Resolution of a neutron powder diffractometer equipped with a focusing monochromator operating at a nonzero Fankuchen angle V. I. Bobrovskii OriginalPaper 07 February 2014 Pages: 1019 - 1027
Thermal stability of organic layered systems based on lead stearate M. A. MarchenkovaYu. A. DyakovaE. Yu. Tereshchenko OriginalPaper 07 February 2014 Pages: 1028 - 1033
Features of the transformation of detonation nanodiamonds into onion-like carbon nanoparticles V. A. PopovA. V. EgorovT. B. Sagalova OriginalPaper 07 February 2014 Pages: 1034 - 1043
X-ray diffraction projection topography: Possibilities of the quantitative analysis of images of defects E. V. SuvorovI. A. Smirnova OriginalPaper 07 February 2014 Pages: 1044 - 1046
X-ray study of the structure of a random-packing layer confined by a cylindrical surface A. S. PushnovK. V. ChizhM. G. Berengarten OriginalPaper 07 February 2014 Pages: 1047 - 1051
Low-temperature X-ray studies of TlInS2, TlGaS2, and TlGaSe2 single crystals A. U. ShelegV. V. ShautsovaE. M. Kerimova OriginalPaper 07 February 2014 Pages: 1052 - 1055
X-ray interferometry study of deformation fields in silicon crystals, induced by a constant magnetic field G. R. DrmeyanA. O. AboyanA. A. Movcicyan OriginalPaper 07 February 2014 Pages: 1056 - 1059
Surface structure of large germanium single crystals I. A. KaplunovO. V. MalyshkinaA. I. Ivanova OriginalPaper 07 February 2014 Pages: 1060 - 1062
Influence of temperature and electron irradiation on the surface composition of a silicate semiconducting glaze I. N. SergeevV. K. KoumykovV. A. Sozaev OriginalPaper 07 February 2014 Pages: 1063 - 1066
Structure and electronic properties of oxyanionic crystal surfaces D. V. Korabel’nikovYu. N. Zhuravlev OriginalPaper 07 February 2014 Pages: 1067 - 1071
On Selection of the initial approximation in the method of confluence analysis for cathodoluminescence identification of the parameters of direct-gap semiconductors for the quadratic recombination of minority charge carriers N. A. NikiforovaA. N. PolyakovM. A. Stepovich OriginalPaper 07 February 2014 Pages: 1072 - 1076
On a modified projection scheme of the least-squares method for the modeling of the distribution of minority charge carriers generated by an electron beam in a homogeneous semiconductor material E. V. SereginaM. A. StepovichA. M. Makarenkov OriginalPaper 07 February 2014 Pages: 1077 - 1080
Measurements of scan nonlinearity in a scanning electron microscope Yu. A. Novikov OriginalPaper 07 February 2014 Pages: 1081 - 1085
Photoluminescence quenching in zinc oxide modified by Al2O3 and Al2O3 · CeO2 Nanopowders under proton irradiations M. M. MikhailovV. V. NeshchimenkoBang-Jiao Ye OriginalPaper 07 February 2014 Pages: 1086 - 1091
Numerical simulation of a high-perveance ion-extraction system with a plasma emitter V. K. AbgaryanR. V. AkhmetzhanovM. V. Cherkasova OriginalPaper 07 February 2014 Pages: 1092 - 1099
Study of the angular and energy distributions of Na+ and K+ ions which have passed through thin copper films Z. A. Isakhanov OriginalPaper 07 February 2014 Pages: 1100 - 1103
Features of the effect of vacuum arc discharge on a metal cathode surface in the presence of alkali-metal hydroxides and chlorides V. N. ArustamovKh. B. AshurovI. Kh. Khudaykulov OriginalPaper 07 February 2014 Pages: 1104 - 1109
Effect of the low-temperature (20–60°C) heating of silicon on its microhardness D. I. TetelbaumE. V. Kuril’chikA. A. Kuzmina Pyatkina OriginalPaper 07 February 2014 Pages: 1110 - 1113
On the negative values of surface energy under compression or tension of crystal M. N. Magomedov OriginalPaper 07 February 2014 Pages: 1114 - 1119
Estimation of the influence of scattered magnetic fields on the polarization of a beam of thermal neutrons during their propagation through an electromagnet-zero-field-chamber system using the Monte Carlo method A. B. RubtsovS. A. ManoshinS. V. Grigoriev OriginalPaper 07 February 2014 Pages: 1120 - 1123
Method for calculating small-angle neutron scattering spectra using all-atom molecular dynamics trajectories A. V. ShvetsovA. E. SchmidtV. V. Isaev-Ivanov OriginalPaper 07 February 2014 Pages: 1124 - 1127
Solute-solvent interaction in nonpolar solutions of oleic acid as revealed by molecular dynamics simulation R. A. EreminKh. T. KholmurodovM. V. Avdeev OriginalPaper 07 February 2014 Pages: 1128 - 1132
