1. A new method of formation of the masking image (relief) directly during the electron-beam exposure of the resist

   • M. A. Bruk
   • E. N. Zhikharev
   • D. R. Strel’tsov

   OriginalPaper 03 September 2013 Pages: 261 - 269

2. The influence of microwave plasma microtreatment at low adsorption on the nanomorphology of the surface of silicon (100) crystals

   • V. Ya. Shanygin
   • R. K. Yafarov

   OriginalPaper 03 September 2013 Pages: 270 - 275

3. Possibilities of thick films of microelectronics in the development of the circuitry of radio engineering systems (Review)

   • V. Ya. Podvigalkin

   OriginalPaper 03 September 2013 Pages: 276 - 287

4. Coatings of contact areas of crystals and the traverse of packages for microwelding of internal outputs of 3D wares

   • V. V. Zenin
   • A. A. Stoyanov
   • B. A. Spiridonov

   OriginalPaper 03 September 2013 Pages: 288 - 300

5. Electrical parameters and concentrations of charged particles in methane plasma

   • O. A. Semenova
   • A. M. Efremov
   • V. I. Svetsov

   OriginalPaper 03 September 2013 Pages: 301 - 308

6. Switching the direction of circumferential magnetization of square epitaxial Fe (001) microstructures by spin-polarized current

   • L. A. Fomin
   • I. V. Malikov
   • G. M. Mikhailov

   OriginalPaper 03 September 2013 Pages: 309 - 313

7. Using the models of incompletely specified Boolean functions in the synthesis of schemes by VHDL descriptions

   • P. N. Bibilo
   • A. L. Solov’ev

   OriginalPaper 03 September 2013 Pages: 314 - 323