1. The optimization of parameters of deep plasma chemical etching of silicon for the elements of microelectromechanic systems

   • A. I. Vinogradov
   • N. M. Zaryankin
   • Yu. A. Mikkhailov

   Microelectronics Technology 04 December 2011 Pages: 441 - 445

2. An integrated equalizer of the gigahertz range based on heterojunction bipolar transistors

   • V. P. Timoshenkov

   Microelectronic Devices and Systems 04 December 2011 Pages: 446 - 452

3. Simulation and investigation of a bipolar transistor with transfer N-shaped current-voltage characteristic

   • S. G. Novikov
   • N. T. Gurin
   • I. V. Korneev

   Microelectronic Devices and Systems 04 December 2011 Pages: 453 - 456

4. SOI/SOS MOSFET compact macromodel taking into account radiation effects

   • K. O. Petrosyants
   • L. M. Sambursky
   • A. P. Yatmanov

   Microelectronic Devices and Systems 04 December 2011 Pages: 457 - 462

5. Electrophysical properties of composites with carbon nanotubes, fine graphite, and feritte microparticles as inclusions

   • D. A. Usanov
   • A. V. Skripal’
   • A. V. Romanov

   Nanotechnology 04 December 2011 Pages: 463 - 468

6. Nanoscale structure formation by plasma etching

   • A. A. Golishnikov
   • M. G. Putrya
   • E. N. Rybachek

   Nanotechnology 04 December 2011 Pages: 469 - 472

7. The use of parameter optimization in the design of VLSI library cells and custom interfaces of nanoelectronic devices

   • V. N. Perminov
   • S. V. Makarov
   • A. E. Veselov

   Circuit Technology and Design 04 December 2011 Pages: 473 - 475

8. Methods of accelerated characterization of VLSI cell libraries with prescribed accuracy control

   • S. V. Gavrilov
   • O. N. Gudkova
   • Yu. B. Egorov

   Circuit Technology and Design 04 December 2011 Pages: 476 - 482

9. Spanning trees set synthesis algorithm for custom VLSI global routing

   • G. G. Zaglyadin
   • I. A. Syrtsov
   • A. V. Shkola

   Circuit Technology and Design 04 December 2011 Pages: 483 - 485

10. Genetic algorithm for routing switching units

    • D. S. Knysh
    • V. M. Kureichik

    Circuit Technology and Design 04 December 2011 Pages: 486 - 490

11. Temporal characterization of static CMOS RAM, compiled by Subμm design rules

    • V. A. Bachmanov
    • S. A. Bobrikov
    • I. V. Zabolotnov

    Circuit Technology and Design 04 December 2011 Pages: 491 - 496

12. Methods of choosing universal logic modules for FPGAs and ASIC

    • V. A. Bespalov
    • A. L. Glebov
    • D. Yu. Nemchin

    Circuit Technology and Design 04 December 2011 Pages: 497 - 501

13. RETRACTED ARTICLE: Dynamic reconfiguration of the FPGA with the use of compressed bit streams

    • V. A. Shaltyrev
    • K. A. Shaltyrev
    • I. I. Shagurin

    Circuit Technology and Design 19 April 2012 Pages: 502 - 508

14. Calculation of frequency characteristics of electronic circuits via the method of limiting states

    • A. V. Gureev
    • V. A. Kustov

    Circuit Technology and Design 04 December 2011 Pages: 509 - 513

15. Quasi-coherent algorithmic demodulator with information signal frequency tuning

    • V. Yu. Kochetkov

    Integrated Radioelectronic Devices 04 December 2011 Pages: 514 - 516

16. The use of avalanche diodes for detection of optical amplitude-modulated microwave oscillations

    • A. V. Demyanenko
    • Yu. A. Alekseev

    Integrated Radioelectronic Devices 04 December 2011 Pages: 517 - 519

17. Analysis of oscillator synchronization conditions

    • M. M. Gourary
    • S. L. Ulyanov

    Integrated Radioelectronic Devices 04 December 2011 Pages: 520 - 525

18. Performance of the genetic algorithm in X-ray reflectometry data analysis

    • D. A. Kartashov
    • N. N. Gerasimenko
    • V. I. Tsekhosh

    Measurement Methods and Technique 04 December 2011 Pages: 526 - 528

19. Peculiarities of three-passage measurements in magnetic force microscopy

    • A. M. Alekseev
    • V. N. Komkov
    • V. I. Shevyakov

    Measurement Methods and Technique 04 December 2011 Pages: 529 - 532

20. The influence of X-ray radiation on the low-frequency noise of integrated circuits

    • M. I. Gorlov
    • D. Yu. Smirnov
    • E. A. Zolotareva

    Measurement Methods and Technique 04 December 2011 Pages: 533 - 537

21. Application of short light pulses for measuring parameters of a solar cell

    • A. F. Yaremchuk
    • A. V. Alekseev
    • A. V. Korotkevich

    Measurement Methods and Technique 04 December 2011 Pages: 538 - 541