1. Relationship Between Interface Structure and Schottky Barrier Height

   • R. T. Tung
   • J. P. Sullivan
   • F. Schrey

   OriginalPaper 01 August 1993 Pages: 3 - 11

2. In-Situ Characterization of Growth and Intermixing at a Heteroepitaxial Interface: Fe on Au(001)

   • Q. Jiang
   • A. Chan
   • G.-C. Wang

   OriginalPaper 01 August 1993 Pages: 13 - 24

3. Alignment of Adsorbate-Induced Defects on Silicon(001) 2×1 Observed with STM

   • J. V. Seiple
   • J. P. Pelz

   OriginalPaper 01 August 1993 Pages: 25 - 30

4. Diffusion-Segregation Equation for Simulation in Heterostructures

   • R. Gafiteanu
   • H.-M. You
   • T. Y. Tan

   OriginalPaper 01 August 1993 Pages: 31 - 37

5. Electrical, Magnetic and Mechanical Properties of Nanocrystalline Nickel

   • M. J. Aus
   • B. Szpunar
   • K. T. Aust

   OriginalPaper 01 August 1993 Pages: 39 - 44

6. The Model for Description of Electrical Properties of Polymerization-Filled Composite Materials

   • I. A. Tchmutin
   • A. T. Ponomarenko
   • V. G. Shevchenko

   OriginalPaper 01 August 1993 Pages: 45 - 50

7. Ellipsometric Study of the Interface Between Silicon and Silica

   • R. H. Doremus
   • S. C. Kao

   OriginalPaper 01 August 1993 Pages: 53 - 59

8. Structural Imperfections in Ulrathin Oxides Grown on Hydrogen Terminated Silicon Surfaces

   • Takeo Hattori
   • Kazuaki Ohishi

   OriginalPaper 01 August 1993 Pages: 61 - 67

9. On the Mechanism of Ultra Thin Silicon Oxide Film Growth During Thermal Oxidation

   • E. P. Gusev
   • H. C. Lu
   • E. Garfunkel

   OriginalPaper 01 August 1993 Pages: 69 - 74

10. X-Ray Studies of Low-Temperature Grown Sio₂ on Si

    • J.-M. Baribeau
    • D. Landheer
    • R. L. Headrick†

    OriginalPaper 01 August 1993 Pages: 75 - 80

11. Control of Si-SiO₂ Interface Properties in MOS Devices Prepared by Plasma-Assisted and Rapid Thermal Processes

    • G. Lucovsky
    • T. Yasuda
    • J. J. Wortman

    OriginalPaper 01 August 1993 Pages: 81 - 92

12. Mechanism of O₂ Molecule Adsorption and Subsequent Oxidation of Dimers on Si(001) Surfaces

    • T. Hoshino
    • M. Tsuda
    • I. Ohdomari

    OriginalPaper 01 August 1993 Pages: 93 - 98

13. Characterization of thin Chemical/Native Oxides on Si (100) by Auger and Angle-Resolved XPS

    • Eddie D. Pylant
    • Carolyn F. Hoener
    • Bob Witowski

    OriginalPaper 01 August 1993 Pages: 99 - 107

14. Oxidation of Si via Solid State Interfacial Reaction with Deposited Sn-Doped In₂O₃

    • Cleva W. Ow Yang
    • Yuzo Shigesato
    • David C. Paine

    OriginalPaper 01 August 1993 Pages: 109 - 114

15. Hot Electron Phenomena in Transport Across Metal-Semiconductor Structures

    • R. Ludeke
    • A. Bauer

