Volume 31, Issue 1

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December 1983

Symposium N – Electron Microscopy of Materials

Issue Editors:

D. Smith,
L. W. Hobbs

41 articles in this issue

Electron Microscopy at Atomic Resolution
R. Gronsky
OriginalPaper 01 November 1983 Pages: 1 - 9
An overview of Analytical Electron Microscopy
D. B. Williams
OriginalPaper 01 November 1983 Pages: 11 - 22
Computer Interfaced Electron Microscope
Y. Kokubo
S. Moriguchi
J. Nash
OriginalPaper 01 November 1983 Pages: 23 - 32
Microanalysis with high Spatial Resolution
P. E. Batson
C. R. M. Grovenor
C. Wong
OriginalPaper 01 November 1983 Pages: 33 - 38
Image Processing for Electron Microscope Investigations of Materials
William Krakow
OriginalPaper 01 November 1983 Pages: 39 - 55
Combination of CBD and High Resolution with 400 kv
S. Suzuki
T. Honda
Y. Harada
OriginalPaper 01 November 1983 Pages: 57 - 62
Recent Development in Hitachi Transmission Electron Microscope
Shigeto Isakozawa
Isao Matsui
Akira Tonomura
OriginalPaper 01 November 1983 Pages: 63 - 70
Electron Microscopy and Analysis at Higher Voltages: The Philips EM430 300kV Microscope
Peter N. Hagemann
John S. Fahy
OriginalPaper 01 November 1983 Pages: 71 - 78
Determination of the Specific Site Occupation of Rare Earth Additions in Y₁₇Sm₀₆,Lu₀₇Fe₅O₁₂Thin Films by the Orientation Dependence of Characteristic X-Ray Emissions
Kannan M. Krishnan
Peter Rez
Gareth Thomas
OriginalPaper 01 November 1983 Pages: 79 - 84
TEM/EBIC Investigations of Structural Defects in Polycrystalline Solar Cells
D. G. Ast
B. Cunningham
R. Gleichmann
OriginalPaper 01 November 1983 Pages: 85 - 96
Dopant Site Location by Electron Channeling in Ion Implanted Silicon
S. J. Pennycook
J. Narayan
O. W. Holland
OriginalPaper 01 November 1983 Pages: 97 - 104
High Resolution Tem Studies of Defects Near Si-SiO₂ Interface
J. H. Mazur
J. Washburn
OriginalPaper 01 November 1983 Pages: 105 - 110
Effects of Microstructure and Chemical Composition on EBIC Contrast in Hem Solar Cell Silicon
T. D. Sullivan
OriginalPaper 01 November 1983 Pages: 111 - 116
Electron Microscopy of Semiconductors Reconstructed Surfaces
Pierre M. Petroff
OriginalPaper 01 November 1983 Pages: 117 - 125
Intrinsic Point Defects and Diffusion Processes in Silicon
T. Y. Tan
OriginalPaper 01 November 1983 Pages: 127 - 141
Structural Analyses of Metal/GaAs Contacts and Ge/GaAs and AlAs/GaAs Heterojunctions
T. S. Kuan
OriginalPaper 01 November 1983 Pages: 143 - 152
Structure of Thermally-Induced Microdefects in Czochralski Silicon
F. A. Ponce
S. Hahn
OriginalPaper 01 November 1983 Pages: 153 - 158
Crystallinity, Morphology, and Conductivity of Boron-Doped Microcrystalline Silicon
G. Rajeswaran
J. Tafto
P. E. Vanier
OriginalPaper 01 November 1983 Pages: 159 - 164
Interfacial Reactions of Nickel films on GaAs
L. J. Chen
Y. F. Hsieh
OriginalPaper 01 November 1983 Pages: 165 - 170
Tem Observation of defects in InGaAsP and InGaP Crystals on GaAs Substrates Grown by Liquid Phase Epitaxy
