Stress and its Effect on Intermixing in Si1−xGex/Si Superlattices S. M. Prokes OriginalPaper 21 February 2011 Pages: 3 - 14
Pressure-Enhanced Interdiffusion in Amorphous Si/Ge Multilayers: Implications for Defect-Mediated Diffusion Steven D. TheissF. SpaepenM. J. Aziz OriginalPaper 21 February 2011 Pages: 15 - 20
Modelling and Measurements of Stress-Controlled Interdiffusion in Multilayered Amorphous Alloys F. L. YangW. C. ShihA. L. Greer OriginalPaper 21 February 2011 Pages: 21 - 26
Mechanical Stresses During Solid State Amorphization of Zr/Co Multilayers M. MoskeK. Samwer OriginalPaper 21 February 2011 Pages: 27 - 32
A Numerical Study of Stress Controlled Surface Diffusion During Epitaxial Film Growth Chiu-Hsin ChengHuajian Gao OriginalPaper 21 February 2011 Pages: 33 - 44
Three Dimensional Surface Waviness of an Epitaxial Layer Due to Surface Diffusion Induced by Interface Misfit Dislocations F. Jonsdottir OriginalPaper 21 February 2011 Pages: 45 - 50
Strained Layer Epitaxy: A Microscopic Description of Stress Driven Surface Diffusion I. LefebvreC. PriesterM. Lannoo OriginalPaper 21 February 2011 Pages: 51 - 55
Relationship Between Stress and Surface Roughness in Krypton Implanted MgO Laurence GeaLoubet-Luc JeanPaul Thevenard OriginalPaper 21 February 2011 Pages: 57 - 62
Instability Analysis of Strained Interfaces Via a Discrete Atom Method Jong K. Lee OriginalPaper 21 February 2011 Pages: 63 - 68
Stress Evolution Kinetics in Ultra Thin Sputtered Au Films Quanmin SuCecile BaillyKarl Sieradzki OriginalPaper 21 February 2011 Pages: 69 - 74
A TEM Investigation of the Effects of Tensile Stress on Thin Film Microstructure and Surface Morphology Karen E. HarrisAlexander H. King OriginalPaper 21 February 2011 Pages: 75 - 80
Effect of Stresses in Thin Films on Defect Nucleation A. S. Nandedkar OriginalPaper 21 February 2011 Pages: 81 - 86
Nonhydrostatic Stress Effects on Solid Phase Epitaxial Growth in Silicon William B. CarterMichael J. Aziz OriginalPaper 21 February 2011 Pages: 87 - 92
Dislocation Emission at Surfaces G. E. BeltzL. B. Freund OriginalPaper 21 February 2011 Pages: 93 - 98
Manipulation of Stresses in Metallic Thin Films by Alloying A. S. Nandedkar OriginalPaper 21 February 2011 Pages: 99 - 104
Relationship Between Crystal Structure, Internal Stress and Properties in the Naturally Occurring Supportless Thin Films of Chrysotile Asbestos Georges DenesR. Le Van MaoA. Vaillancourt OriginalPaper 21 February 2011 Pages: 105 - 110
Computer Simulation of Creation and Motion of Edge Dislocations in Face Centered Crystals N. TajimaT. NozakiMasao Doyama OriginalPaper 21 February 2011 Pages: 111 - 116
Aspects of the Mechanical Properties of Electrodeposits Rolf Weil OriginalPaper 21 February 2011 Pages: 119 - 130
Intrinsic Stress in Sputtered Thin Films Tai D. NguyenTue NguyenJames H. Underwood OriginalPaper 21 February 2011 Pages: 131 - 136
Dependence of Stress on Background Pressure in Sputtered Mo/Si Multilayer Films David L. WindtW. L. BrownW. K. Waskiewicz OriginalPaper 21 February 2011 Pages: 137 - 142
The Growth of Amorphous CuxTi1−x Films: Relationship between Intrinsic Stresses and Microstructure Observed by STM U. Von HülsenU. GeyerG. von Minnigerode OriginalPaper 21 February 2011 Pages: 143 - 148
W/Si Schottky Diodes: Effect of Metal Deposition Conditions on the Barrier Height M. MamorE. FinkmanK. Bouziane OriginalPaper 21 February 2011 Pages: 149 - 153
Properties of Ti1−xAlxN Deposited Using Dual Rotatable Magnetrons for Automotive Glass Privacy Coatings T. S. MorleyB. N. VyletelK. E. Nietering OriginalPaper 21 February 2011 Pages: 155 - 160
Amorphous SiC−N Coatings: Its Properties and Applications Andrew L. YeeHockchun OngR. P. H. Chang OriginalPaper 21 February 2011 Pages: 161 - 166
Stress Evolution During the Formation and Transformation of Titanium Silicide V. SvilanJ. M. E. HarperL. A. Clevengeri OriginalPaper 21 February 2011 Pages: 167 - 172
Underlayer Effects on the Growth Stress of Titanium Films M. PoppellerR. Abermann OriginalPaper 21 February 2011 Pages: 173 - 180
