Volume 77, Issue 8, August 2013

ISSN: 1062-8738 (Print) 1934-9432 (Online)

In this issue (40 articles)

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  1. No Access

    Proceedings of the XXIV Russian Conference on Electron Microscopy (SEM-2012)

    Structure of high-T c superconducting tape of the second generation with high current-carrying capacity

    V. I. Nikolaichik, I. I. Khodos Pages 939-942
  2. No Access

    Proceedings of the XXIV Russian Conference on Electron Microscopy (SEM-2012)

    Image contrast of impurity regions of semiconductor crystals in scanning electron microscopy

    E. I. Rau, A. M. Tagachenkov Pages 943-947
  3. No Access

    Proceedings of the XXIV Russian Conference on Electron Microscopy (SEM-2012)

    Structure and composition of nanotubes formed during the anode oxidation of titanium

    V. I. Nikolaichik, A. M. Chaplanov Pages 948-950
  4. No Access

    Proceedings of the XXIV Russian Conference on Electron Microscopy (SEM-2012)

    Modeling the focusing microlenses of an auger analyzer equipped with a CMA

    M. D. Belsky, B. G. Lvov, V. V. Rybalko Pages 959-962
  5. No Access

    Proceedings of the XXIV Russian Conference on Electron Microscopy (SEM-2012)

    Development and application of an AFM probe soft approach method

    I. M. Malovichko Pages 969-971
  6. No Access

    Proceedings of the XXIV Russian Conference on Electron Microscopy (SEM-2012)

    Measuring AFM cantilever stiffness from a thermal noise spectrum

    I. M. Malovichko Pages 972-974
  7. No Access

    Proceedings of the XXIV Russian Conference on Electron Microscopy (SEM-2012)

    Electron microscopic studies of single crystal inclusions in pyroboroncarbon

    R. L. Volkov, N. I. Borgardt, V. N. Kukin Pages 975-980
  8. No Access

    Proceedings of the XXIV Russian Conference on Electron Microscopy (SEM-2012)

    Studying the microstructure of AlSiC metal matrix composite material by scanning electron microscopy

    K. N. Nishchev, M. I. Novopoltsev Pages 981-985
  9. No Access

    Proceedings of the XXIV Russian Conference on Electron Microscopy (SEM-2012)

    Studying the structure of siloxane-urethane-ethylene oxide block copolymers

    I. O. Volkov, L. V. Filimonova Pages 986-989
  10. No Access

    Proceedings of the XXIV Russian Conference on Electron Microscopy (SEM-2012)

    Gibbs distribution-based Bayesian segmentation of electron microscopy nanostructure images

    B. N. Grudin, V. S. Plotnikov Pages 990-994
  11. No Access

    Proceedings of the XXIV Russian Conference on Electron Microscopy (SEM-2012)

    Electron tomography algorithms in scanning transmission electron microscopy

    E. V. Pustovalov, V. S. Plotnikov Pages 995-998
  12. No Access

    Proceedings of the XXIV Russian Conference on Electron Microscopy (SEM-2012)

    Modeling monofractal microscopy images

    B. N. Grudin, E. L. Kuleshov Pages 999-1003
  13. No Access

    Proceedings of the XXIV Russian Conference on Electron Microscopy (SEM-2012)

    In situ electron microscopy investigations of solid-state synthesis in Al/Au thin bilayer films

    R. R. Altunin, S. M. Zharkov Pages 1004-1007
  14. No Access

    Proceedings of the VII (XII) International Seminar on Ferroelastic Physics

    The phase-transition order parameter, fluctuations, and nanoclusters in benzil crystals

    Yu. F. Markov, E. M. Roginskii Pages 1008-1011
  15. No Access

    Proceedings of the VII (XII) International Seminar on Ferroelastic Physics

    Landau coefficients and the critical electric field in a KDP crystal

    V. A. Abalmassov Pages 1012-1014
  16. No Access

    Proceedings of the VII (XII) International Seminar on Ferroelastic Physics

    Studying the dielectric, electromechanical, and elastic properties of K1 − x (NH4) x H2PO4 mixed crystals

    L. N. Korotkov, D. V. Likhovaya Pages 1015-1019
  17. No Access

    Proceedings of the VII (XII) International Seminar on Ferroelastic Physics

    Domain type-phase content interrelations in perovskite-type ferroelectric solid solutions

    V. Yu. Topolov Pages 1020-1024
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