Spatially Resolved Local Atomic Structure from Exelfs E. A. SternM. QianM. Sarikaya OriginalPaper 01 December 1994 Pages: 3 - 14
Cross-Sectional Scanning Tunneling Microscopy of III-V Semiconductor Structures R. M. FeenstraA. VaterlausT. C. McGill OriginalPaper 01 December 1994 Pages: 15 - 23
Challenges and Opportunities in Magnetic Resonance Force Microscopy John A. SidlesJoseph L. Garbini OriginalPaper 01 December 1994 Pages: 25 - 42
Trends in Atomic Resolution Electron Microscopy David J. SmithM. R. Mccartney OriginalPaper 01 December 1994 Pages: 43 - 52
Flux Line Dynamics with Electron Holography Akira Tonomura OriginalPaper 01 December 1994 Pages: 55 - 63
Analysis of Interface Dynamics in Solid-State Phase Transformations by In Situ Hot-Stage High-Resolution Transmission Electron Microscopy James M. HoweW. E. BensonY.-C. Chang OriginalPaper 01 December 1994 Pages: 65 - 77
Epitaxial Growth of Two-Dimensional Dichalcogenides and Modification of Their Surfaces with Scanning Probe Microscopes Bruce A. Parkinson OriginalPaper 01 December 1994 Pages: 79 - 85
Microstructural Imaging of Localized Chemical Reactions using Valence Photoelectrons S. LiangA. K. Ray-ChaudhuriF. Cerrina OriginalPaper 01 December 1994 Pages: 87 - 92
Microtribological Studies by Using Atomic Force and Friction Force Microscopy and its Applications Bharat BhushanVilas N. KoinkarJ. Ruan OriginalPaper 01 December 1994 Pages: 93 - 98
Molecular Dynamics Simulation of the Elastic Deformation of Nanometer Diameter Metal Clusters Dilip Y. PaithankarJulian TalbotRonald P. Andres OriginalPaper 01 December 1994 Pages: 99 - 104
A Thermal Stage for Nanoscale Structure Studies with the Scanning Force Microscope W. J. KulnisW. N. Unertl OriginalPaper 01 December 1994 Pages: 105 - 108
Dynamic Behaviour of Lead Nanoparticles in A Dielectric Matrix P. CheyssacR. KofmanA. Stella OriginalPaper 01 December 1994 Pages: 109 - 114
In-Situ Dynamic High-Resolution Transmission Electron Microscopy Investigation of Guest-Layer Behavior During Deintercalation of Mercury Titanium Disulfide M. McKelvyM. SidorovW. S. Glaunsinger OriginalPaper 01 December 1994 Pages: 115 - 120
In-Situ Observation of Oxide Monolayer Formation on Copper Solid-Liquid Interfaces John R. LagraffBrandon J. CruickshankAndrew A. Gewirth OriginalPaper 01 December 1994 Pages: 121 - 125
Application of High Spatial Resolution Electron Diffraction Techniques to the Study of Local Properties of Crystalline Solids J. W. SteedsX. F. DuanR. Vincent OriginalPaper 01 December 1994 Pages: 129 - 139
Holographic Atom Imaging from Experimental Photoelectron Angular Distribution Patterns L. J. TerminelloD. A. Lapiano-SmithD. A. Shirley OriginalPaper 01 December 1994 Pages: 141 - 149
A Cbed Procedure for Determining Local Residual Stresses from Nanoscale Areas in Cermets Gyeung Ho KimMehmet Sarikaya OriginalPaper 01 December 1994 Pages: 151 - 162
Electronic Structure and Bonding at Interfaces Between CVD Diamond and Silicon David A. MullerYujiun TzouJohn Silcox OriginalPaper 01 December 1994 Pages: 163 - 168
Quantitative Electronic Structure Analysis of α-AL203 Using Spatially Resolved Valence Electron Energy-Loss Spectra Haral MüllejansJ. BruleyP. A. Morris OriginalPaper 01 December 1994 Pages: 169 - 176
High Resolution Tem Applied to Nanoscale Structure Studies L. Beltran Del RioM. SarikayaA. Gomez OriginalPaper 01 December 1994 Pages: 177 - 182
Moire Patterns in High Resolution Electron Microscopy Images J. Reyes-GasgaS. TehuacaneroC. Zorrilla OriginalPaper 01 December 1994 Pages: 183 - 188
Nanostructures Detected by Conductvity Spectroscopy K. FunkeK. El-egiliC. Cramer OriginalPaper 01 December 1994 Pages: 189 - 194
Synthesis and Characterization of Structured Metal/Silica Clusters A. N. PatilN. OtsukaR. P. Andres OriginalPaper 01 December 1994 Pages: 195 - 199
Porous Silicon Luminescence Study by Imaging Methods: Relationship to Pore Dimensions Anna KontkiewiczAndrzej M. KontkiewiczTomasz Kowalewski OriginalPaper 01 December 1994 Pages: 201 - 206
Tem Studies on the Morphology, Size Distribution and Structure of Nanocrystalline Iron Particles Using a Formvar Embedded Preparation Technique Hengfei NiXiangxin BiJohn M. Stencel OriginalPaper 01 December 1994 Pages: 207 - 212
