1. 10th Working Conference on Applied Surface Analysis (AOFA 10) Kaiserslautern, 6–10 September 1998

   • H. Oechsner
   • Hubert Gnaser

   Editorial Pages: 1 - 2

2. Characterisation of biomaterials using ToF-SIMS

   • D. Léonard
   • H. J. Mathieu

   Original paper Pages: 3 - 11

3. Recent instrumental developments in magnetic sector SIMS

   • M. Schuhmacher
   • B. Rasser
   • H.-N. Migeon

   Original paper Pages: 12 - 18

4. Applications of total reflection X-ray fluorescence spectrometry in trace element and surface analysis

   • H. Schwenke
   • P. A. Beaven
   • J. Knoth

   Original paper Pages: 19 - 27

5. Electron spectroscopy applied to metastable ceramic solution phases

   • R. Cremer
   • Mirjam Witthaut
   • Dieter Neuschütz

   Original paper Pages: 28 - 37

6. Combined atom probe and STM study of tip-substrate interactions

   • A. Fian
   • Ch. Ernst
   • M. Leisch

   Original paper Pages: 38 - 42

7. Quantitative comparison of ATR-IR spectra of LB and bulk layers of 22-tricosenic acid on inorganic supports

   • G. Müller
   • C. Riedel

   Original paper Pages: 43 - 47

8. Peak shape analysis of core level photoelectron spectra using UNIFIT for WINDOWS

   • R. Hesse
   • T. Chassé
   • R. Szargan

   Original paper Pages: 48 - 54

9. Investigations to calibrate reference standards for the thickness of coatings

   • T. Ahbe
   • K. Hasche
   • K. Thiele

   Original paper Pages: 55 - 58

10. Factor analysis and XPS-data preprocessing for non-conducting samples

    • S. Oswald
    • S. Baunack

    Original paper Pages: 59 - 62

11. Robust automated three-dimensional segmentation of secondary ion mass spectrometry image sets

    • M. Wolkenstein
    • T. Stubbings
    • H. Hutter

    Original paper Pages: 63 - 69

12. Operation and application of a laser mass analyser (LASMA) for multielement analysis

    • D. M. Woll
    • M. Wahl
    • H. Oechsner

    Original paper Pages: 70 - 75

13. Bombardment-induced silicide formation at rhenium-silicon interfaces studied by XPS and TEM

    • R. Reiche
    • S. Oswald
    • K. Wetzig

    Original paper Pages: 76 - 82

14. Ultra thin film sputter depth profiling

    • J. F. Moulder
    • S. R. Bryan
    • U. Roll

    Original paper Pages: 83 - 84

15. Quantitative analysis of silicon- and aluminium-oxynitride films with EPMA, SIMS, hf-SNMS, hf-GD-OES and FT-IR

    • S. Dreer

    Original paper Pages: 85 - 95

16. Investigations of local electrical surface characteristics by dynamical scanning force microscopy

    • M. Hietschold
    • F. Müller
    • E. Zschech

    Original paper Pages: 96 - 98

17. Stepped current electromigration test of multilevel aluminum metallizations on wafer level

    • M. Strasser
    • M. Schneegans
    • R. Frahm

    Original paper Pages: 99 - 102

18. Application of infrared reflection spectroscopy for the analysis of hard coatings on metallic substrates

    • P. Heger
    • G. Marx

    Original paper Pages: 103 - 105

19. XPS analysis of the degradation of Nafion

    • M. Schulze
    • M. Lorenz
    • E. Gülzow

    Original paper Pages: 106 - 113

20. Water uptake of quartz investigated by means of ion-beam analysis

    • O. Dersch
    • F. Rauch

    Original paper Pages: 114 - 116

21. SIMS depth profiling, line scanning and imaging analyses of the oxide layer on in-reactor corroded cladding specimens with high lateral resolution

    • O. Gebhardt

    Original paper Pages: 117 - 122

22. Characterization of polymers in PEFC-electrodes with EDX and XPS

    • M. Schulze
    • M. v. Bradke
    • E. Gülzow

    Original paper Pages: 123 - 132

23. Raman spectroscopy of C-, BN-, SiC-layers deposited on multifilament substrates

    • N. Meyer
    • K. Nestler
    • G. Marx

    Original paper Pages: 133 - 135

24. Surface analytical investigation of the electrochemical and corrosion behaviour of nanocrystalline FeAl8

    • A. John
    • W. Zeiger
    • S. Oswald

    Original paper Pages: 136 - 141

25. SIMS Analysis of the wear of boron nitride tools for the machining of compacted graphite iron and grey cast iron

    • M. Gastel
    • U. Reuter
    • H. M. Ortner

    Original paper Pages: 142 - 146

26. A photoelectrochemical study of anodic oxides on lead selenide surfaces in alkaline solutions

    • H. Meincke
    • D. G. Ebling
    • H. Böttner

    Original paper Pages: 147 - 149

27. Study of the surface composition of vanadyl pyrophosphate catalysts by XPS and ISS – Influence of Cs+ and water vapor on the surface P/V ratio of (VO)2P2O7 catalysts

