Deposition of Nanoscale Films with Fractal Topography I. N. SerovV. I. MargolinV. S. Fantikov OriginalPaper Pages: 263 - 270
Borophosphosilicate Glass Films in Silicon Microelectronics, Part 1: Chemical Vapor Deposition, Composition, and Properties V. Y. Vasilev OriginalPaper Pages: 271 - 284
Uniformity of Optical Constants in Amorphous Ta2O5 Thin Films as Measured by Spectroscopic Ellipsometry V. A. ShvetsD. V. GritsenkoS. V. Rykhlitskii OriginalPaper Pages: 285 - 291
Controlling Electrical Transport through Bundles of Single-Wall Carbon Nanotubes I. I. BobrinetskiiV. K. NevolinYu. A. Chaplygin OriginalPaper Pages: 292 - 297
Silicon-Surface Restructuring under Cleaning as a Method for Improving Al/Mo-to-Si Contact Resistance and Microwave-BJT Parameters Yu. P. Snitovsky OriginalPaper Pages: 298 - 302
Numerical Solution of the Thomas–Fermi Equation for the Centrally Symmetric Atom N. A. ZaitsevI. V. MatyushkinD. V. Shamonov OriginalPaper Pages: 303 - 309
Custom Logic: A Toolkit for the Design of VLSI Custom Control MOS Logic P. N. BibiloI. V. Vasil'kovaL. D. Cheremisinova OriginalPaper Pages: 310 - 327