Simulation of the spectroscopic response of photonic isomers with NV centers. Part I A. V. Tsukanov OriginalPaper 06 July 2015 Pages: 211 - 224
Investigating the effect of amplitude and phase relaxation on the quality of quantum information technologies Yu. I. BogdanovB. I. BantyshA. A. Orlikovsky OriginalPaper 06 July 2015 Pages: 225 - 230
Analysis of characteristics for periodically doped channel field-effect transistors under extreme thermal conditions A. A. KrasnyukO. M. OrlovE. V. Mar’ina OriginalPaper 06 July 2015 Pages: 231 - 235
Computer simulation of the heat distribution element for high-power microwave transistors I. A. GlinskiiN. V. Zenchenko OriginalPaper 06 July 2015 Pages: 236 - 240
Multiple-pixel X-ray linear detector based on single CdZnTe crystals V. F. DvoryankinG. G. DvoryankinaA. A. Telegin OriginalPaper 06 July 2015 Pages: 241 - 243
Electrical properties of contacts with the IrSi-Si-based Schottky barrier E. A. Kerimov OriginalPaper 06 July 2015 Pages: 244 - 247
Formation of copper-based interconnects for GaAs monolithic microwave integrated circuits S. V. IshutkinV. A. KagadeyE. V. Anishchenko OriginalPaper 06 July 2015 Pages: 248 - 254
Noise immunity of a 28-nm two-phase CMOS combinational logic to transient effects of single nuclear particles Yu. V. KatuninV. Ya. Stenin OriginalPaper 06 July 2015 Pages: 255 - 262
Error correction coding for 28-nm CMOS two-phase logic elements Yu. V. KatuninK. E. Levin OriginalPaper 06 July 2015 Pages: 263 - 268
Virtual scanning electron microscope. 5. Application in nanotechnology and in micro- and nanoelectronics Yu. A. Novikov OriginalPaper 06 July 2015 Pages: 269 - 282
