Thermal Conductivity of Cu2ZnGe1 –xSnxSe4 Alloys I. V. Bodnar NONELECTRONIC PROPERTIES OF SEMICONDUCTORS (ATOMIC STRUCTURE, DIFFUSION) 03 March 2020 Pages: 159 - 162
Negative Differential Conductivity of Lanthanum-Oxide-Based Structures A. IgityanN. AghamalyanY. Kafadaryan ELECTRONIC PROPERTIES OF SEMICONDUCTORS 03 March 2020 Pages: 163 - 168
Fabrication and Analysis of the Current Transport Mechanism of Ni/n-GaN Schottky Barrier Diodes through Different Models S. KumarM. V. KumarS. Krishnaveni ELECTRONIC PROPERTIES OF SEMICONDUCTORS 03 March 2020 Pages: 169 - 175
Profiling Mobility Components near the Heterointerfaces of Thin Silicon Films E. G. ZaitsevaO. V. NaumovaB. I. Fomin SURFACES, INTERFACES, AND THIN FILMS 03 March 2020 Pages: 176 - 180
Ge/Si Core/Shell Quantum Dots in an Alumina Matrix: Influence of the Annealing Temperature on the Optical Properties O. M. SreseliN. A. BertA. N. Yablonsky SEMICONDUCTOR STRUCTURES, LOW-DIMENSIONAL SYSTEMS, AND QUANTUM PHENOMENA 03 March 2020 Pages: 181 - 189
Molecular States of Composite Fermions in Self-Organized InP/GaInP Quantum Dots in Zero Magnetic Field A. M. Mintairov SEMICONDUCTOR STRUCTURES, LOW-DIMENSIONAL SYSTEMS, AND QUANTUM PHENOMENA 03 March 2020 Pages: 190 - 195
Influence of Radiation Defects Induced by Low-Energy Protons at a Temperature of 83 K on the Characteristics of Silicon Photoelectric Structures N. M. BogatovL. R. GrigorianL. S. Lunin SEMICONDUCTOR STRUCTURES, LOW-DIMENSIONAL SYSTEMS, AND QUANTUM PHENOMENA 03 March 2020 Pages: 196 - 200
Structural and Dielectric Study of Thin Amorphous Layers of the Ge–Sb–Te System Prepared by RF Magnetron Sputtering R. A. Castro-ArataV. M. StozharovA. V. Kolobov AMORPHOUS, VITREOUS, AND ORGANIC SEMICONDUCTORS 03 March 2020 Pages: 201 - 204
Dielectric Spectroscopy and Features of the Mechanism of the Semiconductor–Metal Phase Transition in VO2 Films A. V. IlinskiyR. A. KastroE. B. Shadrin MICROCRYSTALLINE, NANOCRYSTALLINE, POROUS, AND COMPOSITE SEMICONDUCTORS 03 March 2020 Pages: 205 - 211
Effect of Temperature on the Morphology of Planar GaAs Nanowires (Simulation) A. A. SpirinaN. L. Shwartz MICROCRYSTALLINE, NANOCRYSTALLINE, POROUS, AND COMPOSITE SEMICONDUCTORS 03 March 2020 Pages: 212 - 216
Energy-Efficient Gas Sensors Based on Nanocrystalline Indium Oxide E. A. ForshE. A. Guseva MICROCRYSTALLINE, NANOCRYSTALLINE, POROUS, AND COMPOSITE SEMICONDUCTORS 03 March 2020 Pages: 217 - 221
Exactly Solvable Model Problem on a Graphene Nanoribbon with Zigzag Edges S. Yu. DavydovA. V. Zubov CARBON SYSTEMS 03 March 2020 Pages: 222 - 227
Structural and Photoluminescence Properties of Graphite-Like Carbon Nitride A. V. BaglovE. B. ChubenkoV. V. Uglov CARBON SYSTEMS 03 March 2020 Pages: 228 - 232
Model of the Negative-Bias Temperature Instability of p-MOS Transistors O. V. Aleksandrov PHYSICS OF SEMICONDUCTOR DEVICES 03 March 2020 Pages: 233 - 239
Model of the Effect of the Gate Bias on MOS Structures under Ionizing Radiation O. V. AleksandrovS. A. Mokrushina PHYSICS OF SEMICONDUCTOR DEVICES 03 March 2020 Pages: 240 - 245
Effect of Temperature on the Characteristics of 4H-SiC UV Photodetectors E. V. KalininaG. N. ViolinaA. V. Nikolaev PHYSICS OF SEMICONDUCTOR DEVICES 03 March 2020 Pages: 246 - 252
Long-Wavelength LEDs in the Atmospheric Transparency Window of 4.6–5.3 μm V. V. RomanovE. V. IvanovYu. P. Yakovlev PHYSICS OF SEMICONDUCTOR DEVICES 03 March 2020 Pages: 253 - 257
Edge-Termination Technique for High-Voltage Mesa-Structure 4H-SiC Devices: Negative Beveling N. M. LebedevaN. D. Il’inskayaP. A. Ivanov PHYSICS OF SEMICONDUCTOR DEVICES 03 March 2020 Pages: 258 - 262
Comparative Analysis of Injection Microdisk Lasers Based on InGaAsN Quantum Wells and InAs/InGaAs Quantum Dots E. I. MoiseevM. V. MaximovA. E. Zhukov PHYSICS OF SEMICONDUCTOR DEVICES 03 March 2020 Pages: 263 - 267
Investigation of the Influences of Post-Thermal Annealing on Physical Properties of TiO2 Thin Films Deposited by RF Sputtering H. E. DoghmaneT. TouamB. Bordji FABRICATION, TREATMENT, AND TESTING OF MATERIALS AND STRUCTURES 03 March 2020 Pages: 268 - 273