A study of etch pit density and x-ray rocking curves for GaAs substrate evaluation J. M. TartagliaS. M. CrochiereP. J. Pearah OriginalPaper Pages: 345 - 352
T(z) phase diagram and optical energy gaps in CuGa(Se z Te1−z )2 alloys Miguel QuinteroTibaire TinocoCarlos Rincón OriginalPaper Pages: 353 - 357
Photoreflectance and electrical characterization of Si-implanted GaAs L. HeW. A. Anderson OriginalPaper Pages: 359 - 364
Low temperature dopant activation of BF2 implanted silicon G. QueiroloC. BresolinS. Frabboni OriginalPaper Pages: 373 - 378
Resolution enhancement of film thickness estimators by means of dispersion compensation Beatrys M. LacquetPieter L. Swart OriginalPaper Pages: 379 - 382
Aligned wafer bonding: A key to three dimensional microstructures R. W. BowerM. S. IsmailS. N. Farrens OriginalPaper Pages: 383 - 387
The study of relaxation in asymmetrically strained Si1−x Ge x Si superlattices S. M. ProkesO. J. GlembockiK. L. Wang OriginalPaper Pages: 389 - 394