    • F. Richter
    • H. Papp
    • B. Kubias

    Original paper Pages: 150 - 153

28. XPS analysis of electrochemically oxidized nickel surfaces

    • M. Lorenz
    • M. Schulze

    Original paper Pages: 154 - 157

29. Surface and interface analysis of PVD Al-O-N and γ-Al2O3 diffusion barriers

    • R. Cremer
    • M. Witthaut
    • D. Neuschütz

    Original paper Pages: 158 - 162

30. Scanning electrochemical microscopy of enzymes immobilized on structured glass-gold substrates

    • T. Wilhelm
    • G. Wittstock
    • R. Szargan

    Original paper Pages: 163 - 167

31. The dependence of fractal dimension on measuring conditions of scanning probe microscopy

    • W. Zahn
    • A. Zösch

    Original paper Pages: 168 - 172

32. Surface characterisation of laser irradiated SiC ceramics by AES and XPS

    • S. Baunack
    • S. Oswald
    • T. Temme

    Original paper Pages: 173 - 177

33. Potassium and oxygen diffusion and segregation in nickel

    • M. Schulze
    • R. Reissner
    • M. Lorenz

    Original paper Pages: 178 - 182

34. Material removal and chemical and structural changes induced by irradiation of polymer surfaces with KrF-excimer laser radiation

    • D. A. Wesner
    • M. Aden
    • E. W. Kreutz

    Original paper Pages: 183 - 187

35. Application of scanning SIMS techniques for the evaluation of the oxidation behavior of high-purity molybdenum

    • M. Gritsch
    • C. Brunner
    • H. P. Martinz

    Original paper Pages: 188 - 194

36. The influence of ion beam sputtering on the composition of the near-surface region of silicon carbide layers

    • G. Ecke
    • R. Kosiba
    • H. Rößler

    Original paper Pages: 195 - 198

37. Characterization of transition metal nitride formation in rapid thermal processing (RTP)

    • Ivan Galesic
    • B. O. Kolbesen

    Original paper Pages: 199 - 202

38. Effect of surface oxidation on the solution of hydrogen in vanadium

    • G. Kiss
    • H. Paulus
    • J. Giber

    Original paper Pages: 203 - 207

39. Depth profile and microscopic structure of gold-implanted aluminum using X-ray spectroscopies

    • K. Baur
    • J. Hormes

    Original paper Pages: 208 - 211

40. Studies of polycrystalline materials by Pseudo Kossel technique

    • E. Langer
    • S. Däbritz
    • W. Hauffe

    Original paper Pages: 212 - 216

41. High-resolution analytical transmission electron microscopy of semiconductor quantum structures

    • R. Schneider
    • H. Kirmse
    • W. Neumann

    Original paper Pages: 217 - 220

42. EPMA sputter depth profiling of an InGaAs-InP heterostructure

    • S. Richter
    • Peter Karduck

    Original paper Pages: 221 - 226

43. Structural and optical properties of thin silver films deposited on Si(111)

    • A. Masten
    • M. Brüggemann
    • P. Wißmann

    Original paper Pages: 227 - 230

44. SEM and AES depth profile studies of thin titanium and titanium oxide films covered by nanoscale evaporated Au layers

    • A. H. J. van den Berg
    • W. Lisowski
    • M. Smithers

    Original paper Pages: 231 - 235

45. Examinations on the morphology of tarnish layers grown on stainless 18–10 chromium nickel steels

    • G. Pajonk
    • H. Bubert

    Original paper Pages: 236 - 243

46. XANES and XPS characterization of hard amorphous CSixNy thin films grown by RF nitrogen plasma assisted pulsed laser deposition

    • T. Thärigen
    • D. Mayer
    • R. Szargan

    Original paper Pages: 244 - 248

47. Investigation of the properties of a-C:H coatings with graded metal interlayers

    • M. Nöthe
    • A. Buuron
    • H. Bolt

    Original paper Pages: 249 - 254

48. Characterisation of boron nitride fibre coatings with different crystalline order by TEM and XPS

    • D. Dietrich
    • S. Stöckel
    • G. Marx

    Original paper Pages: 255 - 257

49. Analysis of Co and Cr dopants in epitaxial films of β-FeSi2 by ERDA, RBS, EDX and AES

    • W. Bohne
    • G.-U. Reinsperger
    • I. Urban

    Original paper Pages: 258 - 262

50. Morphology and structure of nanoscale Co-Cu multilayers

    • J. Thomas
    • K. Brand
    • K. Wetzig

    Original paper Pages: 263 - 268