1. Noncontact temperature measurement on dielectrics and semiconductors, part 2

   • V. K. Bitukov
   • V. A. Petrov

   Materials and Microstructure Characterization Pages: 1 - 17

2. Short-circuited double Langmuir probe as a model of a conducting wafer under plasma processing

   • A. F. Aleksandrov
   • V. A. Riaby
   • V. G. Yakunin

   Materials and Microstructure Characterization Pages: 18 - 21

3. Parts screening for ESD susceptibility

   • M. I. Gorlov
   • V. A. Emel’yanov
   • D. Yu. Smirnov

   Materials and Microstructure Characterization Pages: 22 - 29

4. MBE growth of silicon films on diamond substrates

   • V. Y. Karasev
   • V. D. Kryukov
   • L. V. Sokolov

   Process Technologies Pages: 30 - 35

5. Defect formation in epitaxial GaP junctions under heat treatment

   • S. V. Boulyrskii
   • N. S. Groushko
   • D. V. Kazakov

   Process Technologies Pages: 36 - 42

6. Combined effect of V₂O₅ and NH₃ on thermal oxidation of InP

   • I. Ya. Mittova
   • S. S. Lavrushina
   • M. V. Sycheva

   Process Technologies Pages: 43 - 46

7. Magnetic nanostructures and nanodevices with a semiconductor or dielectric spacer

   • S. I. Kasatkin
   • A. M. Murav’jev
   • V. D. Khodzhaev

   Micro- and Nanoelectronic Devices Pages: 47 - 53

8. MOS integrated piezoresistive microsensors

   • V. P. Dragunov

   Micro- and Nanoelectronic Devices Pages: 54 - 60

9. Microprocessor structure in relation to on-chip interconnection characteristics

   • G. V. Kristovskii
   • Yu. I. Terent’ev

   Circuit Analysis and Synthesis Pages: 61 - 65