Reorganization of the cluster state in a C60/N-Methylpyrrolidone/water solution: Comparative characteristics of dynamic light scattering and small-angle neutron scattering data A. A. KaznacheevskayaO. A. KizimaM. V. Avdeev OriginalPaper 07 February 2014 Pages: 1133 - 1136
Distance distribution functions of replication origins in HeLa and glioma human cells according to the data of confocal microscopy I. A. YungR. A. PantinaV. V. Isaev-Ivanov OriginalPaper 07 February 2014 Pages: 1137 - 1142
Changes in the crystalline structure of chlorpropamide at high pressures and temperatures N. V. LoshakS. E. KichanovL. A. Bulavin OriginalPaper 07 February 2014 Pages: 1143 - 1147
Mechanisms and behavioral regularities of the vacuum-arc microparticles near and on a potential electrode immersed in plasma A. I. RyabchikovD. O. SivinV. K. Struts OriginalPaper 07 February 2014 Pages: 1148 - 1155
Development of protective metal coatings on aluminum by magnetron sputtering M. S. ZibrovG. V. KhodachenkoM. V. Atamanov OriginalPaper 07 February 2014 Pages: 1156 - 1162
Magnetism in quasibinary systems based on the valence-unstable compound CeNi E. S. ClementyevP. A. AlekseevA. V. Gribanov OriginalPaper 07 February 2014 Pages: 1163 - 1167
Increasing the power factor in composite thermoelectric materials D. N. TrunovE. S. Clementyev OriginalPaper 07 February 2014 Pages: 1168 - 1172
WO3 oxide film formation on tungsten in O2/H2 discharges A. E. GorodetskyR. Kh. ZalavutdinovA. P. Zakharov OriginalPaper 07 February 2014 Pages: 1173 - 1182
Structural features of Ag-Cu alloy films produced by the codeposition of sputtered metals V. N. VolodinYu. Zh. TuleushevM. V. Zdorovets OriginalPaper 07 February 2014 Pages: 1183 - 1187
Structural-phase state of chromium-fullerite-chromium films subjected to heat treatment in vacuum L. V. Baran OriginalPaper 07 February 2014 Pages: 1188 - 1193
Depth distribution of the mean losses of electron-beam energy in a sample: Application in problems of quantitative X-ray spectral microanalysis N. N. MikheevM. A. StepovichE. V. Shirokova OriginalPaper 07 February 2014 Pages: 1194 - 1198
Electronic and optical characteristics of thin hexagonal gallium nitride films specified by surfaces A. O. LitinskiS. I. NovikovD. N. Zharikov OriginalPaper 07 February 2014 Pages: 1199 - 1206
Change in the transparency of thin cesium films on the glass surface of optical devices of spacecraft A. A. ChirovN. G. Belyakova OriginalPaper 07 February 2014 Pages: 1207 - 1211
On the formation mechanism of the surface morphology of [110]-textured nickel films T. A. TochitskiiA. E. Dmitrieva OriginalPaper 07 February 2014 Pages: 1212 - 1216
Physical and mechanical properties of silicon near the SiO2/Si interface D. I. BrinkevichN. V. VabishchevichYu. N. Yankovskii OriginalPaper 07 February 2014 Pages: 1217 - 1220
Annealed Ni/Ti/SiC structure analysed by SIMS and GDMS P. KonarskiM. MiśnikJ. Kozłowski OriginalPaper 07 February 2014 Pages: 1221 - 1224
Organic ion species sputtered from contaminated water ice by 1.5 MeV N2+ ions Ana L. F. de BarrosEnio F. da SilveiraKarl Wien OriginalPaper 07 February 2014 Pages: 1225 - 1230
Estimation of the sizes of disordered surface regions of Cu and Ag thin films using the ion transmission method Z. A. IsakhanovB. E. UmirzakovA. S. Khalmatov OriginalPaper 07 February 2014 Pages: 1231 - 1233
Formation of artificial opals viewed in situ by X-ray grazing insidence diffraction A. V. ChumakovaA. A. MistonovS. V. Grigoriev OriginalPaper 07 February 2014 Pages: 1234 - 1239
Principles of X-ray diffractometry of surface acoustic waves I. A. Schelokov OriginalPaper 07 February 2014 Pages: 1240 - 1253
On some properties of Gaussian models used to describe the resolution of powder neutron diffractometers V. I. Bobrovskii OriginalPaper 07 February 2014 Pages: 1254 - 1260
X-ray masks based on epoxygraphite A. N. GentselevA. G. ZelinskyV. I. Kondratyev OriginalPaper 07 February 2014 Pages: 1261 - 1269
Electron microscopic study of thin CdS films M. B. DergachevaK. A. Mit’V. F. Gremenok OriginalPaper 07 February 2014 Pages: 1270 - 1276
Measurement of electron density distribution in the probe of a low voltage SEM Yu. A. Novikov OriginalPaper 07 February 2014 Pages: 1277 - 1282
Effect of the inclination of a test object on the calibration of an SEM Yu. A. Novikov OriginalPaper 07 February 2014 Pages: 1283 - 1288