1. In This Issue

   • James Bieman

   Introduction Pages: 199 - 200

2. Editorial: Why Good Software Goes Bad

   • James Bieman

   Editorial Commentary Pages: 201 - 203

3. Specification-based Testing for Gui-based Applications

   • Jessica Chen
   • Suganthan Subramaniam

   OriginalPaper Pages: 205 - 224

4. AI Planner Assisted Test Generation

   • Anneliese K. Amschler Andrews
   • Chunhui Zhu
   • Adele E. Howe

   OriginalPaper Pages: 225 - 259

5. Experiences in the Application of Software Process Improvement in SMES

   • Jose A. Calvo-Manzano Villalón
   • Gonzalo Cuevas Agustín
   • Manuel Pérez Cota

   OriginalPaper Pages: 261 - 273