Editorial: The Y2K Legacy—The Time Bomb of Tomorrow Margaret Ross Editorial Commentary Pages: 281 - 283
Deriving a Fault Architecture to Guide Testing C. StringfellowA. Andrews OriginalPaper Pages: 299 - 330
Critical Analysis of the PIE Testability Technique Zuhoor Al-KhanjariMartin WoodwardHaider Ali Ramadhan OriginalPaper Pages: 331 - 354
Energy Metric for Software Systems Alexander ChatzigeorgiouGeorge Stephanides OriginalPaper Pages: 355 - 371