Growth, Structure and Stress of DC Magnetron Sputtered TiB2 Thin Films H. DengJ. ChenJ. A. Barnard OriginalPaper 21 February 2011 Pages: 181 - 186
Stress and Density of Thin TiO2 Films Produced by Different Methods C. R. OttermannM. HemingK. Bange OriginalPaper 21 February 2011 Pages: 187 - 193
Tunability of Intrinsic Stress in Siox Dielectric Films Formed by Molecular Beam Deposition Naresh ChandR. R. KolaW. T. Tsang OriginalPaper 21 February 2011 Pages: 195 - 200
Mechanical Properties of Alumina Films Sputtered Over Steps C. A. RossJ. J. Barrese OriginalPaper 21 February 2011 Pages: 201 - 207
Growth of Hydrogenated Amorphous Silicon (A−Si∶H) on Patterned Substrates for Increased Mechanical Stability Hong-Shick WanJ. C. DelgadoV. Perez-Mendez OriginalPaper 21 February 2011 Pages: 209 - 214
Elastic Properties of Silicate Glass and Spin-On Glass Thin Films L. DoucetG. Carlotti OriginalPaper 21 February 2011 Pages: 215 - 220
Temperature Dependence of the Intrinsic Stress and Biaxial Modulus of Plasma Deposited Silicon Nitride and Silicon Oxynitride Films David R. HardingLinus T. Ogbuji OriginalPaper 21 February 2011 Pages: 221 - 226
DC-Magnetron Sputtered Silicon Carbide M. TenhoverI. B. Ruppel OriginalPaper 21 February 2011 Pages: 227 - 232
Structure and Mechanical Properties of Nitrogen Incorporated Diamond-Like Carbon Films Lee-Ryeol KwangKwang Eun YongRhee-Seong Jae OriginalPaper 21 February 2011 Pages: 233 - 238
Potential Limitations of Conventional Photomasks Due to Inherent Internal Stress — The Need for an Alternative Opaque Layer James A. CairnsLiu-Wing ChiBrian Lawrenson OriginalPaper 21 February 2011 Pages: 239 - 244
Metallic thin Films on Ceramic Substrates: Stress-Enhanced Intermixing and Spinel Formation P. PirouzY. IkuharaC. P. Flynn OriginalPaper 21 February 2011 Pages: 247 - 258
Stacking Fault Tetrahedra Formation During Growth of Si1−xGex Strained Layers on (111) Oriented Si Substrates: Tem Observations and Defect Modeling David J. HowardAllan F. BowerDavid C. Paine OriginalPaper 21 February 2011 Pages: 259 - 264
Misfit Strain Relief Beyond the Critical Thickness Using Curvature Measurements and in Situ Characterization of the Magneto-Optic Kerr Effect H. E. InglefieldG. BochiC. V. Thompson OriginalPaper 21 February 2011 Pages: 265 - 270
Nanoindentation of Epitaxial Films: A Study of Pop-in Events A. B. MannJ. B. PethicaS. Tomiya OriginalPaper 21 February 2011 Pages: 271 - 276
Composition Dependence of Hardness and Moduli in GeSi/Si-Heterostructures Measured by Nanoindentation B. S. RoosH. RichterB. Tillack OriginalPaper 21 February 2011 Pages: 277 - 282
Role of Dislocation Interactions in Decreasing Mobile Threading Dislocation Density and Limiting Strain Relaxation in Si1−xGex Heteroepitaxial Films Veronique T. GillardWilliam D. Nix OriginalPaper 21 February 2011 Pages: 283 - 288
Emission of a Half-Rectangular Dislocation Loop from the Surface of a Compositionally Graded Epilayer Zhang-Yi Tong OriginalPaper 21 February 2011 Pages: 289 - 294
Lattice Properties of Ge and GaAs Strained-Layers on Si Resul EryigitZhifeng SuiIrving P. Herman OriginalPaper 21 February 2011 Pages: 295 - 300
Dislocation Distributions in Cd1−xHgxTe/CdTe and Cd1−xHgxTe/Cd1−yZnyTe Grown by Liquid Phase Epitaxy C. C. R. WatsonK. DuroseB. K. Tanner OriginalPaper 21 February 2011 Pages: 301 - 306
Plasma Potential Measurements and Strain Effects in Epitaxial GAN Grown on AlN Buffered Si(111) by Radio Frequency Reactive Sputtering W. J. MengT. A. Perry OriginalPaper 21 February 2011 Pages: 307 - 312
X-Ray Measurements of Deformations in Films and Substrates in Heteroepitaxial SYSTEM GaAs/Ge N. BurleB. PichaudO. Thomas OriginalPaper 21 February 2011 Pages: 313 - 318
A Study on the Strain and Microstructure in SiGe Film Grown on Si(001) Substrate by MBE Cho-Ik KyoungSahn NahmPark-Chong Sin OriginalPaper 21 February 2011 Pages: 319 - 324
Elastic Constant Effect on the Critical Thickness of an Epilayer Zhang-Yi Tong OriginalPaper 21 February 2011 Pages: 325 - 330
Microstructure and Strain in GaAs/AlGaAs MQW thin Films Bonded to Different Substrates by Eutectic Alloying C. H. LinH. C. KuoJ. M. Kuo OriginalPaper 21 February 2011 Pages: 331 - 336