Volume 280, Issue 1

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December 1992

Symposium B — Evolution of Surface and Thin Film Microstructure

Issue Editors:

Harry A. Atwater,
Eric H. Chason,
Marcia L. Grabow,
Max G. Lagally

136 articles in this issue

Stepped Surfaces and Internal Film Microstructures
A. A. Chernov
OriginalPaper 15 August 1992 Pages: 3 - 9
Surface Diffusion: Atomistics and Surface Morphology (Summary of MRS Symposium B Panel Discussion)
M. H. Grabow
P. J. Feibelman
Y. W. Mo
OriginalPaper 15 August 1992 Pages: 11 - 30
Role of Atomic Size and Valence in Bonding and Diffusion at Metal Surfaces
Peter J. Feibelman
OriginalPaper 15 August 1992 Pages: 31 - 35
Mass Flow and Stability of Nanoscale Features on AU(111)
B. H. Cooper
D. R. Peale
E. Chason
OriginalPaper 15 August 1992 Pages: 37 - 46
Surface Diffusion in Interactive Overlayers
M. C. Tringides
OriginalPaper 15 August 1992 Pages: 47 - 54
Some Comparisons of Ag Deposits on Ge and Si(111)
F. L. Metcalfe
J. A. Venables
OriginalPaper 15 August 1992 Pages: 55 - 58
Surface Diffusion of Sulfur on Nickel (110) and the Effect of Carbon on the Diffusivity
Barbara Ladna
Howard K. Birnbaum
OriginalPaper 15 August 1992 Pages: 59 - 63
Stringlike Chemisorption and Rapid Dissociation of As₄ and Sb₄ on Si(100)
J. Gryko
R. E. Allen
OriginalPaper 15 August 1992 Pages: 65 - 68
Early Homoepitaxy of Au and pt (100) with Surface-Embedded-Atom Potentials
Michael I. Haftel
Mervine Rosen
OriginalPaper 15 August 1992 Pages: 69 - 72
Desorption Kinetics of Indium at the InAs/GaAs(001) Heterointerface
Ron Kaspi
Keith R. Evans
OriginalPaper 15 August 1992 Pages: 73 - 78
Metastable Structural Surface Excitations and Concerted ad Atom Motions: A Stm Study of Atomic Motions Within a Semiconductor Surface
Jene Golovchenko
Ing-Shouh Hwang
Silva K. Theiss
OriginalPaper 15 August 1992 Pages: 79 - 86
Mechanisms and Energetics of Surface Atomic Processes, an Atom-Probe Field ion Microscope Study
Tien T. Tsong
OriginalPaper 15 August 1992 Pages: 87 - 96
Atomic Arrangement of Al Near the Phase Boundaries Between √3x√3-A1 and 7x7 Structures on Si(111) Surfaces
Katsuya Takaoka
Masamichi Yoshimura
Masashi Iwatsuki
OriginalPaper 15 August 1992 Pages: 97 - 101
Growth and Surface Morphology of Thin Silicon Films Using an Atomic Force Microscope
Rama I. Hegde
Mark A. Chonko
Philip J. Tobin
OriginalPaper 15 August 1992 Pages: 103 - 108
Rem and Rheed Studies of Pb Adsorption on Si(111)
Yasumasa Tanishiro
Masahiko Fukuyamaand
Katsumichi Yagi
OriginalPaper 15 August 1992 Pages: 109 - 117
Scaling Description of Sub-Monolayer Epitaxial Growth
A. Zangwill
OriginalPaper 15 August 1992 Pages: 121 - 130
Adatom Concentration Profiles on Simulated Vicinal Surfaces During Epitaxial Growth
Tomoya Shitara
Takashi Suzuki
Tatau Nishinaga
OriginalPaper 15 August 1992 Pages: 131 - 134
Correlation Length Scaling During the Early Stages of Epitaxial Growth
Niaz Haider
Mark R. Wilby
Dimitri D. Vvedensky
OriginalPaper 15 August 1992 Pages: 135 - 138
Microroughness at the Si/SiO₂ Interface from Pre-Oxidation Annealing, Measured Using Quantum Oscillations in Fowler-Nordheim Tunneling Currents
J. C. Poler
K. K. McKay
E. A. Irene
OriginalPaper 15 August 1992 Pages: 139 - 142
Estimation of Surface Diffusion Length from AFM Images of Faceted GaAs(111) Homoepitaxial Films
K. Yang
L. J. Schowalter
T. G. Thundat
OriginalPaper 15 August 1992 Pages: 143 - 146
Afm Studies of Surface Roughness of Borophosphosilicate Glass (BPSG) Films and Their Impact on Defect Detection Capability for Sub Micron Vlsi Technology
H. Rojhantalab
M. Moinpour
F. Moghadam
OriginalPaper 15 August 1992 Pages: 147 - 151
Atomic Force Microscopy of Growth Features on Epitaxial CdHgTe Films
M. Aindow
T. T. Cheng
D. J. Williams
OriginalPaper 15 August 1992 Pages: 153 - 156
A Tem Study of Step Morphology on the Non-Uhv Heat-Treated MgO (100) Surface
Simon King
C. Barry Carter
OriginalPaper 15 August 1992 Pages: 157 - 160
Microstructure - Roughness Interelation in Ru/C and Ru/B₄C X-RAY Multilayers
Tai D. Nguyen
Ronald Gronsky
Jeffrey B. Kortricht
OriginalPaper 15 August 1992 Pages: 161 - 166
Monte Carlo Simulations of Film Profile Evolution During Nonplanar CVD Processes
Daniel G. Coronell
Klavs F. Jensen