O. Ueda
S. Isozumi
I. Umebu
OriginalPaper 01 November 1983 Pages: 171 - 176
Reflection Electron Microscopy and Diffraction from Crystal Surfaces
J. M. Cowley
OriginalPaper 01 November 1983 Pages: 177 - 188
Interpretation of the Atomic Surface Structure of Ag₂O on (111) Au thin films
William Krakow
OriginalPaper 01 November 1983 Pages: 189 - 200
Formation and Transformation of Amorphous Silicide Alloys
K. N. Tu
T. Tien
S. R. Herd
OriginalPaper 01 November 1983 Pages: 201 - 210
The Characterisation of Interfacial Dislocation Structures
W. A. T. Clark
OriginalPaper 01 November 1983 Pages: 211 - 221
Dislocations, Steps and Interphase Boundary Migration
D. A. Smith
OriginalPaper 01 November 1983 Pages: 223 - 232
Microdiffraction Studies of Small Gold Metallic Particles
Miguel Jose-Yacaman
Alfredo Gomez
Krystyna Truszkowska
OriginalPaper 01 November 1983 Pages: 233 - 239
High Resolution Study of the Relationship Between Misfit Accommodation and Growth of CU_2-xS in Cds
T. Sands
J. Washburn
R. Gronsky
OriginalPaper 01 November 1983 Pages: 241 - 245
Epitaxy of Bcc and Hexagonal Metals on Fcc(001) Substrates
C. R. M. Grovenor
D. A. Smith
OriginalPaper 01 November 1983 Pages: 247 - 254
Stem Microanalysis of Hazed Polycrystalline Silicon Layers
G. J. C. Carpenter
D. C. Houghton
OriginalPaper 01 November 1983 Pages: 255 - 259
Misfit Dislocations in the Interface between the Metallic and Insulating Phases in Cr Doped V₂0₃
Nobuo Otsuka
Hiroshi Sato
OriginalPaper 01 November 1983 Pages: 261 - 266
The Structure of Grain Boundaries and Phase Boundaries in Ceramics
C. B. Carter
OriginalPaper 01 November 1983 Pages: 267 - 278
Applications of High Resolution Electron Microscopy in Ceramics Research
G. Van Tendeloo
OriginalPaper 01 November 1983 Pages: 279 - 290
The Defect Structures of Fe₉S₁₀
Thao A. Nguyen
Linn W. Hobbs
OriginalPaper 01 November 1983 Pages: 291 - 302
Tem of Dislocations in Sapphire (α−Al₂O₃)
K. P. D. Lagerlöf
T. E. Mitchell
A. H. Heuer
OriginalPaper 01 November 1983 Pages: 303 - 315
Tem Observations of Grain Boundaries in Ceramics
M. Rühle
OriginalPaper 01 November 1983 Pages: 317 - 323
Fault Structures in CVD Silicon Nitride
T. M. Shaw
J. W. Steeds
D. R. Clarke
OriginalPaper 01 November 1983 Pages: 325 - 330
High Resolution Tem Studies of β-Alumina Type Structures
K. J. Morrissey
Z. Elgat
C. B. Carter
OriginalPaper 01 November 1983 Pages: 331 - 336
The γ→α Phase Transformation in Al₂O₃
D. S. Tucker
J. J. Hren
OriginalPaper 01 November 1983 Pages: 337 - 344
Calcium Site Occupancy in BaTiO₃
H. M. Chan
M. P. Harmer
D. M. Smyth
OriginalPaper 01 November 1983 Pages: 345 - 350
Characterisation of Portland Cement Hydration by Electron Optical Techniques
Karen L. Scrivener
P. L. Pratt
OriginalPaper 01 November 1983 Pages: 351 - 356
Ordered Defect-Fluorite Compounds in ZrO₂ Alloys
S. Farmer
J. Hangas
A. H. Heuer
OriginalPaper 01 November 1983 Pages: 357 - 367

Volume 31, Issue 1

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