Volume 375, Issue 1

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December 1994

Symposia AA — Applications of Synchrotron Radiation Techniques to Materials Science

Issue Editors:

K. L. d’Amico,
G. E. Ice,
D. L. Perry,
N. D. Shinn,
L. J. Terminello

49 articles in this issue

A Real-time X-ray Scattering Study of Sputtering Growth of TiN Films
J. H. Jel
D. Y. Noh
K. S. Liang
Articles 15 February 2011 Pages: 3 - 7
A Quantitative Crystallization Study of Thin Amorphous Fe₈₀B₂₀ Films Via Empirical Modeling of Exafs Data
V. G. Harris
S. A. Oliver
N. C. Koon
Articles 15 February 2011 Pages: 9 - 13
Resonant Soft X-Ray Fluorescence Studies of Novel Materials
J. A. Carlisle
E. L. Shirley
R. C. C. Perera
Articles 15 February 2011 Pages: 15 - 20
Exafs Studies and Simulations of Local Anisotropy in CO₇₈CR₂₂ Films
K. M. Kemner
V. G. Harris
J. C. Lodder
Articles 15 February 2011 Pages: 21 - 26
Investigation of Local Structures Around Mn Atoms in In_1-xMn_xAs Diluted Magnetic Semiconductors Using Exafs
Y. L. Soo
S. W. Huang
L. L. Chang
Articles 15 February 2011 Pages: 27 - 32
Extended X-Ray Absorption Fine Structure Studies of MnZn-Ferrite Films
Paul C. Dorsey
Vincent G. Harris
Norman C. Koon
Articles 15 February 2011 Pages: 33 - 38
Densification of Sio Gel Films by Synchrotron Radiation and its Dependence on Photon Energy
Hiroaki Imai
Koichi Awazu
Hideo Onuki
Articles 15 February 2011 Pages: 39 - 43
Electron Transport and Photoemission Studies of Amorphous CaAl Thin Films
Simon A. Morton
D. Greig
D. Norman
Articles 15 February 2011 Pages: 45 - 50
In-Situ Observation of Chemical Vapor Deposition of Thin Sige Films by Optical Reflection Interferometry
G. Ritter
B. Tillack
B. Hertel
Articles 15 February 2011 Pages: 51 - 56
Magnetic Structure of Multilayers from Soft-X-Ray Magnetic Circular Dichroism
C. T. Chen
Y. U. Idzerda
G. Meigs
Articles 15 February 2011 Pages: 59 - 70
Magnetic X-Ray Circular Dichroism in Nickel-Gold Multilayers
A. F. Jankowski
G. D. Waddill
J. G. Tobin
Articles 15 February 2011 Pages: 71 - 76
Effects of Ferromagnetic Capping Layers on the Perpendicular Anisotropy of Ni/Cu(001) Films.
W. L. O’Brien
B. P. Tonner
Articles 15 February 2011 Pages: 77 - 80
The Paramagnetic Correlation Length of Mn Thin Films
D. N. MclLroy
P. A. Dowben
Articles 15 February 2011 Pages: 81 - 86
Magnetic and Structural Properties of Fe/Pd Multilayers Studied by Magnetic X-Ray Dichroism and X-Ray Absorption Spectroscopy
S. M. Mini
Eric E. Fullerton
S. Pizzini
Articles 15 February 2011 Pages: 87 - 93
Element Specific Vector Magnetometry (Esvm) Via Soft X-Ray Magnetic Circular Dichroism
V. Chakarian
H. J. Lin
C. T. Chen
Articles 15 February 2011 Pages: 95 - 100
Magnetic X-Ray Circular Dichroism in Spin-Polarized Photoelectron Diffraction
G. D. Waddill
J. G. Tobin
S. Y. Tong
Articles 15 February 2011 Pages: 101 - 104
Linear and Circular Dichroism in Angle Resolved Fe 3p Photoemission
E. Tamura
G. D. Waddill
P. A. Sterne
Articles 15 February 2011 Pages: 105 - 110
X-Ray Absorption Spectroscopy from H-Passivated Porous Si and Oxidized Si Nanocrystals
S. Schuppler
S. L. Friedman
P. H. Citrin
Articles 15 February 2011 Pages: 113 - 120
Analysis of the Dimerized Sb/Si(001)-(2×l) Surface by X Ray Standing Waves
P. F. Lyman
Y. Qian
M. J. Bedzyk
Articles 15 February 2011 Pages: 121 - 126
Applications of Sxps for Studying Surface Structure, Reaction Mechanisms and Kinetics
D. R. Mullins
D. R. Huntley
S. H. Overbury
Articles 15 February 2011 Pages: 127 - 132
Defects in Quasi-One Dimensional Oxide Conductors: K_0.3MoO₃
Kevin E. Smith
Klaus Breuer
Steve L. Hulbert
Articles 15 February 2011 Pages: 133 - 144
Surface Core-Level Photoelectron Diffraction of Surface Reconstructions
Eli Rotenberg
J. D. Denlinger
B. P. Tonner
Articles 15 February 2011 Pages: 145 - 150
Modeling Valence-Band Images from Synchrotron-Radiation Studies Using Display Analyzers: Lithium Fluoride and Graphite
Eric L. Shirley
Louis J. Terminello
F. J. Himpsel
Articles 15 February 2011 Pages: 151 - 156
Luminescence Spectroscopy on Individual Nanostructures and Impurity Atoms Using Stm and Sem
Lars Samuelson
Anders Gustafsson
Mats-Erik Pistol
Articles 15 February 2011 Pages: 157 - 168
