1. A study of etch pit density and x-ray rocking curves for GaAs substrate evaluation

   • J. M. Tartaglia
   • S. M. Crochiere
   • P. J. Pearah

   OriginalPaper Pages: 345 - 352

2. T(z) phase diagram and optical energy gaps in CuGa(Se _z Te_1−z )2 alloys

   • Miguel Quintero
   • Tibaire Tinoco
   • Carlos Rincón

   OriginalPaper Pages: 353 - 357

3. Photoreflectance and electrical characterization of Si-implanted GaAs

   • L. He
   • W. A. Anderson

   OriginalPaper Pages: 359 - 364

4. Tin-doping ofn ⁺ InP OMVPE layers

   • A. R. Clawson
   • C. M. Hanson

   OriginalPaper Pages: 365 - 372

5. Low temperature dopant activation of BF₂ implanted silicon

   • G. Queirolo
   • C. Bresolin
   • S. Frabboni

   OriginalPaper Pages: 373 - 378

6. Resolution enhancement of film thickness estimators by means of dispersion compensation

   • Beatrys M. Lacquet
   • Pieter L. Swart

   OriginalPaper Pages: 379 - 382

7. Aligned wafer bonding: A key to three dimensional microstructures

   • R. W. Bower
   • M. S. Ismail
   • S. N. Farrens

   OriginalPaper Pages: 383 - 387

8. The study of relaxation in asymmetrically strained Si_1−x Ge _x Si superlattices

   • S. M. Prokes
   • O. J. Glembocki
   • K. L. Wang

   OriginalPaper Pages: 389 - 394

9. Erratum

   • Jack Washburn
   • Eric P. Kvam
   • Zuzanna Liliental-Weber

   Erratum Pages: 395 - 395

10. Foreword

    EditorialNotes Pages: 397 - 397