Volume 230, Issue 1

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December 1992

Symposium R — Phase Transformation Kinetics in Thin Films

Issue Editors:

M. Chen,
R. Schwarz,
M. Libera,
M. Thompson

54 articles in this issue

Molecular Dynamics Simulation of the Effect of Interfaces in Melting and Solid-State Amorphization
Dieter Wolf
Sidney Yip
OriginalPaper 15 April 1991 Pages: 3 - 14
Kinetics of Solid-State Reactions in Ni-Zr Thin Films
R. B. Schwarz
J. B. Rubin
OriginalPaper 15 April 1991 Pages: 15 - 20
Metastable Phase Equilibria in Co-Deposited Ni_1−xZr_x Thin Films
J. B. Rubin
R. B. Schwarz
OriginalPaper 15 April 1991 Pages: 21 - 26
On the Diffusion Behaviour in Stressed Ni-Zr Couples
G. Mazzone
A. Montone
M. Vittori Antisari
OriginalPaper 15 April 1991 Pages: 27 - 32
Amorphous Phase Formation and Reactions AT Pt/GaAs Interfaces
Dae-Hong Ko
Robert Sinclair
OriginalPaper 15 April 1991 Pages: 33 - 38
Thermodynamic Analysis for the Solid-State Amorphization and Subsequent Crystallization of GaAs/Co
F. -Y. Shiau
S. -L. Chen
Y. A. Chang
OriginalPaper 15 April 1991 Pages: 39 - 45
Growth Kinetics of an Amorphous Phase Between GaAs and Co
F. Y. Shiau
Y. A. Chang
OriginalPaper 15 April 1991 Pages: 47 - 52
First Phase Formation Kinetics in the Reaction of Nb/Al
K. R. Coffey
K. Barmak
S. Foner
OriginalPaper 15 April 1991 Pages: 55 - 60
Effect of Microstructure on Phase Formation in Reaction of The Nb/Al Multilayer Thin Films
Katayun Barmak
Kevin R. Coffey
Simon Foner
OriginalPaper 15 April 1991 Pages: 61 - 66
Θ CuAl₂ Precipitate Coarsening in Al-2% Cu Thin Films
John E. Sanchez Jr.
L. T. McKnelly
J. W. Morris
OriginalPaper 15 April 1991 Pages: 67 - 72
Phase Transformations in Co/Nb and Co/Zr Multilayer Film Stacks.
J. C. Lin
R. A. Hoffman
OriginalPaper 15 April 1991 Pages: 73 - 78
Atom Probe Studies of Interfaces in Metallic Multilayers
Alfred Cerezo
Jonathon M. Hyde
Amanda K. Petford-Long
OriginalPaper 15 April 1991 Pages: 79 - 84
In Situ Hvem of Crystallization of Amorphous TiNi Thin Films
Warren J. Moberly
J. D. Busch
M. H. Berkson
OriginalPaper 15 April 1991 Pages: 85 - 90
Phase Transformations in Sputtered Ni-Ti Film: Effects of Heat Treatment and Precipitates
J. D. Busch
Mitchell H. Berkson
A. D. Johnson
OriginalPaper 15 April 1991 Pages: 91 - 96
Structural and Electrical Properties of Titanium-Nickel Films Deposited Onto Silicon Substrates
Kathleen R. Collen
Arthur B. Ellis
A. D. Johnson
OriginalPaper 15 April 1991 Pages: 97 - 102
Correlation of Stress Relaxation and Microstructure Change in Polycrystalline Thin Films on Substrates: Au on Si <100> at RT
A. C. Vermeulen
R. Delhez
E. J. Mittemeijer
OriginalPaper 15 April 1991 Pages: 103 - 108
The Microstructural Evolution of Nanometer Ruthenium Films in Ru/C Multilayers With Thermal Treatments
Tai D. Nguyen
Ronald Gronsky
Jeffrey B. Kortright
OriginalPaper 15 April 1991 Pages: 109 - 114
On Concentration-Dependent Solid State Diffusion
Yang-Tse Cheng
OriginalPaper 15 April 1991 Pages: 115 - 120
The Modified Gibbs-Wulff Construction and Critical Nucleus Morphology at an Interface
J. K. Lee
J. H. Choy
Y. Choi
OriginalPaper 15 April 1991 Pages: 121 - 128
Interfacial Reactions between In/Pd and GaAs
Z. Ma
L. H. Allen
C. J. Palmstrom
OriginalPaper 15 April 1991 Pages: 131 - 137
Initial Evolution of Cobalt Silicides in The Cobalt/Amorphous-Silicon Thin Film System
Hideo Miura
En Ma
Carl V. Thompson
OriginalPaper 15 April 1991 Pages: 139 - 144
Diffusional Phase Transformation under Induced Thermal Stress
E C Zingu
B T Mofokeng
OriginalPaper 15 April 1991 Pages: 145 - 149
Compound Formation in Pd Metallized Strained Layers of Sige on Si
A. Buxbaum
M. Eizenberg
F. Schaffler
OriginalPaper 15 April 1991 Pages: 151 - 156
Kinetics of Vacancy Ordering in YSi_2−x Thin Film on Silicon
T. L. Lee
L. J. Chen
F. R. Chen
OriginalPaper 15 April 1991 Pages: 157 - 162
A Continuous Heterogeneous Model for the Crystalline to Amorphous Transition in Ion Implanted Semiconductors: Relationship to the “Critical Damage Energy Density” Model
C. Vieu
A. Claverie
J. Beauvillain
OriginalPaper 15 April 1991 Pages: 165 - 170
Crystal Nucleation in Amorphous Si Films on Glass Substrate by Si⁺ Ion Implantation
