Anomalous photoconductivity decay observed in microwave measurements of carrier lifetime in silicon ingots P. A. BorodovskiiA. F. BuldyginA. S. Tokarev Materials and Microstructure Characterization Pages: 345 - 349
Microwave characterization of undoped polycrystalline silicon P. A. BorodovskiiA. F. BuldyginA. S. Tokarev Materials and Microstructure Characterization Pages: 350 - 353
Paramagnetic-center detection by SQUID measurement of static magnetic susceptibility A. I. GolovashkinA. L. KaruzskiiA. M. Tshovrebov Characterization and Sensors Pages: 354 - 358
Anomalous Kossel effect in semiconductor structures P. G. MedvedevA. M. Afanas’evM. A. Chuev Characterization and Sensors Pages: 359 - 371
Axially symmetric composite electromagnetic mirror for perfect axial-aberration correction V. A. ShukovA. V. Zav’yalova Process Technologies Pages: 372 - 381
Ultimate thermomechanical read rate from AFM data storage A. B. Petrin Process Technologies Pages: 382 - 391
Size effect relating to the extraordinary and the ordinary Hall effect in ultrathin Fe-Pt films V. N. MatveevV. I. LevashovA. N. Chaika Thin Films Pages: 392 - 397
Equivalent electrical network of the DNA molecule N. V. GribJ. A. BerashevichV. E. Borisenko Modeling and Simulation Pages: 398 - 404
Low-power CMOS switched-capacitor lowpass filter using current conveyors A. S. KorotkovD. V. MorozovA. A. Tutyshkin Circuit Analysis and Synthesis Pages: 405 - 413