Volume 1089, Issue 1 | MRS Online Proceedings Library

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Volume 1089, Issue 1

December 2008

Symposium Y — Focused Ion Beams for Materials Characterization and Micromachining

Issue Editors:

L. Holzer,
A. Minor,
M. D. Uchic,
C. Volkert

3 articles in this issue

Using the Focused Ion Beam to Perform Serial Sectioning of Micron-Sized Particles for Coordinated Nanoscale Analysis
D. Bassim Nabil
T. De Gregorio Bradley
M. Stroud Rhonda
OriginalPaper 01 February 2011 Article: 3
Use of Focused Ion Beam Milling for Patterned Growth of Carbon Nanotubes
Jun Yu
Ying Chen
S. Williams James
OriginalPaper 01 February 2011 Article: 2
Exploration of the Ultimate Patterning Potential Achievable with Focused Ion Beams
Jacques Gierak
Eric Bourhis
Izo Abram
OriginalPaper 01 February 2011 Article: 1