An OTF Measuring Instrument Based On Edge Image Analysis S. K. Sarkar OriginalPaper 01 December 1980 Pages: 67 - 73
Speckle Patterns of Weak Diffusers: Effect of Off-Axis Aberrations. Renu JainK. Singh OriginalPaper 01 December 1980 Pages: 74 - 85
The Einstein Myth and the Ives Papers: A Counter Revolution in Physics. S. C. Som Book Review 01 December 1980 Pages: 96 - 100