Julius Adolph Stöckhardt – a pioneer of applied chemistry O. Wienhaus History of chemistry Pages: 139 - 144
Some topical applications of plasma atomic spectrochemical methods for the analysis of ceramic powders H. NickelJ. A. C. Broekaert Review Pages: 145 - 155
Experiments to determine the escape probability of photoelectrons J. ZemekS. Hucek Original paper Pages: 156 - 159
Direct spectrometry of solids in view of information characteristics K. FlóriánJ. HaßlerM. Matherny Original paper Pages: 160 - 164
Analysis of the spatial distribution of the constituting elements in amorphous solids: Laser ablation with ICP spectrometry Sabine RingsRolf SieversM. Jansen Original paper Pages: 165 - 173
Comparison between different presentations of pore size distribution in porous materials K. MeyerP. Klobes Original paper Pages: 174 - 178
Chemical analysis of thin films by means of SS-MS, GD-OES, and XPS demonstrated at Ir-Si thermoelectrica R. KurtV. HoffmannK. Wetzig Original paper Pages: 179 - 184
15N CP/MAS NMR as an instrument in structure investigations of organosilicon polymers E. BrendlerE. EbrechtT. Breuning Original paper Pages: 185 - 188
Ultra-thin PTCDA layers studied by optical spectroscopies R. KaiserM. FriedrichD. R. T. Zahn Original paper Pages: 189 - 192
Influence of relative humidity in sensing halogenated hydrocarbons with Reflectometric Interference Spectroscopy (RIfS) S. KasparF. RathgebG. Gauglitz Original paper Pages: 193 - 196
Influence of surface morphology on the oxidation of metal electrodes studied by in-situ grazing incidence x-ray diffractometry Sadagopan SathiyanarayananMario SahreW. Kautek Original paper Pages: 197 - 201
Phase relations in the system V/Nb/O. V. Investigation of mixed crystals V1-xNbxO2 H. OppermannF. von WoedtkeM. Doerr Original paper Pages: 202 - 205
Force measurements on hydrophobized silica surfaces by using AFM G. HüttlK. HegerE. Müller Short communications Pages: 206 - 208
Preparation and characterisation of chromium and sodium tantalate layers by anodic spark deposition F. SchlottigJ. SchreckenbachG. Marx Short communications Pages: 209 - 211
Characterization of thin metastable vanadium oxide films by Raman spectroscopy J. P. SchreckenbachKlaus WitkeGünter Marx Short communications Pages: 211 - 214