    OriginalPaper 01 August 1993 Pages: 117 - 127

16. Formation of Chemically Clean and Morphologically Smooth PtSi/Si Interfaces

    • Suhit R. Das
    • D.-X. Xu
    • A. Naem

    OriginalPaper 01 August 1993 Pages: 129 - 134

17. Parameter Extraction from the Reverse I-V and C-V Characteristics of an Epitaxial p-InP/Au Schottky Diode

    • A. Singh
    • P. Cova
    • R. A. Masut

    OriginalPaper 01 August 1993 Pages: 135 - 140

18. The Interface for Cryogenic-Processed Metal/Inp

    • L. He
    • W. A. Anderson
    • Z. Shi

    OriginalPaper 01 August 1993 Pages: 141 - 146

19. An Investigation of the Al/n-GaAs Diodes with High Schottky Barrier Heights

    • C.-P. Chen
    • Y. A. Chang
    • T. F. Kuech

    OriginalPaper 01 August 1993 Pages: 147 - 152

20. Electrical Modelling and Characterisation of Alloyed Ohmic Contacts

    • Geoffrey K. Reeves
    • Patrick W. Leech
    • H. Barry Harrison

    OriginalPaper 01 August 1993 Pages: 153 - 164

21. An Initial Investigation of the Electrical and Microstructural Properties of Au/Ti and Au/Pd/Ti Ohmic Contact Structures for AlGaAs/GaAs HBTs

    • Kuldip S. Sandhu
    • Anne E. Staton-Bevan
    • Sukhdev S. Gill

    OriginalPaper 01 August 1993 Pages: 165 - 170

22. Ultra-Low Resistance Ni-Based Contacts to n-InP: the Dependence of Contact Resistivity on the Condition of the Metal-Semiconductor Interface

    • Navid S. Fatemi
    • Victor G. Weizer

    OriginalPaper 01 August 1993 Pages: 171 - 176

23. Shallow Ohmic Contacts to p-InGaAs Based on Pd/Ge with Implanted Zn or Cd

    • P. Ressel
    • H. Strusny
    • K. Mause

    OriginalPaper 01 August 1993 Pages: 177 - 182

24. Ohmic Contacts to p-Type InGaAs/InP with a Graded Bandgap Heterobarrier

    • Patrick W. Leech
    • Geoffrey K. Reeves

    OriginalPaper 01 August 1993 Pages: 183 - 188

25. Segregant-Assisted Growth of SiGe/Si Heterostructures and their Optical Properties

    • Y. Shiraki
    • S. Fukatsu
    • T. Usami

    OriginalPaper 01 August 1993 Pages: 191 - 200

26. Initial Stage of Heteroepitaxial Growth of SiC on Si by Gas Source MBE Using Hydrocarbon Radicals

    • Takashi Fuyuki
    • Yoichiro Tarui
    • Hiroyuki Matsunami

    OriginalPaper 01 August 1993 Pages: 201 - 206

27. Molecular Beam Epitaxy of ZnS Films on Arsenic Passivated Silicon Surfaces

    • Xiaochuan Zhou
    • Wiley P. Kirk

    OriginalPaper 01 August 1993 Pages: 207 - 212

28. Growth of CDTE on GaAs and Si Substrates by Organometallic Vapor Phase Epitaxy

    • Ishwara Bhat

    OriginalPaper 01 August 1993 Pages: 213 - 224

29. Changing PL Intensity from GaAs/Al_0.3Ga_0.7As Heterostructures due to the Chemisorption of SO₂: Effects of Heterostructure Geometry

