wiley
OriginalPaper 25 February 2011 Pages: 213 - 219
Analysis of the Structure of Grain Boundaries Normal to the Boundary Plane Using Diffraction Techniques
M. D. Vaudin
F. Schmückle
S. L. Sass
OriginalPaper 25 February 2011 Pages: 221 - 226
Microanalytical Tem Studies of Ceramic Materials
Ewald Bischoff
Manfred Rühle
OriginalPaper 25 February 2011 Pages: 227 - 239
In Situ Hvem Studies of Electron-Beam-Driven Composition Changes in Thin Film Alloys: Displacement-Rate Gradient Effects*
P. R. Okamoto
N. Q. Lam
OriginalPaper 25 February 2011 Pages: 241 - 246
Stem Probe Spreading
L. D. Marks
OriginalPaper 25 February 2011 Pages: 247 - 252
Characterization of Tilt Boundaries by Ultra High Resolution Electron Microscopy
W. Krakow
J. T. Wetzel
G. Trafas
OriginalPaper 25 February 2011 Pages: 253 - 260
Structural Changes of a σ = 51 Tilt Boundary in Germanium During High Temperature Creep
W. Skrotski
H. Wendt
D. L. Kohlstedt
OriginalPaper 25 February 2011 Pages: 261 - 266
Characterization of Defects and Interfaces by the Ion Channeling Technique
W. K. Chu
S. T. Picraux
OriginalPaper 25 February 2011 Pages: 269 - 274
Local Atomic Structure and Electrical Activity of Arsenic Implanted in Silicon
A. Erbil
G. S. Cargill III
R. F. Boehme
OriginalPaper 25 February 2011 Pages: 275 - 280
Exafs Studies of Ion Implanted Bismuth
E. M. Kunoff
M. S. Dresselhaus
Y. H. Kao
OriginalPaper 25 February 2011 Pages: 281 - 286
High Resolution Z-Contrast Imaging and Lattice Location Analysis of Dopants in Ion-Implanted Silicon
S. J. Pennycook
J. Narayan
P. E. Batson
OriginalPaper 25 February 2011 Pages: 287 - 294
The Use of Ion Channeling Axial Scans in the Study of Ion-Implanted Al₂O₃
G. C. Farlow
C. W. White
C. J. McHargue
OriginalPaper 25 February 2011 Pages: 295 - 299
Exafs Studies of Defects in β-Alumina Superionic Conductors
W. L. Roth
R. Wong
OriginalPaper 25 February 2011 Pages: 301 - 306
Damage Nucleation in Si During Ion Irradiation
O. W. Holland
D. Fathy
J. Narayan
OriginalPaper 25 February 2011 Pages: 307 - 312
Rutherford Backscattering and Channeling Studies of Laser Annealed, Nitrogen Implanted and Non-Implanted Single Crystal Austenitic Stainless Steel.
J. L. Whitton
T. Laursen
M. L. Swanson
OriginalPaper 25 February 2011 Pages: 313 - 318
An HVEM Investigation of In-Situ, Self-Ion Damage in Iron at 40 and 300 K*
M. A. Kirk
I. M. Robertson
A. Philippides
OriginalPaper 25 February 2011 Pages: 319 - 324
Fim/Iap/Tem Studies of Ion Implanted Nickel Emitters
S. D. Walck
J. J. Hren
OriginalPaper 25 February 2011 Pages: 325 - 330
Factors Affecting Spatial Resolution for Compositional Analysis in Stem
John B. Vander Sande
Anthony J. Garratt-Reed
OriginalPaper 25 February 2011 Pages: 333 - 342
Electronic and Chemical Analysis of a Metal-Insulator Interface Utilizing Transmission Electron Energy Loss Spectroscopy at 5Å Spatial Resolution
Michael Scheinfein
Michael Isaacson
OriginalPaper 25 February 2011 Pages: 343 - 348
VUV Synchrotron Light as a Technique for Studying the Interface Quality and Properties of Thin Overlayers
M. W. Ruckman
V. Murgai
Myron Strongin
OriginalPaper 25 February 2011 Pages: 349 - 354
Characterization of Epitaxial CoSi₂ Films Grown on <111> Si
A. H. Hamdi
M-A. Nicolet
K. L. Wang
OriginalPaper 25 February 2011 Pages: 355 - 361

Volume 41, Issue 1

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