OriginalPaper 15 August 1992 Pages: 169 - 172
Uhv-Mocvd Growth and in Situ Characterization of Epitaxial TiO₂ Films
Samuel Chen
H. J. Gysling
J. F. Evans
OriginalPaper 15 August 1992 Pages: 173 - 178
A Theoretical Study of Amorphous-Crystalline Transition in Si [111] MBE Growth
R. Venkatasubramanian
Donald L. Dorsey
S. G. Das
OriginalPaper 15 August 1992 Pages: 179 - 182
How CVD SI/GE Layer Growth is Controlled by Each one of the Reaction gas Components
H. Kühne
G. Kissinger
H. Richter
OriginalPaper 15 August 1992 Pages: 183 - 188
Reaction Kinetics of Atomic chlorine on Si(100)2x1
Kazuhiro Karahashi
Jiro Matsuo
Kei Horiuchi
OriginalPaper 15 August 1992 Pages: 189 - 192
Photodissociation of Trimethylindium and Trimethylgallium on GaAs(100) at 193nm Studied by Angle-Resolved XPS
Satoshi Shogen
Masafumi Ohashi
Yasuo Hosokawa
OriginalPaper 15 August 1992 Pages: 193 - 196
The Characteristics of LPCVD Aluminum Films: Nucleation and Selectivity
K.-I. Lee
Y.-S. Kim
S.-K. Joo
OriginalPaper 15 August 1992 Pages: 197 - 200
Interface Roughness: What is it and How is it Measured?
E. Chason
Charles M. Falco
R. S. Williams
OriginalPaper 15 August 1992 Pages: 203 - 239
Distinguishing Between Coherent Interdiffusion and Incoherent Roughness in Synthetic Multilayers Using X-Ray Diffraction
Z. Xu
Z. Tang
David C. Johnson
OriginalPaper 15 August 1992 Pages: 241 - 244
Interface Roughness Determined by Diffuse Scattering and by Reflectivity of Hard X-Rays
B. Lengeler
M. Hüppauff
OriginalPaper 15 August 1992 Pages: 245 - 250
Submicron Scale Interface Roughness in Quantum Wells Observed by High-Resolution Cathodoluminescence Microscopy
Tom Murashita
Kazumi Wada
Naohisa Inoue
OriginalPaper 15 August 1992 Pages: 251 - 254
Investigation of Roughness at InP/InAs Interfaces
M. J. S. P. Brasil
R. E. Nahory
S. Schwarz
OriginalPaper 15 August 1992 Pages: 255 - 260
X-Ray Grazing Angle Scattering and Fluorescence Studies of Interfacial Microstructures in Si_1-xGe_x/Si Multilayers
Z. H. Ming
A. Krol
K. L. Wang
OriginalPaper 15 August 1992 Pages: 261 - 264
Interface Roughness, Composition, and Alloying of Low-Order ALAS/GAAS Superlattices Studied by X-Ray Diffraction
W. R. Miller Jr
Joseph G. Pellegrino
James Comas
OriginalPaper 15 August 1992 Pages: 265 - 270
Characterization of the ZnSe/GaAs Interface Layer by Tem and Spectroscopic Ellipsometry
R. Dahmani
L. Salamanca-Riba
B. T. Jonker
OriginalPaper 15 August 1992 Pages: 271 - 274
Interface Formation and Thin Film Properties of an Incompatible Polymer System
B. Guckenbiehl
M. Stamm
T. Springer
OriginalPaper 15 August 1992 Pages: 275 - 280
Ge Segregation and Surface Roughening During Si Growth on Ge(001)2xl by Gas-Source Molecular Beam Epitaxy from Si₂H₆
R. Tsu
D.-S. Lin
T.-C. Chiang
OriginalPaper 15 August 1992 Pages: 281 - 284
A New Quantitative Roughness Measurement and its Application in the Polysilicon/Silicon Dioxide Interface
Su-Heng Lin
Miltiadis K. Hatalis
OriginalPaper 15 August 1992 Pages: 285 - 288
Surface Roughness in Kinetic Growth with Diffusion
Hong Yan
OriginalPaper 15 August 1992 Pages: 289 - 294
Growth Kinetics of Molecular Beam Epitaxy on Non-Singular Surfaces
J. F. Egler
N. Otsuka
K. Mahalingam
OriginalPaper 15 August 1992 Pages: 295 - 298
Growth Morphologies of Steps on Vicinal Surfaces in Molecular-Beam Epitaxy
Rong-Fu Xiao
OriginalPaper 15 August 1992 Pages: 299 - 304
The Origins of Epitaxial Orientations in thin Films
Carl V. Thompson
OriginalPaper 15 August 1992 Pages: 307 - 318
Phases and Phase Transitions in the First Few Layers of Methane, Argon and Krypton Adsorbed on Graphite
David Goodstein
P. Day
M. Lysek
OriginalPaper 15 August 1992 Pages: 319 - 326
Orientational and Microstructural Evolution during Epitaxial Growth of Cu on Si(001) by Sputter Deposition
I. Hashim
B. Park
H. A. Atwater
OriginalPaper 15 August 1992 Pages: 327 - 332
Morphology of Monolayer Films Observed by Photoelectron and Low-Energy-Electron Microscopy
M. Mundschau
E. Bauer
W. Święch
OriginalPaper 15 August 1992 Pages: 333 - 336
Substrate Surface Structure Effects on Microstructure of Epitaxial Films
J. Guo
H. L. M. Chang
D. J. Lam
OriginalPaper 15 August 1992 Pages: 337 - 340

Volume 280, Issue 1

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