1. The P300: A system for automatic patterned wafer inspection

   • Byron E. Dom
   • Virginia H. Brecher
   • Robert S. Jaffe

   OriginalPaper Pages: 205 - 221

2. Dynamic monocular machine vision

   • Ernst Dieter Dickmanns
   • Volker Graefe

   OriginalPaper Pages: 223 - 240

3. Applications of dynamic monocular machine vision

   • Ernst Dieter Dickmanns
   • Volker Graefe

   OriginalPaper Pages: 241 - 261

4. About the authors

   Announcement Pages: 263 - 264