1. Residual stress in silicon nitride films

   • E. A. Irene

   OriginalPaper Pages: 287 - 298

2. Hg-Cd-Te phase diagram determination by high pressure reflux

   • Jacques Steininger

   OriginalPaper Pages: 299 - 320

3. Electrical characterization of metal/inas contacts

   • M. F. Millea
   • M. McColl
   • A. H. Silver

   OriginalPaper Pages: 321 - 340

4. Thin film pdin compound for integrated circuit metallization

   • E. M. Savitsky
   • V. P. Polyakova
   • V. A. Zelenkov

   OriginalPaper Pages: 341 - 349

5. A dislocation etchant for {100} gallium phosphide

   • T. J. Hayes
   • A. Rasul
   • S. M. Davidson

   OriginalPaper Pages: 351 - 361

6. Open tube vapor transport growth of Pb_1−xSn_xTe epitaxial films for infrared detectors

   • D. W. Bellavance
   • M. R. Johnson

   OriginalPaper Pages: 363 - 380