Industrial prospects of Pb1 − x Sn x Te:In with x > 0.3 solid solutions for photodetectors with extended sensitivity spectral range A. N. AkimovD. V. IshchenkoV. N. Shumsky OriginalPaper 13 March 2013 Pages: 59 - 62
Effect of the material of injecting contacts on the CVCs of Pb1 − x Sn x Te:In films A. N. AkimovD. V. IshchenkoV. N. Shumsky OriginalPaper 13 March 2013 Pages: 63 - 67
Investigation of electrical characteristics of memory cells based on self-forming conducting nanostructures in a form of the TiN-SiO2-W open sandwich structure V. M. MordvintsevS. E. Kudryavtsev OriginalPaper 13 March 2013 Pages: 68 - 78
Homogeneous deposition of nickel in pores of the ordered thin aluminum oxide A. I. Vorob’evaE. A. UtkinaO. M. Komar OriginalPaper 13 March 2013 Pages: 79 - 88
Complex investigations of effects of charging a polymer resist (PMMA) during electron lithography E. I. RauE. N. Evstaf’evaA. A. Tatarintsev OriginalPaper 13 March 2013 Pages: 89 - 98
Measurement of the native oxide thickness on a reference relief pitch structure on a single-crystal silicon substrate V. P. GavrilenkoA. A. KuzinM. N. Fillipov OriginalPaper 13 March 2013 Pages: 99 - 101
A model of a metallic quantum nanotransistor with a Coulomb-blockage gate in “magic” Au55 and Ag55 nanocrystals with speed of 1011 Hz V. A. ZhukovV. G. Maslov OriginalPaper 13 March 2013 Pages: 102 - 112
A circuit implementation of a single-bit CMOS adder D. V. MorozovM. M. Pilipko OriginalPaper 13 March 2013 Pages: 113 - 118
A multichannel ASIC for the tracking system of the CBM experiment E. V. AtkinA. G. VoroninV. V. Shumikhin OriginalPaper 13 March 2013 Pages: 119 - 126