Volume 1712, Issue 1 | MRS Online Proceedings Library

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Volume 1712, Issue 1

December 2014

Symposium ZZ — Recent Advances in the Structural Characterization of Materials

Issue Editors:

A. Barber,
A. Boulle,
Y. Kim,
S. Wong

12 articles in this issue

Advances in Crystallographic Image Processing for Scanning Probe Microscopy: Unambiguous identification of the translation symmetry of a 2D periodic image
Peter Moeck
Taylor T. Bilyeu
Axel Mainzer Koenig
OriginalPaper 01 February 2015 Pages: 1 - 6
Characterization of Localized Electrochemical Properties of Si₃N₄-TiC Ceramic Nanocomposite Using Dual-Electrode Scanning Probes
Bernard Haochih Liu
Jui-Teng Cheng
OriginalPaper 01 February 2015 Pages: 7 - 12
Fabrication of Coaxial and Triaxial Atomic Force Microscope Imaging Probes
Robert M. Westervelt
Keith A. Brown
OriginalPaper 01 February 2015 Pages: 13 - 21
Probe Rotating Atomic Force Microscopy for material characterization
Sang Heon Lee
OriginalPaper 01 February 2015 Pages: 22 - 26
Rapid Time Domain Molecular Conductance Measurement of Alkanedithiols Using STM
James Ma
Shuai Chang
Roger Howe
OriginalPaper 01 February 2015 Pages: 27 - 32
In-situ annealing of self-ion irradiation damage in tungsten
Xiaoou. Yi
Michael L. Jenkins
Marquis A. Kirk
OriginalPaper 01 February 2015 Pages: 33 - 38
Dynamic investigation of defects induced by short, high current pulses of high energy lithium ions
Hua Guo
Arun Persaud
Thomas Schenkel
OriginalPaper 01 February 2015 Pages: 39 - 44
A Study of Structural Damage & Recovery of Si, Ge and Ga FIB implants in Silicon
Prabhu Balasubramanian
Jeremy F. Graham
Robert Hull
OriginalPaper 01 February 2015 Pages: 45 - 50
Ion-Beam Modification of Colloidal Silica Particle Masks to Tailor the Size of Ordered Arrays of Ag Nanostructures Produced by Nanosphere Lithography
Eder Reséndiz
Ulises Morales
Juan-Carlos Cheang-Wong
OriginalPaper 01 February 2015 Pages: 51 - 56
Characterization of Micro-Pore Structure in Novel Cement Matrices
Seyoon Yoon
Isabel Galan
Mohammed S. Imbabi
OriginalPaper 01 February 2015 Pages: 57 - 62
In situ coupling of atomic force microscopy and sub-micrometer focused X-ray techniques
Thomas W. Cornelius
Zhe Ren
Olivier Thomas
OriginalPaper 01 February 2015 Pages: 63 - 68
In-situ Pair Distribution Function Study of the Growth of Supported Platinum Particles in Zeolite X
Liliana M. Gámez
Oscar Resto
Maria M. Martinez-Inesta
OriginalPaper 01 February 2015 Pages: 69 - 75