1. Noncontact Temperature Measurement on Dielectrics and Semiconductors, Part 1

   • V. K. Bitukov
   • V. A. Petrov

   OriginalPaper Pages: 329 - 341

2. SEM Linear Measurement in a Wide Magnification Range

   • Ch. P. Volk
   • E. S. Gornev
   • A. V. Rakov

   OriginalPaper Pages: 342 - 349

3. Silicon-Ingot Inspection by Active IR Imaging

   • V. A. Yuryev
   • V. P. Kalinushkin
   • S. I. Lyapunov

   OriginalPaper Pages: 350 - 352

4. Methods of Multiplex Spectroscopy in the Characterization of Nanoscale Multilayers

   • V. A. Kotenev

   OriginalPaper Pages: 353 - 361

5. Delta-Doping of Monocrystalline Semiconductors by Al and Sb Implantation Using FIB Resistless Lithography

   • V. A. Zhukov
   • N. T. Bagraev
   • E. E. Zhurkin

   OriginalPaper Pages: 362 - 372

6. 1D GaAs Detector Arrays for Digital X-ray Imaging

   • V. F. Dvoryankin
   • Yu. M. Dikaev
   • G. A. Savinov

   OriginalPaper Pages: 373 - 376

7. The Bulk-Recombination Mechanism of Negative Relative Sensitivity Observed in Bipolar Magnetotransistors

   • R. D. Tikhonov

   OriginalPaper Pages: 377 - 380

8. Chaotic Negative-Resistance Oscillators with a Multibranch Piecewise-Linear Current—Voltage Characteristic

   • V. G. Prokopenko

   OriginalPaper Pages: 381 - 389