Composition and Strain Analysis of Semiconductor Heterostructures Using Thickness Fringes on Tem Images H. KakibayashiR. TsunetaF. Nagata OriginalPaper 01 December 1994 Pages: 213 - 218
Electron Holography of Flux Lattices in Niobium J. E. BonevichK. HaradaA. Tonomura OriginalPaper 01 December 1994 Pages: 219 - 224
Nanoindentation on Contamination-Free gold Films Using the Atomic Force Microscope D. M. SchaeferR. Reifenberger OriginalPaper 01 December 1994 Pages: 225 - 230
Observation and Measurement of Atomic Scale Imperfections in Materials Using CBED+EBI/H Rodney A. HerringJohn E. BonevichAkira Tonomura OriginalPaper 01 December 1994 Pages: 231 - 236
Imaging of Buried Si and Si:Ge Surface Structure Under Amorphous Ge Films by Plan View Transmission Electron Microscopy Olof C. Hellman OriginalPaper 01 December 1994 Pages: 237 - 242
Structural Investigation of NaNO3 Nanophase Confined in Porous Silica R. MuD. O. HendersonF. Jin OriginalPaper 01 December 1994 Pages: 243 - 248
Interfacial Roughness in GaAs/A1GaAs Multilayers: Influence of Controlled Impurity Addition S. NayakJ. M. RedwingM. G. Lagally OriginalPaper 01 December 1994 Pages: 249 - 254
Direct Observation of Diffraction Arcs from Nanoscale Precipitates in Steels by Highly Brilliant and Focused Synchrotron Radiation Beam and Imaging Plate Yasuo TakagiYoshitaka OkitsuToshiyasu Ukena OriginalPaper 01 December 1994 Pages: 255 - 260
Nanostructural Studies by Mà–ssbauer Spectroscopy Georgia C. Papaefthymiou OriginalPaper 01 December 1994 Pages: 261 - 266
Nmr Studies of Electronic and Local Structure in Cu-Au Alloys James ChepinJoseph H. Ross OriginalPaper 01 December 1994 Pages: 267 - 272
Atomic Resolution Electronic Structure Using Spatially Resolved Electron Energy Loss Spectroscopy P. E. Batson OriginalPaper 01 December 1994 Pages: 275 - 286
Trace Analysis of Nanoscale Materials by Analytical Electron Microscopy Dale E. NewburyRichard D. Leapman OriginalPaper 01 December 1994 Pages: 287 - 292
Selective Imaging of Metal Atoms in the Semiconducting Layered Compound MoS2 by STM/STS S. InoueH. KawamiT. Yao OriginalPaper 01 December 1994 Pages: 293 - 296
Atomic-Resolution Chemical Analysis at 100 Kv in the Scanning Transmission Electron Microscope N. D. BrowningM. F. ChisholmS. J. Pennycook OriginalPaper 01 December 1994 Pages: 297 - 302
Nanoanalytical Characterization of Granular Ag-Fe Films with Giant Magnetoresistance J. LiuZ. G. LiG. C. Hadjipanayis OriginalPaper 01 December 1994 Pages: 303 - 308
AEM Investigation of Tetrahedrally Coordinated Ti4+ in Nickel-Titanate Spinel Ian M. AndersonJim BentleyC. Carter Barry OriginalPaper 01 December 1994 Pages: 309 - 314
Quantitative X-Ray Microanalysis for the Study of Nanometer-Scale Phases in the AEM Ian M. AndersonJim BentleyC. Carter Barry OriginalPaper 01 December 1994 Pages: 315 - 320
Determination of the Number of Molecules Bonded to a CdSe Nanocrystallite Surface Sara MajetichJennifer NewburyDale Newbury OriginalPaper 01 December 1994 Pages: 321 - 326
Tem Study of the Pt-Ru BI-Metallic Catalyst Formation Chaoying MaA. D. KowalakChangmo Sung OriginalPaper 01 December 1994 Pages: 327 - 332
Raman Spectroscopy of Size Selected, Matrix Isolated Si Clusters A. OguraE. C. HoneaW. L. Brown OriginalPaper 01 December 1994 Pages: 333 - 338
Elemental Mapping by Energy-Filtered Electron Microscopy Ondrej L. KrivanekMichael K. KundmannXavier Bourrat OriginalPaper 01 December 1994 Pages: 341 - 350
EELS Imaging of Biological Materials R. D. LeapmanS. SunS. B. Andrews OriginalPaper 01 December 1994 Pages: 351 - 359
Annular Dark Field Imaging in Stem Sean HillyardJohn Silcox OriginalPaper 01 December 1994 Pages: 361 - 372
Quantitative Hrtem: Measuring Projected Potential, Surface Roughness and Chemical Composition P. SchwanderC. KisielowskiA. Ourmazd OriginalPaper 01 December 1994 Pages: 373 - 383
Compositions and Chemical Bonding in Ceramics by Quantitative Electron Energy-Loss Spectrometry J. BentleyL. L. HortonR. F. Davis OriginalPaper 01 December 1994 Pages: 385 - 390