Photoassisted scanning-probe nanolithography on Ti films A. O. AgeevB. G. KonoplevV. A. Smirnov Nanolithography Pages: 353 - 357
Kinetics and mechanisms of Cl2 or HCl plasma etching of copper A. M. EfremovS. A. PivovarenokV. I. Svettsov Thin Films Pages: 358 - 365
Tungstic acid-assisted thermal oxidation of GaAs S. S. LavrushinaI. Ya. MittovaA. V. Popelo Thin Films Pages: 366 - 370
Highly doped Si/SiO2/W sandwich structures with an exposed insulator edge: Electrical transport and electroforming V. M. MordvintsevS. E. Kudrjavtsev Thin Films Pages: 371 - 383
Self-organized growth mechanism for porous aluminum anodic oxide A. I. VorobyovaE. A. OutkinaA. A. Khodin Thin Films Pages: 384 - 391
Liquid-crystal thermography of hot spots on electronic components V. M. PopovA. S. KlimenkoN. V. Moshel’ IC Characterization Pages: 392 - 401
Analyzing conductance-frequency curves of metal-insulator-semiconductor structures subject to surface-potential fluctuations and electrically active states inside the insulator N. A. AvdeevI. V. KlimovR. A. Yakovlev IC Characterization Pages: 402 - 408
New approach to the manufacturing of power microwave bipolar transistors: A computer simulation Yu. P. SnitovskyV. V. NelayevV. A. Efremov Solid-State Devices and Circuits Pages: 409 - 414
Reverse I-V characteristics of a diode-connected heterostructure MESFET S. B. BurzinV. I. Starosel’skiiS. S. Shmelev Solid-State Devices and Circuits Pages: 415 - 421