X-Ray Scattering Studies of Interfacial Microstructures in In_x, Ga_1−x As/GaAs Superlattices
Z. H. Ming
Y. L. Soo
C. Choi-Feng
Articles 15 February 2011 Pages: 171 - 176
Ge δ-Layers on Si(111) and Si(001) Grown by MBE and SPE
J. Falta
T. Gog
M. Horn-Von Hoegen
Articles 15 February 2011 Pages: 177 - 180
Synchrotron X-ray Scattering Studies at Mineral-Water Interfaces
Ronald P. Chiarello
Neil C. Sturchio
Articles 15 February 2011 Pages: 181 - 186
The Structure and Phases of a Relaxed Langmuir Monolayer of Methyl Eicosanoate as Determined by Grazing Incidence Xray Diffraction and Brewster Angle Microscopy
W. J. Foster
M. C. Shih
P. S. Pershan
Articles 15 February 2011 Pages: 187 - 192
Light Scattering Study of the Evolution of the Surface Morphology During Growth of Ingaas on GaAs
C. Lavoie
B. Haveman
J. Bechhoefer
Articles 15 February 2011 Pages: 193 - 198
High-Resolution X-Ray Diffraction Measurements of SiGe/Si Structures
J. L. Jordan-Sweet
P. M. Mooney
G. B. Stephenson
Articles 15 February 2011 Pages: 201 - 206
Exafs Study of Co/Cu Multilayers: Mbe Versus Sputtered
C. L. Foiles
M. R. Franklin
T. I. Morrison
Articles 15 February 2011 Pages: 207 - 212
Static Displacements of Atoms in Crystalline Metallic Solid Solutions
Cullie Sparks
Gene Ice
Paul Zschack
Articles 15 February 2011 Pages: 213 - 220
Magnetic Compton Scattering Studies of the Invar Effect in Fe₃Pt
C. J. Yahnke
G. Srajer
L. Assoufid
Articles 15 February 2011 Pages: 221 - 227
Acid-Site Characterization of Water-Oxidized Alumina Films by Near-Edge X-Ray Absorption and Soft X-Ray Photoemission
P. J. O’hagan
R. P. Merrill
A. W. Chester
Articles 15 February 2011 Pages: 229 - 234
X-Ray Absorption Studies of Uranium Sorption on Mineral Substrates
Eric A. Hudson
Louis J. Terminello
Norman M. Edelstein
Articles 15 February 2011 Pages: 235 - 240
Correlation of Xanes Features with the Scintillation Efficiencies of Ce Doped Alkaline Earth Lithium Silicate Glasses
D. L. Blanchard
D. S. Sunberg
M. J. Weber
Articles 15 February 2011 Pages: 241 - 246
Strain Measurements and Laue Diffraction with Microbeams
P. C. Wang
G. S. Cargill III
I. C. Noyan
Articles 15 February 2011 Pages: 247 - 252
In-Situ X-Ray Diffraction and Resistivity Analysis of CoSi₂ Phase Formation with and without a Ti Interlayer at Rapid Thermal Annealing Rates
C. Cabral Jr.
L. A. Clevenger
K. F. Ludwig Jr.
Articles 15 February 2011 Pages: 253 - 258
High Resolution Diffraction Imaging of Mercuric Iodide: Demonstration of the Necessity for Alternate Crystal Processing Techniques for Highly Purified Material
Bruce Steiner
Lodewijk Van Den Berg
Uri Laor
Articles 15 February 2011 Pages: 259 - 264
Recovery of SRO Parameters and Pairwise Atomic Displacements in a Fe _46.5Ni _53.5 Alloy
X. Jiang
G. E. Ice
P. Zschack
Articles 15 February 2011 Pages: 267 - 273
High Resolution Synchrotron X-Ray Diffraction Tomography of Polycrystalline Samples
S. R. Stock
A. Guvenilir
Z. U. Rek
Articles 15 February 2011 Pages: 275 - 280
Synchrotron White Beam Topography Studies of Screw Dislocations in 6H-Sic Single Crystals
S. Wang
M. Dudley
C. Fazi
Articles 15 February 2011 Pages: 281 - 286
Dislocation Mobility in HCL-Doped Ice
Xiaohong Hu
Kunlun Jia
David Black
Articles 15 February 2011 Pages: 287 - 292
X-ray Microscopy of Polymeric Materials
H. Adel
B. Hsiao
R. Cieslinski
Articles 15 February 2011 Pages: 293 - 302
Applications of the Xia Scanning Photoemission Spectromicroscope for Element Identification on Material Surfaces
Cheng-Hao Ko
Janos Kirz
Erik Anderson
Articles 15 February 2011 Pages: 303 - 305
Studies of Calcium-Nickel-Potassium Oxide Films by Synchrotron X-Ray Fluorescence Microscopy
D. L. Perry
A. C. Thompson
X. L. Mao
Articles 15 February 2011 Pages: 307 - 311
Characterization of Defect Structures in Lely 6H-SiC Single Crystals Using Synchrotron White Beam X-Ray Topography
W. Huang
S. Wang
C. Fazi
Articles 15 February 2011 Pages: 313 - 318
A New Method to Characterize Dislocation Loops
Fuping Liu
Ian Baker
Michael Dudley
Articles 15 February 2011 Pages: 319 - 325
Computer Aided Synchrotron White Beam X-Ray Topographic Analysis of Multipolytype SiC Device Configurations
W. Huang
S. Wang
C. Fazi
Articles 15 February 2011 Pages: 327 - 332

Volume 375, Issue 1

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