    • J. F. Geisz
    • T. F. Kuech
    • A. B. Ellis

    OriginalPaper 01 August 1993 Pages: 225 - 230

30. Improved Adhesion of P-doped SiO₂-Interface Layers on InP by Low-Temperature Damage-Free Plasma-CVD

    • R. Riemen Schneider
    • H. L. Hartnagel
    • H. Kräutle

    OriginalPaper 01 August 1993 Pages: 231 - 236

31. Stability of Sulfide Passivated Gallium Arsenide Surfaces

    • J. S. Solomon
    • L. Petry
    • S. R. Smith

    OriginalPaper 01 August 1993 Pages: 237 - 242

32. Mechanistic Study of the Deposition of Metals from HF Solutions onto Silicon Wafers

    • H. G. Parks
    • J. B. Hiskey
    • K. Yoneshige

    OriginalPaper 01 August 1993 Pages: 245 - 256

33. Ab Initio Molecular Dynamics Study of Al, Ga and Si Adsorption on the Si(001) Surface

    • T. Yamasaki
    • M. Ikeda
    • K. Terakura

    OriginalPaper 01 August 1993 Pages: 257 - 262

34. The Effects of Chemical Vapor Cleaning Chemistries on Silicon Surfaces

    • S. E. Beck
    • A. G. Gilicinski
    • R. M. Rynders

    OriginalPaper 01 August 1993 Pages: 263 - 268

35. Surface Cleaning for Silicon Epitaxy Using Photoexcited Fluorine Gas

    • Takayuki Aoyama
    • Tatsuya Yamazaki
    • Takashi Ito

    OriginalPaper 01 August 1993 Pages: 269 - 280

36. Thermally Driven In-Situ Removal of Native Oxide Using Anhydrous Hydrogen Fluoride

    • Pushkar P. Apte
    • Heungsoo Park
    • C. R. Helms

    OriginalPaper 01 August 1993 Pages: 281 - 286

37. Chemical Modification of Surface Steps on SI(111) Vicinal Wafers: a Bonding Model for Phase Changes in Second Harmonic Generation

    • Z. Jing
    • G. Lucovsky
    • J. L. Whitten

    OriginalPaper 01 August 1993 Pages: 287 - 292

38. Atomic Scale Control of Si(001) Surface by Wet-Chemical Treatment

    • Yukinori Morita
    • Hiroshi Tokumoto

    OriginalPaper 01 August 1993 Pages: 293 - 298

39. Structural and Electrical Characterization of Hydrophobic Direct-Bonded Silicon Interfaces

    • Gordon Tam
    • F. Secco d'Aragona
    • N. David Theodore

    OriginalPaper 01 August 1993 Pages: 299 - 304

40. Rapid Evaluation of Thin Film Interfacial Reactions Using Temperature-Ramped Measurements

    • J. M. E. Harper
    • L. A. Clevenger
    • B. Arcot

    OriginalPaper 01 August 1993 Pages: 307 - 318

41. Ultra Thin Sacrificial Diffusion Barriers - Control of Diffusion Across the Cu-SiO₂ Interface

    • Eric Kirchner
    • S. P. Murarka
    • A. Kaloyeros

    OriginalPaper 01 August 1993 Pages: 319 - 322

42. Adhesion Strength of Cu/Polyimide Measured by Continuous Micro-Wedge Scratch Test

    • F. Wang
    • J. C. Nelson
    • R. L. Swisher

    OriginalPaper 01 August 1993 Pages: 323 - 328

43. Thermal and Electromigration Effects on the Surface and Aluminum/Aluminum Oxide Interface of Aluminum Metallizations

    • George O. Ramseyer
    • Joseph V. Beasock
    • Lois H. Walsh

    OriginalPaper 01 August 1993 Pages: 329 - 334

44. TEM Studies of Plasma Deposited Tungsten and Tungsten Nitride Barriers for Thermally Stable Metallization

    • Chang Woo Lee
    • Yong Tae Kim
    • Young Wook Park

    OriginalPaper 01 August 1993 Pages: 335 - 340

45. Processing High Quality Toughened Zirconia Ceramics by Controlling the Chemistry at the Particle-Particle Interface

    • S. T. Thuraisingham
    • J. L. Henshall

    OriginalPaper 01 August 1993 Pages: 343 - 348

46. Interfacial Cohesion Control by Solute Segregation

    • Jian-Sheng Wang

    OriginalPaper 01 August 1993 Pages: 349 - 354

47. Structural and Film Stress Investigation of the Interfacial Reaction in Al/SiC Microlaminates

    • R. B. Inturi
    • M. Chinmulgund
    • J. A. Barnard

    OriginalPaper 01 August 1993 Pages: 355 - 360

48. XPS and Sem Characterization of Pan-Based Carbon Fibers Treated in Oxygen and Nitric Oxide Plasmas

    • R. J. Smiley
    • W. N. Delgass

    OriginalPaper 01 August 1993 Pages: 361 - 366

49. Stress Evolution in Thin film Niti Shape Memory Alloys

    • Quanmin Su
    • Tasung Kim
    • Manfred Wuttig

    OriginalPaper 01 August 1993 Pages: 367 - 367

50. Interfacial Compatibility of Ti₃Al with Various Ceramic Reinforcements

    • Weimin Si
    • Pengxing Li
    • Renjie Wu

    OriginalPaper 01 August 1993 Pages: 369 - 374