Volume 4, Issue 1

Search all Journal of Hardware and Systems Security articles

March 2020

Includes 2 Special Issues: Special Issue on Hardware Reverse Engineering and Obfuscation; Special Issue on 2019 PAINE Conference – Physical Assurance and Inspection of Electronics

Issue Editors:

Navid Asadi,
Mark M. Tehranipoor

7 articles in this issue

Practical Partial Hardware Reverse Engineering Analysis
Franck Courbon
OriginalPaper Open access 06 April 2019 Pages: 1 - 10
Special Issue: 2019 PAINE Conference—Physical Assurance and Inspection of Electronics
Navid Asadi
Mark Tehranipoor
EditorialNotes 11 February 2020 Pages: 11 - 12
Fluorescent X-ray Scan Image Quality Prediction
Peter B. Weichman
Eugene M. Lavely
OriginalPaper Open access 15 November 2019 Pages: 13 - 23
Evaluation of Low-Cost Thermal Laser Stimulation for Data Extraction and Key Readout
Thilo Krachenfels
Heiko Lohrke
Heinz-Wilhelm Hübers
OriginalPaper 20 November 2019 Pages: 24 - 33
A Decomposition Workflow for Integrated Circuit Verification and Validation
Adam Kimura
Jon Scholl
Glen David Via
OriginalPaper 02 January 2020 Pages: 34 - 43
Deep Neural Network–Based Detection and Verification of Microelectronic Images
Md Alimoor Reza
Zhenhua Chen
David J. Crandall
OriginalPaper 04 January 2020 Pages: 44 - 54
Analysis of Dynamic Laser Injection and Quiescent Photon Emissions on an Embedded Processor
Karim Amin
Catherine Gebotys
Haohao Liao
OriginalPaper 24 February 2020 Pages: 55 - 67

Volume 4, Issue 1

Practical Partial Hardware Reverse Engineering Analysis

Special Issue: 2019 PAINE Conference—Physical Assurance and Inspection of Electronics

Fluorescent X-ray Scan Image Quality Prediction

Evaluation of Low-Cost Thermal Laser Stimulation for Data Extraction and Key Readout

A Decomposition Workflow for Integrated Circuit Verification and Validation

Deep Neural Network–Based Detection and Verification of Microelectronic Images

Analysis of Dynamic Laser Injection and Quiescent Photon Emissions on an Embedded Processor

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