A Review of infrared spectroscopic studies of vapor-deposited dielectric glass films on silicon Joe Wong ReviewPaper Pages: 113 - 160
Hydrogen content and annealing of memory quality silicon-oxynitride films H. J. Stein OriginalPaper Pages: 161 - 177
Ir studies of disordered zincblende semiconductors III-V-II-VI alloys and GaAs-Ga2/3Se G. LucovskyJ. C. Mikkelsen OriginalPaper Pages: 179 - 190
Beryllium and sulfur ion-implanted profiles in gaas James ComasLarry Plew OriginalPaper Pages: 209 - 221
Solid-liquid equilibria in ternary regular associated solutions S. Szapiro OriginalPaper Pages: 223 - 246
Low carrier concentration (PbSn)Te by molecular beam epitaxy Donald L. SmithVincent Y. Pickhardt OriginalPaper Pages: 247 - 261
Intermetallic reactions in vacuum-deposited nickel and gold films on (111) silicon single crystals K. H. YoonG. LewisL. L. Levenson OriginalPaper Pages: 263 - 273
Free carrier optical absorption at 10.6 μm in GaAs D. BoisP. LeyralC. Schiller OriginalPaper Pages: 275 - 286
