Volume 159, Issue 1

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December 1989

Symposium C — Atomic Scale Structure of Interfaces

Issue Editors:

R.D. Bringans,
R.M. Feenstra,
J.M. Gibson

69 articles in this issue

Theoretical Studies of GaAs on Si
John E. Northrup
Articles 25 February 2011 Pages: 3 - 13
Very Thin 2D GaAs Films on Si During the Early Stages of Growth by MBE
D. B. Fenner
D. K. Biegelsen
J. C. Tramontana
Articles 25 February 2011 Pages: 15 - 20
Onset of GaAs Homoepitaxy and Heteroepitaxy
D K. Biegelsen
R. D. Bringans
L. E. Swartz
Articles 25 February 2011 Pages: 21 - 31
μm-Scale Lateral Growth of Ga-Monolayers Observed In-Situ by Electron Microscopy
J. Osaka
N. Inoue
Articles 25 February 2011 Pages: 33 - 38
A Leed Study of Bismuth Overlayer Formation on InSb(110)
T. Guo
K. J. Wan
W. K. Ford
Articles 25 February 2011 Pages: 39 - 44
Bismuth Overlayer Formation on GaAs(110)
S. L. Chang
T. Guo
E. S. Hood
Articles 25 February 2011 Pages: 45 - 50
Photoemission Characterization of Thin Film Nucleation on Inert Substrates
G. Haugstad
A. Raisanen
A. Franciosi
Articles 25 February 2011 Pages: 51 - 56
Observation of Heteroepitaxially Grown Organic Ultrathin Layers on Inorganic Substrates by In Situ RHEED and by STM
Masahiko Hara
Hiroyuki Sasabe
Anthony F. Garito
Articles 25 February 2011 Pages: 57 - 62
The Initial Stages of MBE Growth of InSb on GaAs(100) - A High Misfit Heterointerface
C. J. Kiely
A. Rockett
H. Morkoc
Articles 25 February 2011 Pages: 63 - 68
Nanolayer Reactions in Aluminum-Metal Interfaces
E. V. Barrera
M. W. Ruckman
S. M. Heald
Articles 25 February 2011 Pages: 69 - 74
Measurement of the Relative Position of Adjacent Crystals and the Modelling of Interfacial Structure
M. H. I. El-Eraki
C. J. Kiely
R. C. Pond
Articles 25 February 2011 Pages: 77 - 88
High-Resolution Imaging of Coga/GaAs and Eras/GaAs Interfaces
Jane G. Zhu
Stuart Mc Keman
C. Barry Carter
Articles 25 February 2011 Pages: 89 - 94
Plan-View CBED Studies of Nio-Zro₂(CaO) Interfaces
V. P. Dravid
M. R. Notis
A. Revcolevschi
Articles 25 February 2011 Pages: 95 - 100
Double Crystal X-Ray Diffraction Measurement of a Triclinicly Distorted and Tilted Al_xGa_1-xAs Unit Cell Produced by Growth on Offcut GaAs Substrates
A. Leiberich
J. Levkoff
Articles 25 February 2011 Pages: 101 - 108
Interface Strain and the Valence Band Offset at the Lattice Matched In_0.53Ga_0.47As/InP (001) Interface
Mark S. Hybertsen
Articles 25 February 2011 Pages: 109 - 114
Atomic Structure of CaSi₂/Si Interfaces
Chris G. Van De Walle
Articles 25 February 2011 Pages: 115 - 120
Atomic Structure of Dislocations and Interfaces in Semiconductor Heterostructures
A. S. Nandedkar
S. Sharan
J. Narayan
Articles 25 February 2011 Pages: 121 - 126
Growth Mode at the Ge/(1102) Sapphire Interface
Geoffrey P. Malafsky
Articles 25 February 2011 Pages: 127 - 132
Ordering and Energetics of Hg Overlayers on Cu(O01)
C. W. Hutchings
P. A. Dowben
G. Vidali
Articles 25 February 2011 Pages: 133 - 138
An Interfacial Phase Transformation in CoSi₂/Si(111)
D. J. Eaglesham
R. T. Tung
F. Schrey
Articles 25 February 2011 Pages: 141 - 146
Atomic Scale Study of Cosi/Si (111) and CoSi₂/Si (111) Interfaces
A. Catana
M. Heintze
P. Stadelmann
Articles 25 February 2011 Pages: 147 - 152
Microstructural Aspects of Nickel Silicide Formation in Evaporated Nickel-Silicon Multilayer Thin Films
Karen Holloway
Larry Clevenger
Articles 25 February 2011 Pages: 153 - 157
Stranski-Krastanov Growth of Ni on Si(111) at Room Temperature
J. R. Butler
P. A. Bennett
Articles 25 February 2011 Pages: 159 - 166
X-Ray Absorption Studies of Titanium Silicide Formation at the Interface of Ti Deposited on Si
D. B. Aldrich
R. W. Fiordalice
D. E. Sayers
Articles 25 February 2011 Pages: 167 - 172
Electronic and Structural Study of Ni(Co) Silicide/Si(111) Contact System Studied by Soft X-Ray Emission Spectroscopy
H. Watabe
H. Nakamura