Tomonori Yamaoka
Keiji Oyoshi
Shuhei Tanaka
OriginalPaper 15 April 1991 Pages: 171 - 176
Substrate Effects on the Kinetics of Solid Phase Crystallization In a-Si
L. Haji
P. Joubert
B. Loisel
OriginalPaper 15 April 1991 Pages: 177 - 182
Crystallization Processes in Amorphous Hydrogenated Silicon Based Alloys
F. Demichelis
C. F. Pirri
P. Menna
OriginalPaper 15 April 1991 Pages: 183 - 188
Crystallization of Amorphous Si In Al/Si Multilayers
Toyohiko J. Konno
Robert Sinclair
OriginalPaper 15 April 1991 Pages: 189 - 194
Nucleation and Crystallization of Amorphous Silicon-Aluminum Thin Films
F. Lin
M. K. Hatalis
A. Thanailakis
OriginalPaper 15 April 1991 Pages: 195 - 200
Secondary Grain Growth in Heavily Doped Polysilicon During Rapid Thermal Annealing
S. Batra
K. Park
S. Banerjee
OriginalPaper 15 April 1991 Pages: 201 - 206
Effect of Processing Conditions on the Surface Morphology of thin Polysilicon Films Used for Dram Cell Capacitors
Viju K. Mathews
OriginalPaper 15 April 1991 Pages: 207 - 212
Controlled Interface Roughness in GaAs/AlAs Superlattices
William R. Miller Jr.
W. J. Boettinger
J. Comas
OriginalPaper 15 April 1991 Pages: 213 - 218
Periodicities in the X-Ray Diffraction of Low Order ALAS/GAAS Superlattices
Joseph Pellegrino
S. Qadri
J. Comas
OriginalPaper 15 April 1991 Pages: 219 - 224
Real Time X-Ray Studies of Interface Kinetics in Epitaxial Strained Layers
Roy Clarke
Waldemar Dos Passos
Cristine Brizard
OriginalPaper 15 April 1991 Pages: 225 - 230
Epitaxial Growth and Charge Density Wave of TaSe₂
Toshihiro Shimada
Fumio S. Ohuchi
Bruce A. Parkinson
OriginalPaper 15 April 1991 Pages: 231 - 236
Material Requirements for Reversible Phase Change Optical Recording
Kurt A. Rubin
OriginalPaper 15 April 1991 Pages: 239 - 250
The Relationship Between Crystal Structure and Performance as Optical Recording Media In Te-Ge-Sb Thin Films
D. Strand
J. Gonzalez-Hernandez
D. A. Pawlik
OriginalPaper 15 April 1991 Pages: 251 - 256
Direct Evidence of the Si Interstitialicy Injection and Fast diffusion effect in Si During Pulsed Laser Melt Process
Yih Chang
J. Chen
Thomas. W. Sigmon
OriginalPaper 15 April 1991 Pages: 257 - 262
Anomalous Point Defect Injection During Pulsed Laser Melting Processes: Direct Evidence of Ga_i and As_i Profiles in GaAs
Yih Chang
Thomas W. Sigmon
OriginalPaper 15 April 1991 Pages: 263 - 268
Crystallization and Amorphization of Sic-Ceramic PVD Coatings After Laser Treatment
O. Knotek
F. Löffler
OriginalPaper 15 April 1991 Pages: 269 - 274
Processing of Ferroelectric Memories
Carlos A. Paz De Araujo
L. D. McMillan
J. F. Scott
OriginalPaper 15 April 1991 Pages: 277 - 290
Structure and Characterization of Sputtered Thin Films Based on Lead Titanate.
A. Pignolet
P. E. Schmid
F. Lévy
OriginalPaper 15 April 1991 Pages: 291 - 296
The Effects of Lead-Compensation and Thermal Processing on the Characteristics of DC-Magnetron Sputtered Lead Zirconate Titanate Thin Films
Vinay Chikarmane
Chandra Sudhama
A I Tasch
OriginalPaper 15 April 1991 Pages: 297 - 300
Nanostructure Evolution During the Transition of TiO₂, PbTiO₃ and PZT from GELS to Crystalline thin Films.
Z. C. Kang
A. Gupta
S. K. Dey
OriginalPaper 15 April 1991 Pages: 301 - 306
Metastable Pyrochlore Structures in Sol Gel Spin Coated Lead Titanate Thin Films on Silicon Substrate
Jeon-Kook Lee
Hyung-Jin Jung
Chong-Hee Kim
OriginalPaper 15 April 1991 Pages: 307 - 313
Metal-Ferroelectric-Semiconductor Characteristics of BaMgF₄ Films on p-Silicon
T. S. Kalkur
J. R. Kulkarni
L. Kammerdiner
OriginalPaper 15 April 1991 Pages: 315 - 320
Characterization of Lead Zirconate-Titanate Thin Films Prepared by Pulsed Laser Deposition
C. K. Chiang
W. Wong-Ng
K. W. Bennett
OriginalPaper 15 April 1991 Pages: 321 - 326
Raman Studies of Stress-Induced Phase Transformations in Titania Films
Gregory J. Exarhos
Nancy J. Hess
OriginalPaper 15 April 1991 Pages: 327 - 332
Oxidation Kinetics of Yba₂Cu₃OT_7-x Thin Films in the Presence of Atomic Oxygen and Molecular Oxygen by In-Situ Resistivity Measurement
K. Yamamoto
B. M. Lairson
T. H. Geballe
OriginalPaper 15 April 1991 Pages: 333 - 338

Volume 230, Issue 1

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