1. Letters to the Editor

   Departments 29 November 2013 Pages: 6 - 7

2. Research/Researchers

   Departments 29 November 2013 Pages: 9 - 13

3. Washington News

   Departments 29 November 2013 Pages: 14 - 14

4. Resources

   Departments 29 November 2013 Pages: 15 - 15

5. Editor’s Choice

   Departments 29 November 2013 Pages: 16 - 16

6. Nanoscale Characterization of Materials

   • Edward T. Yu
   • Stephen J. Pennycook

   Nanoscale Characterization of Materials 29 November 2013 Pages: 17 - 21

7. Cross-Sectional Scanning Tunneling Microscopy of Semiconductor Heterostructures

   • Edward T. Yu

   Nanoscale Characterization of Materials 29 November 2013 Pages: 22 - 26

8. Near-Field Scanning Optical Microscopy Studies of Materials and Devices

   • J. W. P. Hsu

   Nanoscale Characterization of Materials 29 November 2013 Pages: 27 - 30

9. Correlation Between Nanoscale Structural, Electronic, and Magnetic Properties of Thin Films by Scanning-Probe Microscopy and Spectroscopy

   • R. Wiesendanger

   Nanoscale Characterization of Materials 29 November 2013 Pages: 31 - 35

10. High-Resolution Imaging of Liquid Structures: Wetting and Capillary Phenomena at the Nanometer Scale

    • Miquel Salmeron
    • Lei Xu
    • Qing Dai

    Nanoscale Characterization of Materials 29 November 2013 Pages: 36 - 41

11. Model Systems for Metal-Ceramic Interface Studies

    • M. Wagner
    • T. Wagner
    • M. Rühle

    Nanoscale Characterization of Materials 29 November 2013 Pages: 42 - 48

12. High-Resolution-Electron-Microscopy Investigation of Nanosize Inclusions

    • U. Dahmen
    • E. Johnson
    • A. Johansen

    Nanoscale Characterization of Materials 29 November 2013 Pages: 49 - 52

13. Z-Contrast Imaging of Grain-Boundary Core Structures in Semiconductors

    • M. F. Chisholm
    • S. J. Pennycook

    Nanoscale Characterization of Materials 29 November 2013 Pages: 53 - 57

14. Time-Resolved High-Resolution Electron Microscopy of Clusters, Surfaces, and Interfaces

    • Nobuo Tanaka
    • Tokushi Kizuka

    Nanoscale Characterization of Materials 29 November 2013 Pages: 58 - 62

15. Advertisers in This Issue

    Departments 29 November 2013 Pages: 62 - 62

16. MRS Seeks Nominees for Outstanding Young Investigator Award, 1998

    MRS News 29 November 2013 Pages: 64 - 64

17. Historical Note

    Departments 29 November 2013 Pages: 65 - 65

18. Library

    Departments 29 November 2013 Pages: 66 - 69

19. Abstracts for October 1997 Journal of Materials Research

    Abstracts 29 November 2013 Pages: 70 - 77

20. Classified

    Departments 29 November 2013 Pages: 78 - 78