M. Kusaka
Articles 25 February 2011 Pages: 173 - 176
In-Situ Transmission Electron Microscopy Studies of the Oxidation of Si (111) 7X7
J. M. Gibson
Articles 25 February 2011 Pages: 179 - 184
The Use of Fresnel Contrast to Study the Initial Stages of The in situ Oxidation of Silicon
Frances M. Ross
J. Murray Gibson
W. M. Stobbs
Articles 25 February 2011 Pages: 185 - 190
Electron Spin Resonance Studies of Silicon Dioxide Films on Silicon in Integrated Circuits Using Spin Dependent Recombination
M. A. Jupina
P. M. Lenahan
Articles 25 February 2011 Pages: 191 - 196
An NMR Study of Hydrogen in Si0₂ Films on Silicon
David H. Levy
K. K. Gleason
Articles 25 February 2011 Pages: 197 - 202
Electronic Structure of Epitaxial SiO₂/Si(100) Interfaces
T. Motooka
Articles 25 February 2011 Pages: 203 - 208
The Structure of Interfaces in Oxide Heterojunctions Formed by CVD
Lisa A. Tietz
Scott. R. Summerfelt
C. Barry Carter
Articles 25 February 2011 Pages: 209 - 215
Temperature Dependent Current-Voltage Characteristics in Thin SiO₂ Films
Jin Zhao
N. M. Ravindra
Articles 25 February 2011 Pages: 217 - 222
Low Energy Electron Microscopy of Surface Processes on Clean Si(111) and Si (100)
E. Bauer
M. Mundschau
W. Telieps
Articles 25 February 2011 Pages: 225 - 233
The Atomic Geometry of the Reconstructed (001) Surface of the Rutile Phase of SnO₂
Charles B. Duke
Michael R. Thompson
Articles 25 February 2011 Pages: 235 - 239
A New Defect on the Reconstructed Si(100) Surface: An AB Initio Molecular-Dynamics Study
Sigeo Ihara
Shi Lun Ho
Masahiko Hirao
Articles 25 February 2011 Pages: 241 - 246
Si(001) Molecular Beam Epitaxy: Enhanced Diffusion or Bonding?
S. Clarke
M. R. Wilby
D. D. Vvedensky
Articles 25 February 2011 Pages: 247 - 252
Xps Analysis of the Sapphire Surface as a Function of High Temperature Vacuum Annealing
E. D. Richmond
Articles 25 February 2011 Pages: 253 - 256
Adsorption and Tribochemical Reactions
W. M. Mullins
T. E. Fischer
Articles 25 February 2011 Pages: 257 - 261
Atomically-Resolved Surface Photovoltage Probed by Optically-Excited Scanning Tunneling Microscopy
R. J. Hamers
K. Markert
Articles 25 February 2011 Pages: 265 - 273
Observations of Surfaces by Electron Microscopy During STM Operation
J. C. H. Spence
U. Knipping
M. Kuwabara
Articles 25 February 2011 Pages: 275 - 282
Imaging by Sliding Planes in Scanning Tunnelling Microscopy
John D. Todd
John B. Pethica
Articles 25 February 2011 Pages: 283 - 288
Role of Tip Material in Scanning Tunneling Microscopy
C. Julian Chen
Articles 25 February 2011 Pages: 289 - 292
STM of Gold on Graphite
P. A. Thomas
W. H. Lee
R. I. Masel
Articles 25 February 2011 Pages: 293 - 299
Interfacial Superstructures Studied by Grazing Incidence X-Ray Diffraction
Koichi Akimoto
Jun’Ichiro Mizuki
Junji Matsui
Articles 25 February 2011 Pages: 303 - 313
Direct Observation of A 7×7 Superstructure Buried at the Amorphous-Si / Si(111) Interface
Akira Sakai
Toru Tatsumi
Koichi Ishida
Articles 25 February 2011 Pages: 315 - 320
Topography of Si(111): Clean Surface Preparation and Silicon Molecular Beam Epitaxy
R. T. Tung
F. Schrey
D. J. Eaglesham
Articles 25 February 2011 Pages: 321 - 326
Electronic and Atomic Properties of a-C:H/Semiconductor Interfaces
M. Wittmer
D. Ugolini
P. Oelhafen
Articles 25 February 2011 Pages: 327 - 330
Non-Equilibrium Molecular Dynamics Simulation of the Rapid Solidification of Metals
Cliff F. Richardson
Paulette Clancy
Articles 25 February 2011 Pages: 331 - 336
Study of Interfacial Sharpness and Growth in (GaAs)_M(AlAs)_N Superlatihces
D. Gammon
S. Prokes
H. Dietrich
Articles 25 February 2011 Pages: 339 - 344
A Weak Beam Imaging Technique for the Characterization of Interfacial Roughness in (InGa)As/GaAs Strained Layer Structures
J. Y. Yao
T. G. Andersson
G. L. Dunlop
Articles 25 February 2011 Pages: 345 - 350

Volume 159, Issue 1

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